Abstract:
A system and method reduce stress caused by NBTI effects by determining if a trigger event has occurred and if so inverting all input data values to the memory and all output data values from the memory during a period of time defined by the determined trigger event. In one embodiment, the trigger event is an alternate memory power-up.
Abstract:
A pseudo-dual port memory address multiplexing system includes a control circuit (103) operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit (105) monitors a read operation and generates a switching signal (WCLK) when the read operation is determined to be complete. A multiplexer (104) is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time.
Abstract:
Systems and methods of selectively applying negative voltage to word lines during memory device read operation are disclosed. In an embodiment, a memory device (100) includes a word line logic circuit (110) coupled to a plurality of word lines (108) and adapted to selectively apply a positive voltage (V) to a selected word line coupled to a selected memory cell that includes a magnetic tunnel junction (MTJ) device and to apply a negative voltage (NV) to unselected word lines.
Abstract:
A circuit device includes a first input to receive a reset control signal and a second input coupled to an output of a latch. The circuit device also includes a logic circuit adapted to conditionally reset the latch based on a state of the output in response to receiving the reset control signal
Abstract:
A low-power clock generation circuit has a phase generator that receives an input clock signal and uses the input clock signal to generate multiple intermediate clock signals with different phase shifts, a phase rotator circuit that outputs phase-adjusted clock signals, a frequency doubler circuit that receives a plurality of the phase-adjusted clock signals and outputs two frequency-doubled clock signals having a 180° phase difference, and a quadrature clock generation circuit that receives the two frequency-doubled clock signals and provides four output signals that include in-phase and quadrature versions of the two frequency-doubled clock signals.
Abstract:
A method includes tracking a tuning voltage at a first circuit coupled to a first drain node of a first supply of a charge pump. The method also includes tracking the tuning voltage at a second circuit coupled to a second drain node of a second supply of the charge pump. The method further includes stabilizing a first voltage of the first drain node and a second voltage of the second drain node responsive to the tuning voltage.
Abstract:
Circuits, apparatuses, and methods of interposing a selectable delay in reading a magnetic random access memory (MRAM) device are disclosed. A circuit includes a sense amplifier (160), having a first input (162), a second input (164), and an enable input (166); a first amplifier (132) coupled to an output of a magnetic resistance-based memory cell (112); a second amplifier (134) coupled to a reference output of the cell; and a digitally-controllable amplifier (136) coupled to a tracking circuit cell (116) that is similar to the cell of the MRAM. The first input of the sense amplifier is coupled to the first amplifier, the second input of the sense amplifier is coupled to the second amplifier, and the enable input is coupled to the third digitally-controllable amplifier via a logic circuit (150). The sense amplifier may generate an output value based on the amplified values received from the output of the magnetic resistance-based memory cell and the reference cell once the sense amplifier receives an enable signal (152) from the digitally-controllable amplifier via the logic circuit.
Abstract:
In a particular embodiment, a memory device (100) is disclosed that includes a memory cell (226) including a resistance based memory element (228) coupled to an access transistor (230). The access transistor has a first oxide thickness to enable operation of the memory cell at an operating voltage. The memory device also includes a first amplifier (202) configured to couple the memory cell to a supply voltage (Vamp) that is greater than a voltage limit to generate a data signal based on a current through the memory cell. The first amplifier includes a clamp transistor (216) that has a second oxide thickness that is greater than the first oxide thickness. The clamp transistor is configured to prevent the operating voltage at the memory cell from exceeding the voltage limit.