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    Semiconductor laser mounting with intact diffusion barrier layer
    11.
    发明专利
    Semiconductor laser mounting with intact diffusion barrier layer 未知

    公开(公告)号：AU2012296657A1

    公开(公告)日：2014-02-27

    申请号：AU2012296657

    申请日：2012-08-14

    Applicant: SPECTRASENSORS INC

    Inventor： SCHREMPEL MATHIAS ,  FEITISCH ALFRED ,  NEUBAUER GABI

    IPC: H01S5/022 ,  H01L23/485 ,  H01S5/042

    Abstract: A first contact (310) surface of a semiconductor laser chip (302) is formed to a surface roughness selected to have a maximum peak to valley height that is substantially smaller than a diffusion barrier layer thickness. A diffusion barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness is applied to the first contact surface, and the semiconductor laser chip is soldered to a carrier mounting (304) along the first contact surface using a solder composition (306) by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Thereby the diffusion barrier remains contiguous. The non-metallic, electrically conducting compound may comprise at least one of titanium nitride, titanium oxy-nitride, tungsten nitride, cerium oxide and cerium gadolinium oxy-nitride

    Spectrometer with validation cell
    13.
    发明专利
    Spectrometer with validation cell 未知

    公开(公告)号：AU2011318585A1

    公开(公告)日：2013-05-09

    申请号：AU2011318585

    申请日：2011-02-15

    Applicant: SPECTRASENSORS INC

    Inventor： FEITISCH ALFRED ,  KELLER LUTZ ,  LIU XIANG ,  SCHREMPEL MATHIAS ,  HELBLEY KEITH BENJAMIN

    IPC: G01N21/35 ,  G01N21/61

    Abstract: A valid state of an analytical system that includes a light source (102) and a detector (106) can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell (114) and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas in a measurement cell (112) can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.

    SPECTROMETER WITH VALIDATION CELL
    14.
    发明专利
    SPECTROMETER WITH VALIDATION CELL 未知

    公开(公告)号：CA2815323A1

    公开(公告)日：2012-04-26

    申请号：CA2815323

    申请日：2011-02-15

    Applicant: SPECTRASENSORS INC

    Inventor： FEITISCH ALFRED ,  KELLER LUTZ ,  LIU XIANG ,  SCHREMPEL MATHIAS ,  HELBLEY KEITH BENJAMIN

    IPC: G01N21/35 ,  G01N21/61

    Abstract: A valid state of an analytical system that includes a light source (102) and a detector (106) can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell (114) and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas in a measurement cell (112) can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.

    ANALYTICAL EQUIPMENT ENCLOSURE INCORPORATION PHASE CHANGING MATERIALS
    15.
    发明专利
    ANALYTICAL EQUIPMENT ENCLOSURE INCORPORATION PHASE CHANGING MATERIALS 未知

    公开(公告)号：CA2750180A1

    公开(公告)日：2010-07-08

    申请号：CA2750180

    申请日：2009-12-24

    Applicant: SPECTRASENSORS INC

    Inventor： HU XUEJIAO ,  FEITISCH ALFRED

    IPC: G01N21/39 ,  G01N21/53

    Abstract: Thermally controlled enclosures that can be used with gas analyzers are described. The enclosures incorporate one or more phase changing materials that buffer ambient and internal heat loads to reduce the power consumption demand of mechanical or electronic heating apparatus. Maintenance of gas analyzer equipment at a consistent temperature can be important to achieving stable and reproducible results. Related systems, apparatus, methods, and/or articles are also described.

    PRESSURE-INVARIANT TRACE GAS DETECTION
    16.
    发明专利
    PRESSURE-INVARIANT TRACE GAS DETECTION 未知

    公开(公告)号：CA2680798A1

    公开(公告)日：2008-09-18

    申请号：CA2680798

    申请日：2008-03-14

    Applicant: SPECTRASENSORS INC

    Inventor： SANGER GREGORY M ,  ZHOU XIN ,  XIANG LIU ,  FEITISCH ALFRED

    IPC: G01N21/39 ,  G01J3/433 ,  G01N21/35

    Abstract: An apparatus for detecting a concentration of a trace target gas in a sam ple gas comprises a light source (110), for example a tunable diode laser, f or emitting light at a wavelength corresponding to an absorption line of the target gas and means (105) operatively connected to said light source for m odulating the wavelength of the emitted light, a detector (125) positioned t o detect the intensity of light emitted from the light source that has passe d through the sample gas at a multiple of the modulation frequency of the li ght source, for example second harmonic detection, a pressure sensor (120) f or detecting the pressure of the sample gas, and a control unit (135) couple d to the detector, the pressure sensor, and the light source, said control u nit being arranged to adjust the modulation amplitude' of the light source b ased on the detected pressure.

    OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS
    17.
    发明专利
    OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS 未知

    公开(公告)号：CA2893089C

    公开(公告)日：2017-09-12

    申请号：CA2893089

    申请日：2013-12-12

    Applicant: SPECTRASENSORS INC

    Inventor： KELLER LUTZ ,  FEITISCH ALFRED ,  SCOTT PETER ,  SCHREMPEL MATHIAS ,  ST JOHN NATHAN

    IPC: G01N21/03 ,  G01N21/09

    Abstract: A spectrometer cell can include a spacer, at least one end cap, and at least one mirror with a reflective surface. The end cap can be positioned proximate to a first contact end of the spacer such that the end cap and spacer at least partially enclose an internal volume of the spectrometer cell. The mirror can be secured in place by a mechanical attachment that may include attachment materials that are chemically inert to at least one reactive gas compound, be thermally stable above at least 120 °C, and be capable of holding an optical axis of the reflective surface in a fixed orientation relative to other components of the spectrometer cell and or a spectrometer device that comprises the spectrometer cell. The mirror can optionally be constructed of a material such as stainless steel, copper, aluminum, alumino-silicate, ceramic, or the like. Related methods, articles of manufacture, systems, etc. are described.

    SPECTROMETER WITH VALIDATION CELL
    18.
    发明专利
    SPECTROMETER WITH VALIDATION CELL 未知

    公开(公告)号：CA2815323C

    公开(公告)日：2017-06-13

    申请号：CA2815323

    申请日：2011-02-15

    Applicant: SPECTRASENSORS INC

    Inventor： FEITISCH ALFRED ,  KELLER LUTZ ,  LIU XIANG ,  SCHREMPEL MATHIAS ,  HELBLEY KEITH BENJAMIN

    IPC: G01J3/02

    Abstract: A valid state of an analytical system that includes a light source (102) and a detector (106) can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell (114) and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas in a measurement cell (112) can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.

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