無限追従型の偏波制御器及びこれを用いた偏波モード分散補償器並びに無限追従偏波制御方法
    181.
    发明申请
    無限追従型の偏波制御器及びこれを用いた偏波モード分散補償器並びに無限追従偏波制御方法 审中-公开
    无穷大的后续偏振控制器,包含相同的极化模式分散补偿器,以及无穷大的后续偏振控制方法

    公开(公告)号:WO2004083945A1

    公开(公告)日:2004-09-30

    申请号:PCT/JP2003/003246

    申请日:2003-03-18

    CPC classification number: G01J4/04 G02F1/0136 H04B10/2569

    Abstract: 偏波制御器において、可変偏光素子(1)の入力光及び出力光の偏光状態をモニタする偏光状態モニタ手段(4,5)と、この偏光状態モニタ手段(4,5)でモニタした各偏光状態を表すポアンカレ球上の位置がその赤道に対して対称もしくは略対称な位置にあるときに、可変偏光素子(1)の光学軸の方位を変化させることによりポアンカレ球の地軸(S 3 軸)を回転軸としてポアンカレ球をπだけ回転させるとともに、位相シフト量の変化方向を反転させる制御手段(6)とをそなえるように構成する。これにより、入力光の波長λ未満の位相シフト量で偏光の無限追従制御を実現することができる。

    Abstract translation: 偏振控制器包括用于监测可变偏振器(1)的输入和输出光的偏振态的偏振状态监视装置(4,5)和用于使庞加莱球旋转表示偏振状态的位置的控制装置(6) 通过在表示Poincare球体上的极化状态的位置对称或大致对称于相对于所述光轴的赤道的位置上通过改变光轴的方向,通过偏振监测装置(4,5)围绕轴线(S3) 庞加莱球体,用于反转相移变化的方向。 因此,小于输入光的波长λ的相移能够实现极化的无限后续控制。

    PHOTOPOLARIMETERS AND SPECTROPHOTOPOLARIMATERS WITH MULTIPLE DIFFRACTION GRATINGS
    182.
    发明申请
    PHOTOPOLARIMETERS AND SPECTROPHOTOPOLARIMATERS WITH MULTIPLE DIFFRACTION GRATINGS 审中-公开
    具有多个衍射光栅的光刻胶和光谱光刻胶

    公开(公告)号:WO2003069291A1

    公开(公告)日:2003-08-21

    申请号:PCT/US2003/004794

    申请日:2003-02-13

    CPC classification number: G01J4/04 G01J3/447

    Abstract: In a device for measuring the complete polarization state of light over a spectral bandwidth, an optical input signal (41) with wavelengths of light within a spectral band is incident on two or more diffraction gratings (42, 44, 46, 48), or incident from at least two directions on one or more diffraction gratings (72, 74), and the intensity is measured as a function of wavelength for at least four of the diffraction spectra produced by the grating(s). The polarization state of light is then calculated as a function of wavelength over the spectral bandwidth from the intensity measurements.

    Abstract translation: 在用于在光谱带宽上测量光的完全偏振状态的装置中,具有光谱带内的光的波长的光输入信号41入射到两个或更多个衍射光栅42,44,46,48上,或从至少入射 在一个或多个衍射光栅72,74上的两个方向,并且对于由光栅产生的至少四个衍射光谱,测量强度作为波长的函数。 然后,根据强度测量,光的偏振状态被计算为光谱带宽上的波长的函数。

    分光エリプソメータを用いた薄膜層構造の解析方法
    183.
    发明申请
    分光エリプソメータを用いた薄膜層構造の解析方法 审中-公开
    使用光谱仪测量薄膜层结构的方法

    公开(公告)号:WO2003023373A1

    公开(公告)日:2003-03-20

    申请号:PCT/JP2002/009080

    申请日:2002-09-06

    CPC classification number: G01J4/04 G01B11/0641 G01N21/211

    Abstract: A single-layer ultrathin film and thin film are measured by setting a combination model of the film thickness, the optical constant using a dispersion formula, and the angle of incidence and by repeating fitting with the measured spectrum by the best local minimum calculation BLMC finite times. Similarly the thin-film n-layer n >= 2 structure is determined by setting combination models of two-layer structure and 3- to n-layer structures and by carrying out fitting by the best local minimum calculation BLMC and the extended best local minimum calculation EBLMC. By any measurement of the thin film being measured on a substrate, while varying thee wavelength of the incident light, the measurement spectrum &PSgr;Elambdi and DELTAElambdi representing the variations of polarization of the incident light and the reflected light for each waveform lambdi are determined. By the fitting with the measurement spectrum model, an optimum model is selected. The result of selection is checked, if necessary, and then stored.

