-
-
公开(公告)号：JP2001153605A
公开(公告)日：2001-06-08
申请号：JP2000310386
申请日：2000-10-11
Applicant: ZEISS CARL FA
Inventor： BEHREN JENS VON , HAUGER CHRISTOPH , HOELLER FRANK
Abstract: PROBLEM TO BE SOLVED: To provide a device that can change the distance quickly and widely which a reference light beam travels across. SOLUTION: This interferometer 1 comprises a reference branching paths 5, 105 and measuring branching paths 3, 103. The reference branching paths 5, 105 have two reflecting surface 7, 113 facing each other. The reflecting surface 7, 113 are rotated around rotational shafts 9, 111 while holding their relative arrangement positions.
-
-
公开(公告)号：JP2000039398A
公开(公告)日：2000-02-08
申请号：JP19408899
申请日：1999-07-08
Applicant: NANOMETRICS INC
Inventor： HOLMES DUANE C
IPC: G01B9/02 , G01B11/06 , G01J3/02 , G01J3/45 , G01J3/453 , G01N21/01 , G01N21/27 , G01N21/35 , G02B21/24
Abstract: PROBLEM TO BE SOLVED: To efficiently optically measure in a different measuring type with a small occupying area by duplicating measuring areas of a spectrophotometer for measuring a sample and a spectrometer, thereby integrating the spectrophotometer with the spectrometer. SOLUTION: The measuring apparatus 100 comprises an UV-NIR (ultraviolet- near infrared rays) spectrophotometer 102 and an FTIR(Fourier transformation infrared ray) spectrometer 150, and a beam orienting element mounted at a linear movement type turret 116. The orienting element has objective lenses 110, 112, 114 used for the spectrophotometer 102, and a mirror 156 used for the spectrometer 150. The turret 116 is moved to match the objective lens 114 and the mirror 156 with the vertical axis 104. Accordingly, areas on a sample 120 measured by the spectrophotometer 102 and the spectrometer 150 coincide. A sample 120 is placed on a stage 122 controlled by a microprocessor 132 to accurately dispose a desired measuring area under a vertical axis 104.
-
-
Patent Agency Ranking
公开(公告)号：JP2951279B2
公开(公告)日：1999-09-20
申请号：JP34716796
申请日：1996-12-26
Applicant: BAIO RATSUDO LAB INC
Inventor： RAURU KAABERO
-
公开(公告)号：JPH11500832A
公开(公告)日：1999-01-19
申请号：JP52225997
申请日：1996-12-10
IPC: G01B11/00 , A61B3/00 , A61B3/12 , A61B5/00 , A61B10/00 , C12Q1/68 , G01J3/02 , G01J3/12 , G01J3/26 , G01J3/28 , G01J3/44 , G01J3/443 , G01J3/45 , G01J3/453 , G01N21/27 , G01N21/64 , G01N33/48 , G01N33/483 , G01N33/50 , G01N33/569 , G01N33/58 , G02B21/36 , G06K9/00 , G06K9/76
Abstract: A method of in situ analysis of a biological sample comprising the steps of (a) staining the biological sample with N stains of which a first stain is selected from the group consisting of a first immunohistochemical stain, a first histological stain and a first DNA ploidy stain, and a second stain is selected from the group consisting of a second immunohistochemical stain, a second histological stain and a second DNA ploidy stain, with provisions that N is an integer greater than three and further that (i) if the first stain is the first immunohistochemical stain then the second stain is either the second histological stain or the second DNA ploidy stain; (ii) if the first stain is the first histological stain then the second stain is either the second immunohistochemical stain or the second DNA ploidy stain; whereas (iii) if the first stain is the first DNA ploidy stain then the second stain is either the second immunohistochemical stain or the second histological stain; and (b) using a spectral data collection device for collecting spectral data from the biological sample, the spectral data collection device and the N stains are selected such that a spectral component associated with each of the N stains is collectable.
-
公开(公告)号：JPH10262929A
公开(公告)日：1998-10-06
申请号：JP3798698
申请日：1998-02-05
Applicant: ZEISS CARL JENA GMBH
Inventor： MOELLER BEATE , RUDOLPH GUENTER
Abstract: PROBLEM TO BE SOLVED: To provide a deep part cross-sectional image of high sensitivity reduced in signal noise ratio, without being affected by the involuntary movement of the eyeball of a subject by disposing an optical element for diffraction preceding a scanning element for deflecting illumination light at least in one direction in irradiation beams. SOLUTION: The light of a short coherent light source 24 is made incident on an interferometer 22 and a receiver 26 arranged behind a spectroscope unit 25 detects measurement light returned from the eyeball 31. Parallel light from illumination is divided into a part Sko of collimated light beams and a part Sku of converging light beams at the time of reaching the optical element(DOE) 29 for the diffraction and both light beams Sko and Sku reach a reflection mirror 30 and two-dimensionally stereoscopically changed and image-formed in the direction of the eyeball 31 of the testee at an image formation lens part composed of lenses L1 and L2 . A part of the converging light beams reaching the surface of a cornea is dispersed or vertically reflected, passed through the lenses L1 and L2 and partially collimated again at the DOE 29.
-
-
-
-
-
-
-
-
Search Results
3082
records
(took 0.024 seconds)
