3.
    发明专利
    未知

    公开(公告)号:DE2851771B1

    公开(公告)日:1980-04-17

    申请号:DE2851771

    申请日:1978-11-30

    Abstract: Direct method for measuring the magnetostriction constant lambda s of soft magnetic and isotropic magnetic materials. A thin film sample is cantilevered and clamped at one edge. Under the influence of a magnetic AC field and the magnetostriction effect of the sample material, the free end of the cantilevered sample is deflected and oscillates with twice the frequency of the AC field. The resonance amplitude ares is measured by using a laser beam impinging upon the oscillating sample and measuring the reflected beam amplitude by means of a position-sensitive photodiode. The AC output signal of the photodiode is proportional to the sample amplitude. The magnetostriction constant lambda s is directly proportional to the resonance amplitude ares multiplied by a constant factor which depends on known geometry and properties of the sample material.

    MAGNETIC DISK SUBSTRATE WITH A CORE OF SYNTHETIC MATERIAL

    公开(公告)号:CA1187174A

    公开(公告)日:1985-05-14

    申请号:CA404019

    申请日:1982-05-28

    Applicant: IBM

    Abstract: MAGNETIC DISK SUBSTRATE WITH A CORE OF SYNTHETIC MATERIAL A magnetic disk substrate consists of a core of synthetic material which on both sides is covered with metal foils. The preferably used steel foils have a thickness between 10.mu.m and 300.mu.m, and with their material properties determine the surface micro-hardness as well as the peak to valley height. Onto these surfaces the actual magnetic layer is applied. This magnetic disk substrate is made either through molding under the influence of heat, or through foaming of the space between the two metal foils in a suitable mold.

    METHOD FOR DIRECT DETERMINATION OF MAGNETOSTRICTIVE CONSTANTS AND APPARATUS FOR APPLYING IT

    公开(公告)号:DE2961717D1

    公开(公告)日:1982-02-18

    申请号:DE2961717

    申请日:1979-10-31

    Applicant: IBM

    Abstract: Direct method for measuring the magnetostriction constant lambda s of soft magnetic and isotropic magnetic materials. A thin film sample is cantilevered and clamped at one edge. Under the influence of a magnetic AC field and the magnetostriction effect of the sample material, the free end of the cantilevered sample is deflected and oscillates with twice the frequency of the AC field. The resonance amplitude ares is measured by using a laser beam impinging upon the oscillating sample and measuring the reflected beam amplitude by means of a position-sensitive photodiode. The AC output signal of the photodiode is proportional to the sample amplitude. The magnetostriction constant lambda s is directly proportional to the resonance amplitude ares multiplied by a constant factor which depends on known geometry and properties of the sample material.

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