公开(公告)号：DE602005016704D1

公开(公告)日：2009-10-29

申请号：DE602005016704

申请日：2005-09-30

Applicant: PICOMETRIX LLC

Inventor： WILLIAMSON STEVEN ,  CHERNOVSKY ARTUR A ,  WOLTER KLAUS H ,  ZIMDARS DAVID

IPC: G01J9/02 ,  G02B26/12

Abstract: A system for varying a delay of an optical beam has a rotatable wheel and a set of one or more prisms mounted about a circumference of the rotatable wheel. The set of one or more prisms are positioned to retroreflect the optical beam that passes approximately tangent to the rotatable wheel to cause a delay or phase shift to the beam as the rotatable wheel rotates.

公开(公告)号：AT431568T

公开(公告)日：2009-05-15

申请号：AT02789655

申请日：2002-11-15

Applicant: PICOMETRIX LLC

Inventor： WILLIAMSON STEVEN

IPC: G02B6/02 ,  G02B6/32 ,  G02B6/26 ,  G02B6/42

Abstract: The present invention is a fiber optic waveguide adapted for focusing a beam of light at an obtuse angle to the optical axis. A focusing end of the fiber optic is polished at an angle such that the surface normal does not coincide with the optical axis, which is defined by the path of the beam of light through the fiber optic waveguide. The angle theta is necessarily greater than 0 degrees and less than 90 degrees. The present invention further includes a focusing lens coupled to the outside of the fiber optic waveguide at its focusing end. The focusing lens may be a ball lens, and it is attached to the exterior of the cladding layer by an adhesive material.

公开(公告)号：CA2654205A1

公开(公告)日：2007-12-13

申请号：CA2654205

申请日：2007-06-01

Applicant: PICOMETRIX LLC

Inventor： SUCHA GREGG ,  ZIMDARS DAVID ,  WILLIAMSON STEVEN ,  FICHTER GREG

IPC: H04B10/00

Abstract: A system for dispersion compensation in a terahertz system includes an op tical fiber configured to transmit an optical pulse, a compensator optically coupled to the optical fiber, the compensator configured to compensate for a dispersion of the optical pulse caused as the optical pulse propagates thr ough the optical fiber, and an optically induced terahertz device optically coupled to the compensator, whereby the optically induced terahertz device i s configured to transmit or receive terahertz radiation.

公开(公告)号：CA2933870C

公开(公告)日：2021-11-23

申请号：CA2933870

申请日：2014-12-17

Applicant: PICOMETRIX LLC

Inventor： STRONG TIMOTHY ,  STUK GREGORY ,  WILLIAMSON STEVEN

IPC: G01N21/23

Abstract: A system for transmitting and receiving electromagnetic radiation includes a beam splitter and a transceiver. The beam splitter is configured to separate an optical pulse into a pump pulse and a probe pulse. The transceiver may include a transmitter switch and a receiver switch. The pump pulse is directed toward the transmitter switch and the probe pulse is directed towards the receiver switch. Electromagnetic radiation is emitted from the transceiver when the pump pulse strikes the transmitter switch. The electromagnetic radiation may be terahertz radiation in either a pulsed or continuous wave form.

公开(公告)号：CA2930466A1

公开(公告)日：2015-05-21

申请号：CA2930466

申请日：2014-11-14

Applicant: PICOMETRIX LLC

Inventor： ZIMDARS DAVID ,  WHITE JEFFREY S ,  WILLIAMSON STEVEN ,  DULING IRL

IPC: G01J11/00 ,  G01J3/42 ,  G01N9/24 ,  G01N21/41

Abstract: A system for determining at least one property of a sheet dielectric sample using terahertz radiation includes at least one terahertz transmitter configured to output a pulse of terahertz radiation, a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation, wherein the terahertz receiver is configured to output a measured waveform based on the terahertz radiation received by the terahertz receiver, and a control unit in communication with the terahertz receiver. Wherein the control unit is configured to choose at least one region of interest of the measured waveform, compare the at least one region of interest of the measured waveform to a model waveform, vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform.

公开(公告)号：CA2582337C

公开(公告)日：2015-03-31

申请号：CA2582337

申请日：2005-09-30

Applicant: PICOMETRIX LLC

Inventor： WILLIAMSON STEVEN ,  CHERNOVSKY ARTUR A ,  WOLTER KLAUS H ,  ZIMDARS DAVID

IPC: G01J9/02 ,  G02B26/12

Abstract: An optical delay line device includes a rotatable wheel and one or more prisms mounted about the circumference of the wheel. The one are more prisms are positioned to retroreflect the optical beam that passes approximately tangent to the wheel to cause a delay or phase shift to the beam as the wheel rotates.

公开(公告)号：HK1113604A1

公开(公告)日：2008-10-10

申请号：HK08103659

申请日：2008-04-02

Applicant: PICOMETRIX LLC

Inventor： WILLIAMSON STEVEN ,  CHERNOVSKY ARTUR A ,  WOLTER KLAUS H ,  ZIMDARS DAVID

IPC: G01J20060101 ,  G02B20060101

公开(公告)号：CA2582337A1

公开(公告)日：2006-04-13

申请号：CA2582337

申请日：2005-09-30

Applicant: PICOMETRIX LLC

Inventor： ZIMDARS DAVID ,  WOLTER KLAUS H ,  WILLIAMSON STEVEN ,  CHERNOVSKY ARTUR A

IPC: G01J9/02 ,  G02B26/12

Abstract: A system for varying a delay of an optical beam has a rotatable wheel and a set of one or more prisms mounted about a circumference of the rotatable wheel. The set of one or more prisms are positioned to retroreflect the optical beam that passes approximately tangent to the rotatable wheel to cause a delay or phase shift to the beam as the rotatable wheel rotates.

公开(公告)号：CA2930466C

公开(公告)日：2022-04-05

申请号：CA2930466

申请日：2014-11-14

Applicant: PICOMETRIX LLC

Inventor： ZIMDARS DAVID ,  WHITE JEFFREY S ,  WILLIAMSON STEVEN ,  DULING IRL

IPC: G01J11/00 ,  G01J3/42 ,  G01N9/24 ,  G01N21/41

Abstract: A system for determining at least one property of a sheet dielectric sample using terahertz radiation includes at least one terahertz transmitter configured to output a pulse of terahertz radiation, a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation, wherein the terahertz receiver is configured to output a measured waveform based on the terahertz radiation received by the terahertz receiver, and a control unit in communication with the terahertz receiver. Wherein the control unit is configured to choose at least one region of interest of the measured waveform, compare the at least one region of interest of the measured waveform to a model waveform, vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform.

公开(公告)号：AT496398T

公开(公告)日：2011-02-15

申请号：AT05853521

申请日：2005-12-07

Applicant: PICOMETRIX LLC

Inventor： SACKS ROBERT ,  JAZWIECKI MATHEW ,  WILLIAMSON STEVEN

IPC: H01L31/09

Abstract: A semiconductor structure includes a GaAs or InP substrate, an InxGa1-xAs epitaxial layer grown on the substrate, where x is greater than about 0.01 and less than about 0.53, and a wider bandgap epitaxial layer grown as a cap layer on top of the InxGa1-xAs epitaxial layer.