11.
    发明专利
    未知

    公开(公告)号:DE69908311D1

    公开(公告)日:2003-07-03

    申请号:DE69908311

    申请日:1999-02-18

    Applicant: OSMIC INC

    Abstract: An x-ray reflecting system comprising a plurality of x-ray reflectors, wherein the x-ray reflectors are coupled together to form a Kirkpatrick-Baez side-by-side system of multiple corners and may include multi-layer or graded-d multi-layer Bragg x-ray reflective surfaces.

    13.
    发明专利
    未知

    公开(公告)号:DE69514810T2

    公开(公告)日:2000-07-06

    申请号:DE69514810

    申请日:1995-08-01

    Applicant: OSMIC INC

    Inventor: GUTMAN GEORGE

    Abstract: This invention relates to novel methods of producing flat and curved optical elements with laterally and depth graded multilayer thin films, in particular multilayers of extremely high precision, for use with soft and hard x-rays and neutrons and the optical elements achieved by these methods. In order to improve the performance of an optical element, errors in d spacing and curvature are isolated and subsequently compensated.

    Systém pro usmernování rentgenových paprsku

    公开(公告)号:CZ301383B6

    公开(公告)日:2010-02-10

    申请号:CZ20003041

    申请日:1999-02-18

    Applicant: OSMIC

    Abstract: Systém pro usmernování rentgenových paprsku, který obsahuje množinu Kirkpatrick-Baezových optik (38) typu vedle sebe pro presmerování rentgenových paprsku, charakterizovaný tím, že Kirkpatrick-Baezovy optiky (38) typu vedle sebe jsou vzájemne spojeny k sobe pro vytvorení optiky, mající vícenásobné rohy (36) a v podstate uzavrenou vnitrní plochu, pricemž tato optika obsahuje vstupní oblast (32) a výstupní oblast.

    16.
    发明专利
    未知

    公开(公告)号:DE69908311T2

    公开(公告)日:2003-12-11

    申请号:DE69908311

    申请日:1999-02-18

    Applicant: OSMIC INC

    Abstract: An x-ray reflecting system comprising a plurality of x-ray reflectors, wherein the x-ray reflectors are coupled together to form a Kirkpatrick-Baez side-by-side system of multiple corners and may include multi-layer or graded-d multi-layer Bragg x-ray reflective surfaces.

    17.
    发明专利
    未知

    公开(公告)号:DE69909599D1

    公开(公告)日:2003-08-21

    申请号:DE69909599

    申请日:1999-02-18

    Applicant: OSMIC INC

    Abstract: An x-ray reflecting system comprising a Kirkpatrick-Baez side-by-side optic in a single corner configuration having multi-layer Bragg x-ray reflective surfaces.

    18.
    发明专利
    未知

    公开(公告)号:AT245304T

    公开(公告)日:2003-08-15

    申请号:AT99907116

    申请日:1999-02-18

    Applicant: OSMIC INC

    Abstract: An x-ray reflecting system comprising a Kirkpatrick-Baez side-by-side optic in a single corner configuration having multi-layer Bragg x-ray reflective surfaces.

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