MULTI-CONJUGATE LIQUID CRYSTAL TUNABLE FILTER
    172.
    发明公开
    MULTI-CONJUGATE LIQUID CRYSTAL TUNABLE FILTER 审中-公开
    多共轭可调液晶滤光器

    公开(公告)号:EP1851584A2

    公开(公告)日:2007-11-07

    申请号:EP06733993.7

    申请日:2006-01-26

    Abstract: A hyper-spectral imaging filter has serial stages (33, 35) along an optical signal path, each stage having angularly arranged retarder elements (45, 47) and one or more polarizers (42, 44). The retarders can include tunable (such as abutted liquid crystals tuned in unison), fixed and/or combined tunable and fixed birefringences, and can be arranged in Sole, Lyot, Evans or similar configurations. Each stage has a periodic transmission characteristic with periodic bandpass peaks (52) spaced by free spectral range bandpass gaps. Distinctly different retardations are employed in cascaded stages, causing some stages to pass narrow bandpass peaks and other stages to have widely spaced bandpass peaks (large free spectral range). The transmission functions of the serial stages are superimposed, providing a high finesse ratio and good out-of- band rejection. Preferably at least some stages have tunable liquid crystals for at least part of their retardation, and are controlled to selectively align respective bandpass eaks.

    OPTICAL SPECTRUM ANALYZER
    173.
    发明授权
    OPTICAL SPECTRUM ANALYZER 有权
    光谱分析仪

    公开(公告)号:EP1252489B1

    公开(公告)日:2003-12-17

    申请号:EP01900347.4

    申请日:2001-01-04

    CPC classification number: G01J3/12 G01J3/447 G01J4/02

    Abstract: An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG). Each of the linearly-polarized light beams is directed onto the diffraction grating with its linear state of polarization at any prescribed angle to a corresponding plane of diffraction of the diffraction grating. The arrangement is such that the state of polarization of the light beams, at any particular wavelength within an operating band of the analyzer remains substantially unchanged with respect to time. The analyzer also may have a reflector (RAM) for reflecting the light beams leaving the diffraction grating after diffraction a first time so as to return them to the diffraction grating for diffraction a second time.

    Illumination module for a reflection spectrometer
    174.
    发明公开
    Illumination module for a reflection spectrometer 审中-公开
    Beleuchtungseinrichtungfürein ReflexionsSpektrometer

    公开(公告)号:EP1278049A1

    公开(公告)日:2003-01-22

    申请号:EP01810713.6

    申请日:2001-07-18

    Abstract: The illumination module (2) is for illuminating a plane measurement spot (3) of a reflection spectrometer (1). It comprises a plurality of light-emitting diodes (41.1-41.8). Light (21) is guided from the light-emitting diodes (41.1-41.8) to the measurement spot (3) by a circular conical mirror (6), such that the angle of incidence of the light (21) is essentially 45°. First (5.1-5.8) and second (7) apertures delimit the angular range of light. The reflection spectrometer (1) comprises the illumination module (2) described above, a dispersive optical element (8) for analyzing light emerging from the measurement spot (3), and a detector array (9).

    Abstract translation: 照明模块(2)用于照射反射光谱仪(1)的平面测量点(3)。 它包括多个发光二极管(41.1-41.8)。 光(21)通过圆锥形反射镜(6)从发光二极管(41.1-41.8)引导到测量点(3),使得光(21)的入射角基本为45°。 首先(5.1-5.8)和第二(7)个孔限定光的角度范围。 反射光谱仪(1)包括上述照明模块(2),用于分析从测量点(3)出射的光的色散光学元件(8)和检测器阵列(9)。

    Spectroscopic investigation system and compensator therefor
    175.
    发明公开
    Spectroscopic investigation system and compensator therefor 审中-公开
    系统zur spektroskopischen Untersuchung unddafürgeeigneter Kompensator

    公开(公告)号:EP1124120A2

    公开(公告)日:2001-08-16

    申请号:EP00310168.0

    申请日:2000-11-16

    Abstract: A spectroscopic investigation system comprises: a source (LS) of a polychromatic beam of electromagnetic radiation (PPCLB); a polarizer (P); a stage (STG) for supporting a material system to be investigated; an analyser (A); at least one detector system (DET); and at least one compensator (C) (C') (C'') arranged to be continuously rotated during operation while said beam of electromagnetic radiation (PPCLB) passes therethrough. Said polychromatic beam of electromagnetic radiation is caused to interact with a material system (MS) on said stage (STG), pass through said analyser (A), and enter said at least one detector system (DET). The compensator comprises a combination of at least two zero-order wave plates (MOA, MOB), having their respective fast axes offset from zero or ninety degrees with respect to one another; or a combination of at least a first and a second effective zero-order wave plate (ZO1, ZO2), each effective zero-order wave plate comprising two multiple order wave plates (MOA1, MOA2, MOB1, MOB2) which are combined with the fast axes thereof oriented at substantially ninety degrees to one another; or a combination of at least one zero-order wave plate (MOA , MOB), and at least one effective zero-order wave plate (ZO2, ZO1).

