公开(公告)号：DE1773598A1

公开(公告)日：1972-02-24

申请号：DE1773598

申请日：1968-06-10

Applicant: APPLIED RES LAB INC

Inventor： LEON DAHLQUIST RALPH ,  LATIMER JONES JAMES ,  BARBARA SANTA ,  WILLIAM PASCHEN KENNETH

IPC: G01N1/00 ,  G01N21/67 ,  G01N21/54

公开(公告)号：GB1261596A

公开(公告)日：1972-01-26

申请号：GB3039969

申请日：1969-06-16

Applicant: APPLIED RES LAB INC

IPC: G01N21/67 ,  G01N21/73 ,  H05H1/48

Abstract: 1,261,596. Discharge lamps. APPLIED RESEARCH LABORATORIES Inc. 16 June, 1969 [17 June, 1968], No. 30399/69. Heading H1D. Material to be analysed spectrochemically is injected through an inlet 24 into a gas flowing through a tube 26 along which an arc is maintained in a wall-stabilized state by dynamically cooling the tube. A working gas, e.g. argon is admitted through a port 16 to a chamber 10 having a window 14, e.g. of lithium fluoride and an outlet 12 cooled by liquid circulating in a passage 18 and serving as an anode between which and a cathode 30, e.g. a wire of 99% tungsten-1% thorium alloy, a wall-stabilized arc is maintained along the tube 26 which is cooled by liquid in a passage 27. The inlet 24 opens into a passage 22 in an insulating disc 20, e.g. of boron nitride. The material to be analysed may be a gas or submicron particles entrained in a carrier gas such as argon. An exhaust port 36 is provided. The arc may be struck by a high-voltage pulse or by a movable auxiliary electrode (not shown). In a modified arrangement (Fig. 2, not shown) for absorption analysis the passage 26 is extended to a second chamber similar to the chamber 10. A light source is mounted internally or externally of this second chamber.

公开(公告)号：GB1213534A

公开(公告)日：1970-11-25

申请号：GB5106668

申请日：1968-10-28

Applicant: APPLIED RES LAB INC

IPC: G01N23/225 ,  G01N27/62 ,  H01J37/252 ,  H01J49/14

Abstract: 1,213,534. Ion beam apparatus. APPLIED RESEARCH LABORATORIES Inc. 28 Oct., 1968 [30 Oct., 1967; 12 July, 1968], No. 51066/68. Heading H1D. In a method of chemical analysis by bombarding a material to be analysed with a beam of primary ions to sputter atoms of the material from its surface as secondary ions and mass spectrometrically analysing the secondary ions, the primary ions are ions which are chemically reactive with the material to be analysed under the conditions of bombardment, e.g. ions of C, N, O, F, Cl or I in order to increase the availability and stability of yield of ions for analysis particularly in comparison with the use of primary ions of one of the inert gases, e.g. A or Xe. Graphs are given showing ion output against time in respect of the bombardment of aluminium, zinc and stainless steel targets with positive atomic or molecular oxygen ions to produce aluminium ions, zinc ions and chromium, iron, nickel or silicon ions respectively. Also mentioned are targets of Ti, Si, Mg, Fe, Ag, Mo, C, W, Zr, Mn, Cr, Sn, Pb, Bi, Ni and Cu. The analysing instrument may comprise an ion microscope or ion probe system coupled to a mass spectrometer. The ion source for the primary ions comprises a duoplasmatron in which the aperture 90 in intermediate electrode 86 is offset slightly from coaxial alignment with the cathode 80-a favourable arrangement for the production of negative ions. The tubular cathode 80 has electron emissive material on its inner wall. The source also includes an anode plate 94 having its aperture aligned with the axis of the cathode 80 and fixed upon an iron plate 94, a tubular acceleration tube 108 and a shielding tube 110 which supported on a bellows assembly 112 for axial adjustment. Dynamic air cooling is provided by a fan 104. A constricting magnetic field between intermediate electrode 86 and anode 92 is produced by annular ceramic permanent magnets 114 mounted between iron plate 94 and an iron plate 116. The reactive element used in the source is preferably diluted with an inert carrier gas e.g. A or N.

公开(公告)号：DE1919880A1

公开(公告)日：1970-11-05

申请号：DE1919880

申请日：1969-04-18

Applicant: APPLIED RES LAB INC

Inventor： J LIEBL HELMUT

IPC: H01J37/22 ,  H01J37/252 ,  H01J37/256 ,  H01J49/14

公开(公告)号：GB1145108A

公开(公告)日：1969-03-12

申请号：GB3441868

申请日：1966-10-04

Applicant: APPLIED RES LAB INC

IPC: H01J29/84 ,  H01J49/28

Abstract: 1,145,108. Particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965], No. 34418/68. Divided out of 1,145,108. Heading H1D. A particle dispensing sector lens such as an electric, spherically curved, toroidal condenser 12, is associated with an electric unipotential lens 10 to reduce the distance between the object and image planes and so increase the acceptance angle at the aperture diaphragm 40. The unipotential lens 10 comprises electrodes 34, 36, 38 and a set of deflection plates 32 is provided to adjust the direction and position of the particle beam. In another system a magnetic sector lens is associated with a unipotential lens on each side of the sector lens along the particle beam axis.

公开(公告)号：FR1508152A

公开(公告)日：1968-01-05

申请号：FR79474

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：DE1798021A1

公开(公告)日：1971-08-26

申请号：DE1798021

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

Inventor： JAKOB LIEBE HELMUT

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：DE1539659A1

公开(公告)日：1969-12-18

申请号：DEA0053727

申请日：1966-10-11

Applicant: APPLIED RES LAB INC

Inventor： JAKOB LIEBL HELMUT

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32 ,  H01J39/34

Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

公开(公告)号：GB1159905A

公开(公告)日：1969-07-30

申请号：GB1310668

申请日：1968-03-18

Applicant: APPLIED RES LAB INC

IPC: G01N23/225 ,  H01J35/04

Abstract: 1,159,905. X-ray apparatus. APPLIED RESEARCH LABORATORIES In(. 18 March, 1968 [20 March, 1967], No. 13106/68. Heading H5R. [Also in Division H1] Apparatus for producing characteristic X-ray radiation from a specimen to be examined comprises a rotatable specimen carrier 20 adapted to support a plurality of specimens 24 and arranged on one side of the axis of an electron beam 14, a rotatable anode carrier 26 carrying a plurality of different anode materials 28 and arranged on the other side of the axis, and magnetic deflecting means 30 so that the beam may be deflected either directly on to the specimen (as shown in Fig. 1) for the production of X-rays or on to a selected opposed anode surface 28 to produce X-rays which illuminate the specimen and produce X-ray fluorescence (Fig. 3, not shown). Preferably the specimens 24 are arranged on a bevelled edge of the carrier 20 so that X-rays enlarging normal to the specimen pass clear of the anode structure to a spectrometer 34 which may be in the same evacuated enclosure (not shown). The apparatus shown includes an electron gun 10, a focusing coil 12, and two pairs of deflecting coils 16 and 18. The anode carrier 26 and specimen carrier 20 may be water cooled.

公开(公告)号：DE1489658A1

公开(公告)日：1969-05-08

申请号：DE1489658

申请日：1965-09-18

Applicant: APPLIED RES LAB INC

Inventor： NEUHAUS HERMANN

IPC: G01N23/225 ,  H01J37/18 ,  H01J37/22 ,  H01J37/252 ,  H01J37/30 ,  H01J37/301 ,  H02G1/02