公开(公告)号：SG149894G

公开(公告)日：1995-03-17

申请号：SG149894

申请日：1994-10-17

Applicant: IBM

Inventor： HOWARD WEBSTER EUGENE ,  ALT PAUL MATTHEW

IPC: G02F1/133 ,  G09G3/20 ,  G09G3/36

公开(公告)号：SG52936A1

公开(公告)日：1998-09-28

申请号：SG1997000884

申请日：1997-03-21

Applicant: IBM

Inventor： ALT PAUL MATTHEW ,  CHALCO PEDRO A ,  FURMAN BRUCE KENNETH ,  HORTON RAYMOND ROBERT ,  NARAYAN CHANDRASEKHAR ,  OWENS BENAL LEE JR ,  WARREN KEVIN WILSON ,  WRIGHT STEVEN LORENZ

IPC: G02F1/1343 ,  G02F1/13 ,  G02F1/1362 ,  G06F11/20 ,  G09F9/30 ,  G09G3/20 ,  G09G3/36 ,  G11C29/00 ,  G09G3/16

Abstract: A matrix addressed display system designed so as to enable data line (22) repair by electronic mechanisms which is efficient and low in cost and thus increases yield. Such active data line (22) repair utilizes additional data driver (36) outputs, a defect map memory (48) in the TFT/LCD module and modification of the data stream to the data drivers (36) by additional circuits (42) between the display and the display adapter. A bus configuration on the display substrate is utilized which combines repair flexibility, low parasitic capacitance, and the ability to easily make the necessary interconnections. The number of interconnections is kept to a minimum, the connections are reliable, and the connections may be made with conventional wire bond or laser bond technology, or disk bond technology.

公开(公告)号：DE3751111D1

公开(公告)日：1995-04-06

申请号：DE3751111

申请日：1987-12-01

Applicant: IBM

Inventor： ALT PAUL MATTHEW

IPC: G01R31/265 ,  G02F1/13 ,  G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09G3/00 ,  G09G3/36 ,  H01L21/336 ,  H01L21/66 ,  H01L21/768 ,  H01L23/58 ,  H01L27/12 ,  H01L29/78 ,  H01L29/786 ,  G01R31/26 ,  G09F9/35 ,  G06F3/00

Abstract: An array of thin film transistor (TFT) devices is provided with a conductive region, such as a strip, for temporarily coupling a floating pel electrode of each of the plurality of TFT devices to a conductor on an underlying substrate. The conductor may be a row or column metalization line associated with an adjacent row or column of the array. The conductive strip may therefore be utilized, in conjunction with appropriate voltage potentials and test circuitry, to test each of the TFT devices prior to the final fabrication of the TFT array into a completed flat panel display. Thus, nonfunctioning or out of specification arrays may be identified at an early point in the manufacturing cycle of the display. The strip may be comprised of amorphous silicon which is illuminated during the test in order to reduce the intrinsic resistance of the strip. The strip may also be comprised of a layer of metalization, which layer is removed from the array at the completion of the test.

公开(公告)号：HK137894A

公开(公告)日：1994-12-16

申请号：HK137894

申请日：1994-12-08

Applicant: IBM

Inventor： HOWARD WEBSTER EUGENE ,  ALT PAUL MATTHEW

IPC: G02F1/133 ,  G09G3/20 ,  G09G3/36

公开(公告)号：DE3886678T2

公开(公告)日：1994-06-30

申请号：DE3886678

申请日：1988-10-03

Applicant: IBM

Inventor： HOWARD WEBSTER EUGENE ,  ALT PAUL MATTHEW

IPC: G02F1/133 ,  G09G3/20 ,  G09G3/36