    Abstract translation: 通过设置膜厚度的组合模型,使用色散公式的光学常数和入射角度以及通过最佳局部最小计算BLMC有限元重复测量光谱来测量单层超薄膜和薄膜 倍。 类似地,通过设置双层结构和3-至n层结构的组合模型并通过最佳局部最小计算BLMC和扩展最佳局部最小值进行拟合来确定薄膜n层n> = 2结构 计算EBLMC。 通过在基板上测量的薄膜的任何测量,在改变入射光的波长的同时,确定表示入射光的偏振和每个波形的反射光的偏差的测量光谱和PSgr; Elambdi和DELTAElambdi。 通过与测量光谱模型拟合,选择最佳模型。 检查结果,如果需要,然后存储。

    APPARATUS AND METHODS FOR POLARIZATION MEASUREMENTS
    185.
    发明申请
    APPARATUS AND METHODS FOR POLARIZATION MEASUREMENTS 审中-公开
    用于极化测量的装置和方法

    公开(公告)号:WO2003016844A1

    公开(公告)日:2003-02-27

    申请号:PCT/US2002/025918

    申请日:2002-08-14

    CPC classification number: G01J4/04 G01J3/447 G02B27/286

    Abstract: Apparatus and methods for polarimetric measurements across a spectral range, such as determining the polarimetric state acrosS a wavelength band in a wavelength-division multiplexed fiber optic channel. A variable phase delay is introduced between orthogonal polarization components in an incident light. The resulting intensity changes are used to compute parameters indicative of the polarimetric state of the light. These measurements may be used, for example, for polarimetric imaging, polarimetric component characterization, and measuring polarization states in a fiber link.

    Abstract translation: 用于跨越光谱范围的偏振测量的装置和方法,例如确定波分复用光纤通道中的波长频带的极化状态。 在入射光中的正交偏振分量之间引入可变相位延迟。 所得强度变化用于计算指示光的极化状态的参数。 这些测量可以用于例如光学连接中的偏振成像,偏振成分表征和测量极化状态。

    SYSTEM FOR MEASURING OF BOTH CIRCULAR AND LINEAR BIREFRINGENCE
    186.
    发明申请
    SYSTEM FOR MEASURING OF BOTH CIRCULAR AND LINEAR BIREFRINGENCE 审中-公开
    用于测量两个圆形和线性双向的系统

    公开(公告)号:WO01073385A1

    公开(公告)日:2001-10-04

    申请号:PCT/US2001/009384

    申请日:2001-03-23

    CPC classification number: G01N21/23 G01J4/04

    Abstract: A system and method for precisely measuring low-level and circular birefringence properties (retardance and direction) of optical materials (26). The system incorporates a photoelastic modulator (24) for modulating polarized light that is then directed through a sample (26). The beam ("Bi") propagating from the sample is separated into two parts, with one part ("B1") having a polarization direction different than the polarization direction of the other beam part ("B2"). These separate beam parts are then processed as distinct channels. Detection mechanisms (32, 50) associated with each channel detect the time varying light intensity corresponding to each of the two parts of the beam. This information is combined for calculating a precise measure of the linear and/or circular retardance induced by the sample, as well as the sample's fast axis orientation and direction of circular retardance.

    Abstract translation: 用于精确测量光学材料(26)的低水平和圆形双折射性质(延迟和方向)的系统和方法。 该系统包含用于调制偏振光的光弹性调制器(24),然后被引导通过样品(26)。 从样品传播的光束(“Bi”)被分成两部分,其中一部分(“B1”)的偏振方向与另一光束部分(“B2”)的偏振方向不同。 然后将这些单独的光束部分作为不同的通道进行处理。 与每个通道相关联的检测机构(32,50)检测对应于梁的两个部分中的每一个的时变光强度。 该信息被组合用于计算由样品引起的线性和/或圆形延迟的精确测量,以及样品的快轴取向和圆形延迟的方向。

    MICROPOLARIMETER
    187.
    发明申请
    MICROPOLARIMETER 审中-公开
    micropolarimeter

    公开(公告)号:WO99008081A1

    公开(公告)日:1999-02-18

    申请号:PCT/EP1997/004291

    申请日:1997-08-06

    Abstract: The invention concerns a micropolarimeter comprising an analyzer (1) and a detector (10) located past the analyzer in the direction of radiation and presenting a number of segments ND which is higher than or equal to 3 (11). The invention seeks to provide a micropolarimeter with no moving parts, with a high polarization index, for use for polychromatic light, so small that it can detect the ray of common lasers in one single measurement step without it being necessary to enlarge it, and capable of being converted in a simple manner into a complete stokesmeter. To that end, the analyzer (1) consists of a radially symmetrical flat disk (5) produced in a polarizing material with which the polarization rests on absorption effects inside said material, the surface of the analyzer (1) being greater than or equal to the surface of the detector segments (10).

