公开(公告)号：JP2005283594A

公开(公告)日：2005-10-13

申请号：JP2005133649

申请日：2005-04-28

Applicant: Advantest Corp ,  株式会社アドバンテスト

Inventor： ARAKAWA NORIO ,  KONNO HIROYUKI

IPC: G01R27/28

Abstract: PROBLEM TO BE SOLVED: To provide a fast Fourier transform method and device, executing a discrete Fourier transform process in real time simultaneously while obtaining sample data. SOLUTION: A frequency sweep is performed by a frequency sweep oscillator 11, and measured values x(0), x(1), ..., x(n-1) is obtained through a detection circuit 13 and AD converters 19, 20 in each frequency step Δf as response output of a tested circuit 12. A fast Fourier transform device 14 is a device performing parallel discrete Fourier transform, and is provided with a measuring frequency counter 16A and a term-classified Fourier transformer 16B. The measuring frequency counter 16A counts a measured data number every time the measured values x(0), x(1), ..., x(n-1) are inputted. The term-classified Fourier transformer 16B specifies a term number of an arithmetic expression according to a data number of the measuring frequency counter 16A, and executes the Fourier transform about the specified term number. An arithmetic result is stored in an arithmetic result file 17A provided in a memory 17. COPYRIGHT: (C)2006,JPO&NCIPI

Abstract translation: 要解决的问题：为了提供快速傅立叶变换方法和装置，在获得样本数据的同时同时执行离散傅立叶变换处理。 解决方案：频率扫描由频率扫描振荡器11执行，通过检测电路13和AD转换器获得测量值x（0），x（1），...，x（n-1） 在每个频率步长Δf作为被测试电路12的响应输出的20,20.快速傅里叶变换装置14是执行并行离散付里叶变换的装置，并且设置有测量频率计数器16A和项分类的傅里叶变换器16B。 每当输入测量值x（0），x（1），...，x（n-1）时，测量频率计数器16A对测量数据数进行计数。 术语分类傅立叶变换器16B根据测量频率计数器16A的数据号来指定算术表达式的项数，并且执行关于指定项数的傅里叶变换。 算术结果存储在存储器17中提供的运算结果文件17A中。（C）版权所有（C）2006，JPO＆NCIPI

公开(公告)号：JP2001052281A

公开(公告)日：2001-02-23

申请号：JP23059899

申请日：1999-08-17

Applicant: ADVANTEST CORP

Inventor： MIYAJIMA ATSUSHI ,  UMETSU SATOSHI ,  YAMAGUCHI TAKAHIRO ,  ARAKAWA NORIO

IPC: G06F13/00 ,  G08C19/00 ,  H04Q9/00

Abstract: PROBLEM TO BE SOLVED: To appropriately control a measuring device by making a measuring system have a measuring device control adapter that generates a control command controlling the measuring device and transmits the control command to the measuring device. SOLUTION: In a control host system 10, a control program preparing part 16 prepares a control program, and a control program transmitting part 20 transmits it to a measuring device control adapter 60 through Ethernet 50. An inputting part 14 inputs the name of a program to be carried out and the name of the program is transmitted to the adapter 60. The adapter 60 fetches a control program notified to a program executing part 70 from a storing part 64, a command generating part 72 generates a control command on the basis of the control program, and a communicating part 74 transmits it to a measuring device 100 through a GPIB 90. In the device 100, a measurement result transmitting part 102 transmits measurement results to the adapter 60. In the adapter 60, a measured data transferring part 76 transmits a measurement result to a display host system 30.

公开(公告)号：JPH11167565A

公开(公告)日：1999-06-22

申请号：JP27709198

申请日：1998-09-30

Applicant: ADVANTEST CORP

Inventor： ARAKAWA NORIO ,  KONNO HIROYUKI

IPC: G01R27/28 ,  G01R23/16 ,  G06F17/14

Abstract: PROBLEM TO BE SOLVED: To provide the fast Fourier transform method and device which can execute the discrete Fourier transform processes in parallel to each other for each term and plural continuous terms of a fast Fourier transform expression and accordingly can decrease the calculation frequency of the Fourier conversion. SOLUTION: In regard to a Fourier transform device which executes the Fourier conversion by means of a discrete Fourier transform expression, a measurement frequency counter 16A is prepared to coat the data numbers every time the test data are obtained for each test point together with a Fourier transform device 16B which executes the Fourier transform operations for plural terms that are used in common among plural Fourier transform expressions and prescribed by the data numbers, an arithmetic result file 17A which stores the Fourier transform arithmetic results of the common terms obtained by the device 16B, and an addition means 16C which adds together the arithmetic value stored in the file 17A so as to make every Fourier transform expression show its final result. In such a constitution of the fast Fourier transform device, the redundant components of calculation are eliminated for the plural terms of the Fourier transform expressions.

公开(公告)号：JPH10142272A

公开(公告)日：1998-05-29

申请号：JP30180696

申请日：1996-11-13

Applicant: ADVANTEST CORP

Inventor： ARAKAWA NORIO

IPC: G01R27/28

Abstract: PROBLEM TO BE SOLVED: To provide a net work analyzer which can improve productivity without causing costup by improving the substantial operation rate of a net work analyzer. SOLUTION: A plurality of measurement terminals 10-1∼10-n to measure the characteristics of a measured object by connecting the measured object is provided, and connected through a terminal adapter 30 to a main frame 20 to carry out the control of each measuring action, the computation of measured data and judgment processing, and in the terminal adapter 30, a connection between the main frame 20 and a plurality of measurement terminals 10-1∼10-n is changed over.

