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公开(公告)号:US08941247B1
公开(公告)日:2015-01-27
申请号:US14191978
申请日:2014-02-27
Applicant: SiTime Corporation
Inventor: Pavan Gupta , Aaron Partridge , Markus Lutz
CPC classification number: B81B7/0083 , B81B7/007 , B81B7/0077 , B81B2201/0271 , B81B2207/07 , B81B2207/094 , B81C1/0023 , B81C1/00301 , B81C1/00333 , B81C1/00341 , B81C2201/016 , B81C2203/0118 , B81C2203/0154 , H01L23/3107 , H01L23/34 , H01L23/498 , H01L2224/48091 , H01L2224/48245 , H01L2224/48247 , H01L2224/73265 , H01L2924/01019 , H01L2924/10253 , H01L2924/1461 , H01L2924/181 , H01L2924/00 , H01L2924/00014 , H01L2924/00012
Abstract: In a packaging structure for a microelectromechanical-system (MEMS) resonator system, a resonator-control chip is mounted on a lead frame having a plurality of electrical leads, including electrically coupling a first contact on a first surface of the resonator-control chip to a mounting surface of a first electrical lead of the plurality of electrical leads through a first electrically conductive bump. A MEMS resonator chip is mounted to the first surface of the resonator-control chip, including electrically coupling a contact on a first surface of the MEMS resonator chip to a second contact on the first surface of the resonator-control chip through a second electrically conductive bump. The MEMS resonator chip, resonator-control chip and mounting surface of the first electrical lead are enclosed within a package enclosure that exposes a contact surface of the first electrical lead at an external surface of the packaging structure.
Abstract translation: 在微机电系统(MEMS)谐振器系统的封装结构中,谐振器控制芯片安装在具有多个电引线的引线框架上,引线框架包括将谐振器控制芯片的第一表面上的第一触点电耦合到 所述多个电引线中的第一电引线的安装表面通过第一导电凸块。 MEMS谐振器芯片安装在谐振器控制芯片的第一表面上,包括将MEMS谐振器芯片的第一表面上的触点与谐振器控制芯片的第一表面上的第二触点电耦合通过第二导电 磕碰。 MEMS谐振器芯片,谐振器控制芯片和第一电引线的安装表面封装在封装外壳内,该封装外壳暴露出封装结构的外表面处的第一电引线的接触表面。
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公开(公告)号:US08916407B1
公开(公告)日:2014-12-23
申请号:US13837407
申请日:2013-03-15
Applicant: SiTime Corporation
Inventor: Charles I Grosjean , Ginel Hill , Paul M. Hagelin , Renata Melamud Berger , Aaron Partridge , Markus Lutz
CPC classification number: H03H9/2457 , B81C1/0069 , H03H3/0072 , H03H3/0076 , H03H9/1057
Abstract: A method of manufacturing a micromachined resonator having a moveable member comprising forming the moveable member from a material having a first concentration of dopants of a first impurity type, depositing a dopant carrier layer on or over at least a portion of the moveable member, wherein the dopant carrier layer includes one or more dopants of the first impurity type, transferring at least a portion of the one or more dopants from the dopant carrier layer to the moveable member, wherein, in response, the concentration of dopants of the first impurity type in the moveable member increases (for example, to greater than 1019 cm−3, and preferably between 1019 cm−3 and 1021 cm−3). The method further includes removing the dopant carrier layer and may include providing an encapsulation structure over the moveable member of the micromachined resonator.
Abstract translation: 一种制造具有可移动构件的微加工谐振器的方法,包括由具有第一杂质类型的第一掺杂浓度的材料形成可移动构件,在该可动构件的至少一部分上或之上沉积掺杂剂载体层,其中, 掺杂剂载体层包括一种或多种第一杂质类型的掺杂剂,将一种或多种掺杂剂的至少一部分从掺杂剂载体层转移到可移动构件,其中,作为响应,第一杂质类型的掺杂剂的浓度 可移动构件增加(例如,大于1019cm-3,优选在1019cm-3和1021cm-3之间)。 该方法还包括去除掺杂剂载体层,并且可以包括在微加工谐振器的可移动构件之上提供封装结构。
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公开(公告)号:US12224709B1
公开(公告)日:2025-02-11
申请号:US18498671
申请日:2023-10-31
Applicant: SiTime Corporation
Inventor: Aaron Partridge , Sassan Tabatabaei , Lijun Chen , Kamran Souri
IPC: H03B5/36 , G01C19/56 , G01C19/5726 , H03F3/04 , H03F3/70
Abstract: An oscillator includes a resonator, sustaining circuit and detector circuit. The sustaining circuit receives a sense signal indicative of mechanically resonant motion of the resonator generates an amplified output signal in response. The detector circuit asserts, at a predetermined phase of the amplified output signal, one or more control signals that enable an offset-reducing operation with respect to the sustaining amplifier circuit.
