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    FERROELECTRIC NANOPHOTONIC MATERIALS AND DEVICES
    186.
    发明申请
    FERROELECTRIC NANOPHOTONIC MATERIALS AND DEVICES 有权
    铁电纳米材料与器件

    公开(公告)号：US20080019648A1

    公开(公告)日：2008-01-24

    申请号：US11497935

    申请日：2006-08-01

    Applicant: Harry Atwater ,  Kaushik Bhattacharya ,  Kaushik Dayal ,  Matthew Dicken ,  Demetri Psaltis ,  Axel Scherer ,  Guruswami Ravichandran

    Inventor： Harry Atwater ,  Kaushik Bhattacharya ,  Kaushik Dayal ,  Matthew Dicken ,  Demetri Psaltis ,  Axel Scherer ,  Guruswami Ravichandran

    IPC: G02B6/00

    CPC classification number: G02F1/03 ,  B82Y20/00 ,  G02B6/3574 ,  G02F2202/32

    Abstract: Systems and methods for manipulating light with tunable ferroelectric photonic devices. Devices having tunable properties that exhibit photonic bandgap behavior are fabricated from ferroelectric materials. Apparatus is provided to apply tuning signals to the ferroelectric material using one or more of electric fields, mechanical forces, optical fields, and thermal fields. Control circuitry is provided to generate the control signals needed to apply the tuning signals. Input and output ports are provided to allow input signals to be received and to provide output signals. In some cases, a feedback loop is provided to use a portion of the output signal as a diagnostic signal for control of the operation of the device within an acceptable range. It is expected that ferroelectric photonic devices operating according to principles of the invention will be useful for a wide variety of applications, including optical switching, optical modulation, optical computing, and performing logic optically.

    Abstract translation: 用可调谐铁电光子器件操纵光的系统和方法。 具有光子带隙特性的具有可调谐特性的器件由铁电材料制成。 提供了使用电场，机械力，光场和热场中的一个或多个来将调谐信号施加到铁电材料的装置。 提供控制电路以产生应用调谐信号所需的控制信号。 提供输入和输出端口以允许接收输入信号并提供输出信号。 在一些情况下，提供反馈回路以使用输出信号的一部分作为用于在可接受范围内控制装置的操作的诊断信号。 期望根据本发明的原理操作的铁电光子器件对于各种应用（包括光学开关，光学调制，光学计算和光学执行逻辑）将是有用的。

    ON-CHIP PHASE MICROSCOPE/BEAM PROFILER BASED ON DIFFERENTIAL INTERFERENCE CONTRAST AND/OR SURFACE PLASMON ASSISTED INTERFERENCE
    187.
    发明申请
    ON-CHIP PHASE MICROSCOPE/BEAM PROFILER BASED ON DIFFERENTIAL INTERFERENCE CONTRAST AND/OR SURFACE PLASMON ASSISTED INTERFERENCE 有权
    基于差分干涉对比和/或表面质谱辅助干扰的片上相位显微镜/光束分布器

    公开(公告)号：US20070258096A1

    公开(公告)日：2007-11-08

    申请号：US11743581

    申请日：2007-05-02

    Applicant: Xiquan Cui ,  Xin Heng ,  Changhuei Yang ,  Axel Scherer ,  Demetri Psaltis

    Inventor： Xiquan Cui ,  Xin Heng ,  Changhuei Yang ,  Axel Scherer ,  Demetri Psaltis

    IPC: G01B9/02

    CPC classification number: G02B21/0056 ,  G01N21/553 ,  G02B21/18 ,  G02B21/361

    Abstract: A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface plasmon assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.

    Abstract translation: 差分干涉对比度（DIC）确定装置和方法利用照明源，具有一对两个孔的层，其接收来自照明源的照明，以及光电检测器，用于接收来自穿过该对两个孔的照明的杨氏干扰。 此外，表面等离子体激元辅助光流体显微镜和方法利用照明源，具有至少一个孔作为表面的层的流体通道，以及基于穿过孔的照明而接收信号的光电检测器。 该层是波纹状的（例如通过制造），并且波纹的参数优化了在光电检测器上接收的信号。

    Coupled segmented waveguide structures
    188.
    发明授权
    Coupled segmented waveguide structures 有权
    耦合分段波导结构

    公开(公告)号：US07289694B2

    公开(公告)日：2007-10-30

    申请号：US11280854

    申请日：2005-11-15

    Applicant: Michael J. Hochberg ,  Tom Baehr-Jones ,  Axel Scherer

    Inventor： Michael J. Hochberg ,  Tom Baehr-Jones ,  Axel Scherer

    IPC: G02B6/26 ,  G02B6/42 ,  G02B6/10

    CPC classification number: G02B6/12007 ,  B82Y20/00

    Abstract: Segmented waveguides electrically coupled to a resonator and methods for electrically coupling waveguides to a resonator are disclosed. The resonator can be a split ring resonator. The disclosed structures can be useful to fabricate waveguide devices included, for example, in sensors and optical elements.

    Abstract translation: 电耦合到谐振器的分段波导和用于将波导电耦合到谐振器的方法被公开。 谐振器可以是开环谐振器。 所公开的结构可用于制造包括在例如传感器和光学元件中的波导器件。

    Electronically biased strip loaded waveguide
    189.
    发明授权
    Electronically biased strip loaded waveguide 有权
    电子偏置条带加载波导

    公开(公告)号：US07167606B2

    公开(公告)日：2007-01-23

    申请号：US11091817

    申请日：2005-03-28

    Applicant: Lawrence Cary Gunn, III ,  Axel Scherer

    Inventor： Lawrence Cary Gunn, III ,  Axel Scherer

    IPC: G02F1/035 ,  G02B6/10

    CPC classification number: B82Y20/00 ,  G02B6/10 ,  G02B6/12004 ,  G02B6/122 ,  G02B6/1225 ,  G02B6/132 ,  G02B6/136 ,  G02B2006/12038 ,  G02B2006/12061 ,  G02B2006/12097 ,  G02B2006/12109 ,  G02B2006/12116 ,  G02B2006/12145 ,  G02B2006/12147 ,  G02F1/0147 ,  G02F1/3133 ,  G02F2202/10 ,  G02F2203/15

    Abstract: A strip loaded waveguide comprises a slab and a strip, wherein the strip is separated from the slab. Nevertheless, a guiding region is provided for propagating an optical mode and this guiding region extends both within the strip and the slab. A layer of material having an index of refraction lower than that of the strip and the slab may be disposedbetween and separate the strip and the slab. In one embodiment, the slab comprises a crystalline silicon, the strip comprises polysilicon or crystalline silicon, and the layer of material therebetween comprises silicon dioxide. Such waveguides may be formed on the same substrate with transistors. These waveguides may also be electrically biased to alter the indexof refraction and/or absorption of the waveguide.

    Abstract translation: 条带加载波导包括板坯和条带，其中条带与板坯分离。 然而，提供了用于传播光学模式的引导区域，并且该引导区域在条带和板块内均延伸。 具有低于带材和板坯折射率的折射率的材料层可以设置在条带和板坯之间并分离。 在一个实施例中，板坯包括晶体硅，条带包括多晶硅或晶体硅，并且其间的材料层包括二氧化硅。 这样的波导可以在与晶体管相同的衬底上形成。 这些波导也可以被电偏置以改变波导的折射和/或吸收指数。

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