Abstract:
An automated and integrated substrate inspecting apparatus for performing an EBR/EEW inspection, a defect inspection of patterns and reticle error inspection of a substrate includes a first stage for supporting a substrate; a first image acquisition unit for acquiring a first image of a peripheral portion of the substrate supported by the first stage; a second stage for supporting the substrate; a second image acquisition unit for acquiring a second image of the substrate supported by the second stage; a transfer robot for transferring the substrate between the first stage and the second stage; and a data processing unit, connected to the first image acquisition unit and the second image acquisition unit, for inspecting results of an edge bead removal process and an edge exposure process performed on the substrate using the first image, and for inspecting for defects of patterns formed on the substrate using the second image.
Abstract:
A detection and repair system includes an optical microscope, an image-retrieving device, an emission detector, a data controller, and a laser beam generator. When detecting the location of a defect, the system charges a detected region of an organic electroluminescent device with a negative bias or low forward bias before the device is lighted on. Then, the emission detector detects the locations of defects, which generate emission such as photons, thermal or IR emission, in an enlarged image. The laser beam generator generates a laser beam, which is used to isolate one of the defects. Furthermore, this invention also discloses a method for detecting and repairing an organic electroluminescent device.
Abstract:
The invention relates to an inspection system for inspecting the surfaces of wafers, LCD's and film substrates for flaws. The system includes a scanning laser inspection system for quickly inspecting the surface and identifying and locating the flaws. The system generates and displays a flaw map graphically illustrating the article surface and the respective locations of the flaws for subsequent optical inspection. The operator selects a flaw and an optical inspection system is positioned over the selected flaw to provide a magnified image of the flaw. The operator may optically inspect all or any number of the flaws. The invention also includes means for spectrometrically analyzing the reflected light to further identify the flaw.
Abstract:
A plurality of parallel spaced cylindrical capillary tubes contain single cells and/or cell colonies in a medium and gel-like agarose, and the tubes are carried by a frame-like holder supported by a motor driven X-Y translation stage of an automated microscope. The microscope also incorporates an electronic optical detector and an object lens located under the tube holder. The entire contents of each tube are internally illuminated by a precision light beam emitted from a helium-neon laser and reflected by a set of precisely positioned mirrors so that the beam extends axially through each tube when the tube extends across the vertical axis of the object lens. The contents of the tubes are sequentially scanned under the control of special software within a personal computer, and the intensity of the light reflected outwardly from each cell or cell colony is sensed by the detector and recorded in the computer along with the axial location of the reflecting cell or cell colony. Preferably, the laser light is pure red, the optical detector is sensitive to the red light, and the object lens is focused on the wall of the tube to maximize the signal-to-noise ratio and to obtain full field detection across each tube.
Abstract:
An optical unit for inspecting the soldered surface of a printed circuit board incorporates a thick-walled translucent concave diffuser dome with a hollow central cavity facing the surface under inspection, lamps directing illumination on the exterior of the dome, inspection portals spaced around the diffuser dome for video camera inspection of the board surface, and X-Y maneuvering control means governing the relative scanning repositioning of the board surface and the dome. A light baffle between each camera and its inspection portal, incorporating alternately white and black conically chamfered rings, produces improved imaging of the inspected surface, and a flexible translucent skirt extending from the dome rim to the inspected surface, preferably formed of a large plurality of white plastic bristles, blocks direct illumination and assures substantially uniform diffused illumination of the inspected surface.
Abstract:
Apparatus for imaging a sample (109), said apparatus comprising: illumination means (101, 102, 103, 104, 105, 106, 107, 108) for illuminating said sample (109) simultaneously in a line focus or an array of foci; and detection means (108, 107, 106b, 111, 112, 113) for detecting photons emitted or scattered from a sample (109) simultaneously in an array of fields of view; wherein an array of sub-observation volumes in a sample (109), from which photons are emitted or scattered during imaging, is defined by the volumes in space where the line focus or array of foci from the illumination means (101, 102, 103, 104, 105, 106, 107, 108) overlap with the corresponding array of field of views of the detection means (108, 107, 106b, 111, 112, 113); a sample holder (110, 110a), preferably a cylindrical sample holder (110, 110a), configured to hold the sample (109) at a surface thereof, said sample holder (110, 110a) being rotatably arranged such that at least a portion of said sample (109) can be transported through at least one of said sub-observation volumes by rotating the sample holder (110, 110a).
Abstract:
The present invention relates to digital pathology, and relates in particular to a digital pathology scanner illumination unit. In order to provide digital pathology scanning with improved illumination, a digital pathology scanner illumination unit (10) is provided that comprises a light source (12), a light mixing chamber (14), and a light diffuser (16). The light source comprises a plurality of light elements (18) that are arranged longitudinally along a linear extension direction. The mixing chamber comprises a transparent volume (22) providing a mixing distance (DM) between the plurality of the light elements and the light diffuser such that light with a uniform intensity is provided at a downstream edge (26) of the mixing chamber; and the mixing chamber is arranged, in terms of light propagation, between the plurality of the light elements and the light diffuser. Further, the light diffuser comprises a diffusing material such that the light is transformed into light that has uniformity at different angles, in particular low angles.
Abstract:
An in situ inspection system and method to inspect a honeycomb body (122) skin in a skinning system. The inspection system includes a line illuminator (148) to generate a line illumination on the skin (136) perpendicular to an axial direction (112) of the honeycomb body travel, and a detector (152) to detect the line illumination scattered from the skin (136) and generate a signal based on the detected line illumination. A controller (184) is configured to receive the signal generated by the detector (152), compare the received signal to a previously stored defect free signal in real-time, and control at least one skinning process parameter based on the comparison. The method includes in situ inspecting the skin (136) and controlling at least one skinning process parameter based on the inspection. In the method, the in situ inspection includes illuminating a line of the skin (136) perpendicular to the axial direction (112) and detecting the illuminated line scattered from the skin (136).
Abstract:
An apparatus (110) (and associated method) for inspecting a steering column assembly (10) including a motor (114a) driven drive sleeve (128) supported in a headstock (114) and having a longitudinal axis, and being adapted for receiving and engaging a portion of the steering column assembly, and at least one optical scanning device (160a, 160b, 160c) adapted to optically scan a feature of interest of the steering column assembly (10) while the shaft of the steering column assembly (10) is rotated for gathering data for identifying one or more deviations from one or more predetermined values for the feature of interest.