    Abstract translation: 光谱调查系统包括:多色光束的源(LS); 偏振器(P); 支持待调查材料系统的阶段(STG) 分析仪(A); 至少一个检测器系统(DET); 以及在操作期间连续旋转的至少一个补偿器(C)(C')(C“)。 补偿器包括至少两个零级波片(MOA,MOB)的组合,它们各自的快轴相对于彼此偏离零或九十度; 或者至少第一和第二有效零级波片(ZO1,ZO2)的组合,每个有效的零级波片包括两个波形板,两个波片(MOA1,MOA2,MOB1,MOB2),它们与 其快轴相对于基本上九十度定向; 或至少一个零级波片(MOA,MOB)和至少一个有效零级波片(ZO2,ZO1)的组合。

    REGRESSION CALIBRATED SPECTROSCOPIC ROTATING COMPENSATOR ELLIPSOMETER SYSTEM WITH PHOTO ARRAY DETECTOR
    176.
    发明公开
    REGRESSION CALIBRATED SPECTROSCOPIC ROTATING COMPENSATOR ELLIPSOMETER SYSTEM WITH PHOTO ARRAY DETECTOR 失效
    ELLIPSOMETER-SYSTEM MIT REGRESSIONSKALIBRIERTEN SPEKTROSKOPISCHEN ROATIONSKOMPENSATOR UND PHOTARRAY-DETEKTOR

    公开(公告)号:EP1038165A4

    公开(公告)日:2000-10-25

    申请号:EP98907397

    申请日:1998-02-02

    CPC classification number: G01N21/211 G01J3/447 G01J4/00 G01J2003/2866

    Abstract: A spectroscopic rotating compensator material system investigation system including a photo array (DE's) for simultaneously detecting a multiplicity of wavelengths is disclosed. The spectroscopic rotating compensator material system investigation system is calibrated by a mathematical regression based technique involving, where desirable, parameterization of calibration parameters. Calibration is possible of calibration parameters. Calibration is possible utilizing a single two-dimensional data set obtained with the spectroscopic rotating compensator material system investigation system in a "material system present" or in a "straight-through" configuration.

    Abstract translation: 公开了一种包括用于同时检测多个波长的光阵列(DE)的光谱旋转补偿器材料系统调查系统。 光谱旋转补偿器材料系统调查系统通过基于数学回归的技术进行校准,该技术涉及在需要时对校准参数进行参数化。 校准是可能的校准参数。 使用通过光谱旋转补偿器材料系统调查系统在“材料系统存在”或“直通”配置中获得的单个二维数据集进行校准是可能的。

    Dispositif de dosage élémentaire par fluorescence induite par laser dans un plasma haute fréquence
    177.
    发明公开
    Dispositif de dosage élémentaire par fluorescence induite par laser dans un plasma haute fréquence 失效
    Dosiervorrichtungfürein Element mittels Laserinduzierter Fluoreszenz in einem Hochfrequenz-Plasma。

    公开(公告)号:EP0253731A1

    公开(公告)日:1988-01-20

    申请号:EP87401660.3

    申请日:1987-07-15

    CPC classification number: G01N21/6402 G01J3/447 G01N21/73 G01N2021/6417

    Abstract: Le dispositif comprend une torche à plasma (10-14) pour créer dans une enceinte (2) étanche un plasma HF (16) et injecter dans ce plasma un échantillon (6) contenant un élément à doser ; un laser (18) émettant des impulsions de longueur d'onde et de largeur spectrale appropriée à l'excitation de l'élément ; des prismes (22, 24) pour envoyer les impulsions laser dans le plasma afin que l'élément émette par fluorescence des impulsions lumineuses ; une lentille (46) pour conjuguer la zone excitée (36) du plasma par le laser sur un spectromètre (42) sélectionnant et transformant les impulsions émises par l'élément en un signal électrique ; une électronique (48, 50) pour traiter le signal électrique issu du spectromètre de manière synchrone avec les impulsions laser et des moyens (52) pour déterminer à partir du signal électrique traité, la quantité de l'élément contenu dans l'échantillon.