    Abstract translation: 中描述了一种与micropolarimeter分析器(1)和具有设置在分析仪检测器(10)后面的波束方向具有多个ND段> / = 3(11)。 它是要创建无运动部件一个micropolarimeter,其具有高偏振度的可用于多色光和是如此之小,普通的激光器,而不附加膨胀的光束可以在测量步骤被检测到,并且以简单的方式,以一个完整的Stoksmeter 可扩展。 该分析仪(1)包括一个径向对称的,平盘(5)包括在其偏振被基于所述材料内的吸收效果的偏振材料,其中,所述分析器的表面(1)> / =所述检测器(10)的链段的表面。

    OPTICAL APPARATUS AND METHOD
    188.
    发明申请
    OPTICAL APPARATUS AND METHOD 审中-公开
    光学装置和方法

    公开(公告)号:WO1988003266A1

    公开(公告)日:1988-05-05

    申请号:PCT/GB1987000752

    申请日:1987-10-23

    CPC classification number: G01N21/21 G01J4/04 G01N30/36 H01S5/32

    Abstract: High pressure liquid chromatography apparatus for use in the analysis of optically-active materials comprises a semiconductor laser diode radiation source (10), a test sample holder (13) through which radiation from the radiation source passes to a detector (16). A polariser (11) and analyser (15) cooperate with a modulator (12) which modulates the rotation of the polarisation of radiation from the laser.

    카운팅 장치와 다단식 회전 인코더에서의 회전 각도를 측정하기 위한 장치 및 관련 센서들
    189.
    发明公开
    카운팅 장치와 다단식 회전 인코더에서의 회전 각도를 측정하기 위한 장치 및 관련 센서들 审中-实审
    用于测量计数装置和多级旋转编码器中的旋转角度的装置和相关传感器

    公开(公告)号:KR1020170120658A

    公开(公告)日:2017-10-31

    申请号:KR1020177026832

    申请日:2016-02-22

    CPC classification number: G01D5/345 G01D5/344 G01J4/04

    Abstract: 본발명은장치들및 다단식회전인코더들의상태를측정하기위한장치및 관련센서에관한것이다. 전자적으로판독가능한장치들및 멀티턴회전인코더들의구성을간단하게하기위해, 본발명에따라적어도하나의회전가능한휠, 적어도하나의광원및 적어도하나의편광센서를포함하는장치가제안되고, 이경우휠은적어도부분적으로투과성이고편광유지되며, 상기휠의부분들은편광필터로서형성되며, 광원에의해방사되는광은편광필터에의해편광될수 있고편광센서에의해수신될수 있다.

    Abstract translation: 本发明涉及用于测量装置和多级旋转编码器的状态的设备和相关联的传感器。 为了简化电子可读设备和多圈旋转编码器的构造,根据本发明提出了一种设备,其包括至少一个可旋转轮,至少一个光源和至少一个偏振传感器, 其中轮子的部分形成为偏振滤光器,并且由光源发射的光可以被偏振滤光器偏振并且被偏振传感器接收。

    이미지들에서 광의 편광을 측정하기 위한 시스템들 및 방법들
    190.
    发明授权
    이미지들에서 광의 편광을 측정하기 위한 시스템들 및 방법들 有权
    用于测量图像中光的偏振的系统和方法

    公开(公告)号:KR101784334B1

    公开(公告)日:2017-10-11

    申请号:KR1020150017571

    申请日:2015-02-04

    Abstract: 시스템들은편광필터를갖는또는갖지않는단일카메라를이용하여편광계측데이터를획득할수 있다. 편광필터가사용될때, 데이터획득방법은: (1) 이미지들이캡쳐링될때 다양한방향들로편광필터 (및카메라)를방향설정하기위해항공기 (또는다른운송수단)을조종하는단계, (2) 다양한이미지들을서로레지스터링하는단계, 및 (3) 이미지들에서관심있는포인트들에대한편광계측값들(이를테면, 스토크스파라미터들)을계산하는단계를포함한다. 편광필터가사용되지않을때, 데이터획득방법은, 이미지들이캡쳐링될때 다양한방향들로카메라를방향설정하기위해항공기 (또는다른운송수단)을조종하고그 다음동일한동작들 (2) 및 (3)을수행하는단계를포함한다. 이러한방법들은상이한각들에서다수의카메라이미지들을촬영함으로써주어진풍경에서편광의양을측정한다.

    Abstract translation: 系统可以使用带有或不带有偏振滤光片的单个照相机获取偏振测量数据。 当使用偏振滤波器时,数据采集方法包括:(1)在拍摄图像时转向飞机(或其他车辆)以沿各个方向对偏振滤波器(和相机)进行定向,(2) (3)计算图像中感兴趣点的偏振测量结果(例如斯托克斯参数)。 当不使用偏振滤光片时,数据采集方法控制飞机(或其他车辆)在拍摄图像时在各个方向上定向照相机,然后执行相同的操作(2)和(3) 一个包括执行的步骤。 这些方法通过以不同角度拍摄多个相机图像来测量给定景观中的偏振量。

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