公开(公告)号：CA1160293A

公开(公告)日：1984-01-10

申请号：CA339630

申请日：1979-11-13

Applicant: IBM

Inventor： BRUNSCH ARWED ,  RUH WOLF-DIETER ,  SCHNEIDER JOCHEN ,  TRIPPEL GERHARD

IPC: G01R33/18

Abstract: METHOD OF DIRECTLY DETERMINING THE MAGNETOSTRICTION CONSTANT AND DEVICE FOR CARRYING OUT SAID METHOD The invention provides method and apparatus for determining and measuring the magnetostriction constant of magnetic thin film materials in which said material is applied on a substrate and the thus formed sample clamped at one end being deflected under the influence of a magnetic field through utilizing the respective magnetostriction effect, and the magnetostriction constant being measured via the deflection representing a measure for the magnetostriction constant characterized in that the sample is subjected to a magnetic AC field, wherein the magnetic AC field is frequency adjustable, and the magnetic AC field is adjusted with respect to frequency in such a manner that the sample can be set to vibrate in resonance, and whereupon the vibration amplitude (a, ares) of the sample which is a measure for the magnetostriction constant is determined opto-electrically. .