    Abstract translation: 该装置由用于在气密容器(2)中产生HF等离子体(16)的等离子体焰炬(10-14)组成。 将含有要量化的元素的样品(6)注入等离子体。 激光器(18)发射能激发元件的波长和光谱宽度的脉冲。 棱镜(22,24)将激光脉冲发送到等离子体中,使得元件将通过荧光发射光脉冲。 透镜(46)将由激光激发的等离子体(36)的区域聚焦到光谱仪(42)上,该光谱仪选择由元件发射的脉冲并将其转换成电信号。 电子电路(48,50)与激光脉冲同步地处理来自光谱仪的电信号。 提供用于根据处理的电信号确定样品中包含的元素的量的装置(52)。

    Fiber optic apparatus and method for spectrum analysis and filtering
    178.
    发明公开
    Fiber optic apparatus and method for spectrum analysis and filtering 失效
    用于过滤和分析光谱光纤的方法和装置。

    公开(公告)号:EP0233748A2

    公开(公告)日:1987-08-26

    申请号:EP87301134.0

    申请日:1987-02-10

    Abstract: An acousto-optic frequency shifter having a long interaction region is used as an optical analyzer. A variable frequency signal generator (340) is used to drive an acoustic transducer (316) to launch an acoustic wave in contact with an optical fiber (300). The acoustic frequency is varied over a known range to generate acoustic waves having known wavelengths. An optical signal having an unknown optical wavelength is introduced into one end (302) of the optical fiber (300) in a first polarization mode. The effect of the acoustic wave on the optical signal is to cause coupling of the optical signal from the first polarization mode to a second orthogonal polarization mode. The amount of the coupling is dependent upon the phase matching between the acoustic wavelength and the optical beat length. The coupling between the polarization modes is maximum when the acoustic wavelength is equal to the optical beat length. The intensity of the optical signal coupled to the second polarization mode can be measured to determine the optical wavelength corresponding to the acoustic wavelength when the maximum intensity occurs.

    Abstract translation: 具有长的相互作用区域中的声光移频器被用作在光学分析仪。 一种可变频率信号发生器(340)被用来驱动到声换能器(316)以启动在接触的声波与光纤(300)。 声频率变化比已知的,以产生具有已知波长的声波的范围内。 具有未知光波长的光信号被引入光纤(300)在第一偏振模的一个端部(302)。 上的光信号的声波的作用是使从所述第一偏振模的光信号的耦合到第二正交偏振模式。 的耦合量取决于声学波长和光学差拍长度之间的相位匹配。 偏振模式之间的耦合为最大。当声波的波长等于所述光差拍长度,耦合到第二偏振模的光信号的强度可在最大强度的发生被测量以确定矿光波长对应于声波波长 ,

    Method and devices for detecting spectral features
    179.
    发明公开
    Method and devices for detecting spectral features 失效
    用于检测光谱特征的方法和装置

    公开(公告)号:EP0131183A3

    公开(公告)日:1986-04-30

    申请号:EP84107044

    申请日:1984-06-20

    CPC classification number: G01J3/4338 G01J3/447 G01J9/04 G01N21/19

    Abstract: A method and device for detecting dichroic and/or birefringent narrow spectral features in a sample is described. The method includes the steps of providing a beam of light having an optical frequency bandwidth which is narrow compared to the width of the narrow spectral feature and having a center frequency ωc which lies near the narrow spectral feature, polarization phase modulating a beam of light with a single RF frequency to provide a pure FM spectrum having upper and lower sidebands in which either the carrier and sidebands have been polarized differently with respect to one another, exposing the sample containing the narrow spectral feature to the polarized modulated light so that the FM sidebands probe the narrow spectral feature, polarization analyzing and then photodetecting the light emerging from the sample to detect a RF beat at the specific RF frequency used for the polarization phase modulation, and electronically monitoring the amp- l i tude of the RF beat signal to indicate the strength of the narrow spectral feature. The device includes a polarization phase modulator (17) and a polarization analyzer (18) positioned on opposite sides of the sample (16). In a preferred embodiment the polarization phase modulator produces a frequency modulated optical spectrum with the sidebands polarized precisely orthogonal to the carrier (Fig. 3).

    MINIATURSPEKTROMETER UND VERFAHREN ZUM SCHALTEN EINES MINIATURSPEKTROMETERS ZWISCHEN ABBILDUNGSMODUS UND SPEKTROMETERMODUS

    公开(公告)号:EP3411680A1

    公开(公告)日:2018-12-12

    申请号:EP16805831.1

    申请日:2016-12-05

    CPC classification number: G01J3/447 G01J3/0224 G01J3/027 G01J3/08

    Abstract: The invention relates to a miniature spectrometer (10) for spectrometry and for image capture, comprising a detection unit (7) for detecting an optical parameter and an optical unit, comprising a polarizer (2), a Savart element (40), which comprises a first birefrigent element (4a) and a second birefrigent element (4b), and an analyzer (5), characterized in that a first liquid crystal element (3a) is arranged between the polarizer (2) and the Savart element (40), which is designed to adjust a fourth polarization axis (203) from a radiation (103) emitted from the first liquid crystal element such that, in an imaging mode of the miniature spectrometer (10), the radiation (103) emitted from the first liquid crystal element passes through the first birefrigent element (4a) without splitting and, in a spectrometer mode of the miniature spectrometer (10), the radiation (103) emitted from the first liquid crystal element is split in the first birefringent element (4a) into a first ordinary beam (500b) and a first extraordinary beam (500a) and wherein the analyzer (5) is arranged in the beam path behind the Savart element (40) and the detection unit (7) is arranged in the beam path behind the analyzer (5).

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