公开(公告)号：JP2509154B2

公开(公告)日：1996-06-19

申请号：JP20102594

申请日：1994-08-25

Applicant: ADVANTEST CORP

Inventor： ARAKAWA NORIO ,  YAMAGUCHI TAKAHIRO ,  WATANABE SHINICHI ,  NIKI NAOHARU

IPC: G01J3/28 ,  G01J3/45 ,  G01R23/16

公开(公告)号：JPH0426066B2

公开(公告)日：1992-05-06

申请号：JP18164483

申请日：1983-09-28

Applicant: ADVANTEST CORP

Inventor： YAMAGUCHI TAKAHIRO ,  ARAKAWA NORIO ,  OZAWA HIROMI

IPC: G01R27/28

公开(公告)号：JP2011095040A

公开(公告)日：2011-05-12

申请号：JP2009247731

申请日：2009-10-28

Applicant: Advantest Corp ,  株式会社アドバンテスト

Inventor： MINEGISHI TOSHIYUKI ,  ARAKAWA NORIO

IPC: G01R31/28

Abstract: PROBLEM TO BE SOLVED: To provide a tester wherein a controller allows a next checking request to be transmitted at a time when a plurality of required processes are all predicted to complete even without repeatedly reading out a flag that shows the completion of the process from a test unit until the processes are completed when performing polling while the controller is operated efficiently without increasing power consumption.
SOLUTION: This tester for testing a device under test includes a test unit for testing the device under test, and the controller requiring the execution of the processes for the test unit. By the test unit, status information is transmitted to the controller, the status information showing predicted time up to the completion of the processes required by the controller. By the controller, timing is determined at which the completion of the processes is checked through the test unit based on the predicted time shown in the status information received from the test unit.
COPYRIGHT: (C)2011,JPO&INPIT

Abstract translation: 要解决的问题：提供一种测试器，其中控制器允许在多个所需过程全部预测完成时发送下一个检查请求，即使不重复读出显示完成的标志 在控制器高效运行而不增加功耗的情况下执行轮询时，从测试单元到处理完成。

解决方案：用于测试被测器件的测试仪包括用于测试被测器件的测试单元，以及需要执行测试单元的过程的控制器。 通过测试单元，将状态信息发送到控制器，该状态信息显示直到控制器所需的处理完成的预测时间。 通过控制器，基于从测试单元接收的状态信息中所示的预测时间，确定通过测试单元检查处理完成的定时。 版权所有（C）2011，JPO＆INPIT

公开(公告)号：JP2001153904A

公开(公告)日：2001-06-08

申请号：JP33395199

申请日：1999-11-25

Applicant: ADVANTEST CORP

Inventor： NAKAYAMA KIWA ,  ARAKAWA NORIO

IPC: G01R27/28

Abstract: PROBLEM TO BE SOLVED: To provide a network analyzer which can find various kinds of circuit parameters of a substance to be measured. SOLUTION: A raw data measuring part 13 for measuring the S parameter of the substance to be measured 20, a measuring system error factor measuring part 14 for finding a measuring system error factor which are produced when the substance 20 is measured, a parameter conversion factor computing part 15 for finding a parameter conversion factor which represents the relation between an impedance and a measurement-system-error-factor removed data being a data obtained by removing the measurement system error factor from the S parameter, an extended error factor computing part 17 for finding an extended error factor being a synthesized one of the measurement system error factor and the parameter conversion factor, and a substance-to-be-measured computing part 18 for finding impedance from the S parameter and the extended error factor, are provided with. Accordingly, fixtures become unnecessary. In addition, the analyzer becomes simpler and its operation speed becomes faster too, since the extended error factor is found beforehand.

公开(公告)号：JPH076056A

公开(公告)日：1995-01-10

申请号：JP17270093

申请日：1993-06-18

Applicant: ADVANTEST CORP

Inventor： ARAKAWA NORIO ,  SAITOU CHIEZOU

IPC: G06F9/06 ,  G06F9/46 ,  G06F9/48 ,  G06F11/28

Abstract: PURPOSE:To efficiently inspect whether application software is actualized according to specifications without impairing reliability while a process is executed in an ideal state on a system which uses an OS of a real-time processing system. CONSTITUTION:On the system which uses the OS of the real-time processing system, the units of processes are tasks. For the processes execution of a task, the treaty to be satisfied the both of 'preconditions' for the process which should be satisfied in advance and 'postconditions' which should be guaranteed when the process ends under the conditions is prescribed as a precondition. Then messages are transferred to a separately provided inspecting device, process by process, and compared and matched with 'standards of preconditions and postconditions' which are registered there to perform the inspection simultaneously in parallel.

公开(公告)号：JPH01167678A

公开(公告)日：1989-07-03

申请号：JP32826487

申请日：1987-12-23

Applicant: NIPPON TELEGRAPH & TELEPHONE ,  ADVANTEST CORP

Inventor： YAMASHITA KATSUYA ,  NIKI NAOHARU ,  YAMAGUCHI TAKAHIRO ,  NAKANISHI TORU ,  ARAKAWA NORIO

IPC: G01J3/45 ,  G01R23/16

Abstract: PURPOSE:To obtain a smooth spectrum curve by averaging time area data by a time area averaging means by corresponding times, averaging time area averaged data by frequency areas, and obtaining time area averaged data with a high S/N. CONSTITUTION:Data corresponding to the same time based upon a trigger are stored in the same addresses of memory planes of a memory 14. The same addresses of the memory planes of the memory 14 are read out, a shifter 8 performs division for averaging, and the output of the shifter 8 is integrated by a cumulative adder 19. Thus, the time area data are averaged and stored in a memory 21. The respective time area averaged data are converted by, for example, a fourier transforming means 22 into data on frequency areas. The frequency area data have corresponding frequency components averaged by the frequency area averaging means 23. Therefore, the time area averaged data with the high S/N ratio is obtained and the smooth spectrum curve is obtained.