Abstract:
A coated transparent interferometric reference (34) for an optical tester (10). In accordance with one aspect of the present invention, the coated reference surface (34) provides improved tribological and optical properties as would be desirable for a disk (16) in an interferometric flying height tester (10).
Abstract:
A non-contact servo writing system positions a hard disk drive transducer. A light source (72) mounted on a master assembly's master arm (54) reflects light off a reflector (66) mounted on the hard drive arm (58). A sensor (76) mounted on the master arm generates a signal proportional to the amount of reflected light received from the reflector. A servo controller (70) coupled to the sensor controls hard drive arm movement according to the signal generated. In one embodiment, the sensor comprises a circuit having first and second photosensing elements. The circuit generates first and second signals proportional to the reflected light amount received by the first and second photo sensing elements respectively. The sensor also provides a sensor output signal, used by the servo controller to move the hard drive arm, representative of the difference between the first and second signals, and of disk drive arm position with respect to the master arm.
Abstract:
A method and apparatus (60) for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor (62) for detecting defects on the surface of a magnetic disk. The sensor (62) generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor (64) processes the signal before it is received by a peak detecting circuit (68). The peak detecting circuit (68) detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor (70) where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.
Abstract:
Apparatus (10) for testing a plurality of magnetic recording heads (12). The apparatus includes a tool (16) which supports a bar (14) that contains individual magnetic recording heads. Alternatively, the tester may contain a tool which supports a plurality of individual sliders. The tool (16) locates the heads within a magnetic field emanating from a coil (22) wound magnet (20). The magnet has a length and permeability that provides a uniform magnetic field for each slider in the bar. The apparatus (10) includes a probe card (32) that has a plurality of probe needles (34) which make simultaneous contact with bonding pads (36) of each head (12). The needles (34) are coupled to a test circuit that applies constant current to the magnetic recording heads and measures a voltage change as a function of a varying magnetic field. The tester can sequentially test the heads without spatially moving the bar, thereby minimizing test cycle time may test two or more of the heads simultaneously.
Abstract:
A Head Gimbal Assembly (HGA) loader using sub-ambient air pressure to move a magnetic head of the HGA over a test surface. Clamp (10) mounts HGA (12) adajcent to nozzle (24). Nozzle (24) draws in air (30) through orifice (50) creating a sub-ambient pressure region below suspension beam (18), causing ambient air to flow into the created sub-ambient void. Air flow (30) moves suspension beam (18) away from the surface of disk (22) unloading HGA (12). The sub-ambient pressure level and the separation between head (14) and disk (22) is varied by a computer controlled regulator valve (32). The loader can be used in a flying height tester calibrated by taking optical data while varying flying height by changing sub-ambient pressure. The sub-ambient pressure created by orifice (50) causes HGA (12) to bend about its natural pivot point or the bend radius of the suspension or load beam (18), which does not create additional slider angles during testing, nor introduce any mechanical sliding motion which could generate debris.
Abstract:
An apparatus and method for measuring the space (36) between a transparent member (12) such as a disk, and a reflective member (14) such as a slider, by detecting a change of polarization of a reflected light beam. The apparatus (10) includes a light source (20) that emits a light beam which is circularly polarized, directed onto the disk (12) and reflected off of the interface between the disk (12) and the slider (14). The reflected light beam is split into four separately polarized beams by a beam splitter/polarizer assembly (42, 50, 52) and the varying intensities measured by photodetectors (70, 72). Stokes parameters are computed from signals from the photodetectors (70, 72). Ellipsometric parameters delta and psi are computed from the Stokes parameters. The thickness of the space (36) and the complex index of refraction (n and k) of the slider (14) are computed from the delta and psi parameters.
Abstract:
A tester for measuring the resistance of magnetoresistive heads as a function of the magnetic field applied to the heads is disclosed. The tester applies a time varying magnetic field to the magnetoresistive head to be tested and filters the resulting time varying (AC) voltage signal indicative of the resistance of the head with a capacitor to remove the DC component of the signal. The AC component of the signal is then amplified, digitized, and analyzed to obtain the resistance properties of the magnetoresistive head.
Abstract:
The apparatus and method for measuring a small spacing down to contact uses an interferometric fringe intensity calibration to calibrate maximum and minimum intensity of two or more monochromatic or quasi-monochromatic interference patterns caused by a spacing between two articles (10, 12), one of which is transparent (10). The intensity calibration is done by measuring maximum and minimum fringe intensity of each color (2) while altering the spacing (51) by at least 1/4 of the wavelength of the light or other electromagnetic radiation being used. The calibration by changing spacing allows the fringe order to be calculated (26) for each wavelength of the radiation being used. This calibration procedure allows the maximum and minimum intensity of the radiation to be known, as well as the fringe order of the interference patterns to be calculated. With the maximum and minimum intensities and the fringe orders known, the spacing is readily calculated from interferometric theory.