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公开(公告)号:FR2896057A1
公开(公告)日:2007-07-13
申请号:FR0600251
申请日:2006-01-12
Applicant: ST MICROELECTRONICS SA , AXALTO SA
Inventor: POMET ALAIN , DUVAL BENJAMIN , LEYDIER ROBERT
Abstract: L'invention concerne un procédé de génération d'un nombre aléatoire, comprenant des étapes de réception d'un signal binaire (RxD) de transmission de données soumis à une fluctuation de phase, de génération de plusieurs signaux d'oscillateur (P0-P7) sensiblement de même fréquence moyenne et ayant des phases respectives distinctes, de prélèvement d'un état (S0-S7) de chacun des signaux d'oscillateur à l'apparition de fronts du signal binaire (RxD), et d'élaboration d'un nombre aléatoire (RND) à partir des états de chacun des signaux d'oscillateur. Application à un circuit intégré utilisable dans une carte à puce.
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公开(公告)号:FR2844118B1
公开(公告)日:2005-02-18
申请号:FR0210702
申请日:2002-08-29
Applicant: ST MICROELECTRONICS SA
Inventor: DUVAL BENJAMIN , MARINET FABRICE
IPC: H03K17/22
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公开(公告)号:FR2829248B1
公开(公告)日:2004-08-27
申请号:FR0111356
申请日:2001-09-03
Applicant: ST MICROELECTRONICS SA
Inventor: DUVAL BENJAMIN
Abstract: A current generator for the production of a reference current includes a first P type transistor, a source of which is connected to a first pole of a resistor and a gate of which is connected to a second pole of the resistor. The reference current flows in the resistor with a value that is a function of a threshold voltage of the first transistor. The current generator further includes a second N type transistor whose drain, gate and source are connected respectively to the second pole of the resistor, the first pole of the resistor and the drain of the first resistor. The second transistor is configured to operate in saturation mode.
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公开(公告)号:FR2834064A1
公开(公告)日:2003-06-27
申请号:FR0116765
申请日:2001-12-21
Applicant: ST MICROELECTRONICS SA
Inventor: MARINET FABRICE , DUVAL BENJAMIN
Abstract: Integrated circuit temperature sensor (21) delivers output signals (S1, S2) from means (MC1, CP1; MC1, CP2) for detection of the exceeding of two temperature thresholds. Additional means (MC1, MX1, CP1; MC1, MX2, CP2) are provided for detecting a third and fourth temperature threshold linked to the first and second temperature thresholds respectively such that a deviation in the first or second threshold detection causes a change in the third or fourth. The invention also relates to a corresponding method.
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