12.
    发明专利
    未知

    公开(公告)号:DE2549738A1

    公开(公告)日:1976-07-01

    申请号:DE2549738

    申请日:1975-11-06

    Applicant: IBM

    Abstract: A process for producing light emitting diodes is disclosed. In the process a primer layer of GaP is pyrolytically deposited on a Si substrate with the resulting epitaxial film thickness being sufficient to form complete coalescence of the epitaxial nuclei, but thin enough to avoid cracks in the epitaxial layer due to stress induced by thermal expansion. The thickness is generally between 1-2 mu . A second layer of GaP is then deposited using the standard halide transport process with thicknesses of 10-20 mu with the graded addition of AsH3, until the particularly desired design composition of GaAsP is obtained. A constant layer of GaAsP is grown on the graded layer.

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