Abstract:
Die Erfindung betrifft einen Schichtaufbau für mehrschichtige Laue‐Linsen oder zirkulare Multischicht‐Zonenplatten für Röntgenstrahlung mit abwechselnd auf einem Substrat angeordneten Schichten aus je einem Werkstoff mit einem höherem Brechungsindex und einem Werkstoff mit einem niedrigeren Brechungsindex. Dieser Schichtaufbau ist aus alternierend angeordneten Schichten innerhalb von Perioden, bestehend aus einer hochbrechenden Schicht, einer niedrigbrechenden Schicht und mindestens einem dritten Werkstoff für Zwischenschichten gebildet. Dabei weisen niedrigerbrechende Schichten Druckeigenspannung und höherbrechende Schichten Zugeigenspannung auf und das Produkt aus Schichtdicke und Eigenspannung ist in seiner Größe gleich, zumindest annähernd gleich. Zwischen höher‐ und niedrigerbrechenden Schichten ist jeweils eine Zwischenschicht angeordnet.
Abstract:
A differential phase contrast X-ray Imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X- rays after passing through the beam splitter.
Abstract:
A method of ultra-high aspect ratio high resolution vertical directionality controlled metal- assisted chemical etching, V-MACE, is provided that includes forming a pattern on a substrate surface, using a lithographic or non-lithographic process, forming hole concentration balancing structures on the substrate, using a lithographic process or non- lithographic process, where the concentration balancing structures are proximal to the pattern, forming mechanical anchors internal or external to the patterned structures, forming pathways for etchant and byproducts to diffuse, and etching vertical features from the substrate surface into the substrate, using metal-assisted chemical etching, MACE, where the vertical features are confined to a vertical direction by the concentration balancing structures.
Abstract:
A compound x-ray lens and method of fabricating these lenses are disclosed. These compound lenses use multiple zone plate stacking to achieve a pitch frequency increase for the resulting combined zone plate. The compound equivalent zone plate includes a first zone plate (412a) having an initial pitch frequency stacked onto a second zone plate (412b) to form an equivalent compound zone plate. The equivalent zone plate has a pitch frequency that is at least twice the initial pitch frequency. Also, in one example, the equivalent zone plate has a mark-to-space ratio of 1:1.
Abstract:
The invention relates to a mirror (13), comprising a substrate (20) and a reflective coating (21), wherein the substrate (20) comprises a piezoelectric material selected from the group comprising PMN-PT and PZN-PT. The invention also relates to an optical arrangement comprising at least one such mirror (13) and a device (25) for generating an electric field (26) in the piezoelectric material of the substrate (20) in order to influence a thickness (d) of the reflective coating (21), the device (25) being designed to set the thickness (d) of the reflective coating (21) such that the reflectivity of the reflective coating (21 ) is maximal at an operating wavelength (λ Β ) of the optical arrangement (1). The invention also relates to an associated method for setting the maximum wavelength of the mirror (13).
Abstract:
The present invention relates to a method for manufacturing a structure, including the steps of forming a recessed section in a first surface of a substrate (1); filling the recessed section with metal (3) to form a metal structure; exposing the metal structure from the substrate; and applying resin (20) onto the exposed metal structure and solidifying the resin to form a resin layer.
Abstract:
The invention relates to a deflection mirror for a microlithography projection exposure apparatus for illuminating an object field in an object plane of the projection exposure apparatus using the deflection mirror with grazing incidence. Said deflection mirror consists of a substrate and at least one layer system, and during operation light impinges on said mirror at a multiplicity of angles of incidence, wherein the layer system is designed such that, for light having a wavelength of less than 30 nm, for an angle of incidence of between 55° and 70°, the variation of the reflectivity is less than 20%, in particular less than 12%.
Abstract:
AA process is disclosed for sectioning by etching of monolayers and multilayers using an RIE technique with fluorine-based chemistry. In one embodiment, a process is provided for sectioning of WSi2/Si multilayers using RIE in combination with ICP using a combination of fluorine-based and chlorine-based chemistries and using RF power and ICP power. According to this embodiment, a high level of vertical anisotropy is achieved by a ratio of three gases; namely, CHF3, Cl2, and O2 with RF and ICP. Additionally, in conjunction with this embodiment, a passivation layer can be formed on the surface of the multilayer which aids in anisotropic profile generation.
Abstract:
The present invention relates to X-ray differential phase-contrast imaging. In order to enhance the information acquired by phase-contrast imaging, an analyzer grating (34) for X-ray differential phase-contrast imaging is provided with an absorption structure (48). The latter comprises a first plurality (50) of first areas (52) with a first X-ray attenuation, and a second plurality (54) of second areas (56) with a second X-ray attenuation. The second X-ray attenuation is smaller than the first X-ray attenuation, and the first and second areas are arranged periodically in an alternating manner. A third plurality (58) of third areas (60) is provided with a third X-ray attenuation, which lies in a range from the second X-ray attenuation to the first X-ray attenuation, wherein every second of the first or second areas is replaced by one of the third areas.