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公开(公告)号:US11897757B1
公开(公告)日:2024-02-13
申请号:US17384535
申请日:2021-07-23
Applicant: SiTime Corporation
Inventor: Renata M. Berger , Ginel C. Hill , Paul M. Hagelin , Charles I. Grosjean , Aaron Partridge , Joseph C. Doll , Markus Lutz
CPC classification number: B81B3/0024 , H03H9/02448 , H03H9/2405
Abstract: The present inventions, in one aspect, are directed to micromachined resonator comprising: a first resonant structure extending along a first axis, wherein the first axis is different from a crystal axis of silicon, a second resonant structure extending along a second axis, wherein the second axis is different from the first axis and the crystal axis of silicon and wherein the first resonant structure is coupled to the second resonant structure, and wherein the first and second resonant structures are comprised of silicon (for example, substantially monocrystalline) and include an impurity dopant (for example, phosphorus) having a concentrations which is greater than 1019 cm−3, and preferably between 1019 cm−3 and 1021 cm−3.
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公开(公告)号:US20240002218A1
公开(公告)日:2024-01-04
申请号:US18130837
申请日:2023-04-04
Applicant: SiTime Corporation
Inventor: Aaron Partridge , Markus Lutz , Pavan Gupta
IPC: B81C1/00 , H01L23/051 , H10N30/30 , B81B7/00
CPC classification number: B81C1/00277 , B81C1/00301 , H01L23/051 , H10N30/306 , B81B7/007 , B81B7/0058 , B81C1/00269 , B81B7/0035 , H01L2924/0002 , B81B2203/0315 , B81B2203/04 , B81B2207/07 , B81C2201/0171 , B81C2203/031 , B81C2203/036 , B81C2203/037 , B81C2203/038 , B81B2201/0271
Abstract: A semiconductor layer having an opening and a MEMS resonator formed in the opening is disposed between first and second substrates to encapsulate the MEMS resonator. An electrical contact that extends from the opening to an exterior of the MEMS device is formed at least in part within the semiconductor layer and at least in part within the first substrate.
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公开(公告)号:US11807518B1
公开(公告)日:2023-11-07
申请号:US15627049
申请日:2017-06-19
Applicant: SiTime Corporation
Inventor: Renata M. Berger , Ginel C. Hill , Paul M. Hagelin , Charles I. Grosjean , Aaron Partridge , Joseph C. Doll , Markus Lutz
CPC classification number: B81B3/0024 , H03H9/02448 , H03H9/2405
Abstract: The present inventions, in one aspect, are directed to micromachined resonator comprising: a first resonant structure extending along a first axis, wherein the first axis is different from a crystal axis of silicon, a second resonant structure extending along a second axis, wherein the second axis is different from the first axis and the crystal axis of silicon and wherein the first resonant structure is coupled to the second resonant structure, and wherein the first and second resonant structures are comprised of silicon (for example, substantially monocrystalline) and include an impurity dopant (for example, phosphorus) having a concentrations which is greater than 1019 cm-3, and preferably between 1019 cm-3 and 1021 cm-3.
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公开(公告)号:US10800650B1
公开(公告)日:2020-10-13
申请号:US15887145
申请日:2018-02-02
Applicant: SiTime Corporation
Inventor: Charles I. Grosjean , Paul M. Hagelin , Michael Julian Daneman , Ginel C. Hill , Aaron Partridge
Abstract: A MEMS element within a semiconductor device is enclosed within a cavity bounded at least in part by hydrogen-permeable material. A hydrogen barrier is formed within the semiconductor device to block propagation of hydrogen into the cavity via the hydrogen-permeable material.
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公开(公告)号:US10766768B2
公开(公告)日:2020-09-08
申请号:US16565876
申请日:2019-09-10
Applicant: SiTime Corporation
Inventor: Aaron Partridge , Markus Lutz , Pavan Gupta
IPC: H01L21/46 , B81C1/00 , H01L41/113 , H01L23/051 , B81B7/00
Abstract: A semiconductor layer having an opening and a MEMS resonator formed in the opening is disposed between first and second substrates to encapsulate the MEMS resonator. An electrical contact that extends from the opening to an exterior of the MEMS device is formed at least in part within the semiconductor layer and at least in part within the first substrate.
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公开(公告)号:US10450190B2
公开(公告)日:2019-10-22
申请号:US16106649
申请日:2018-08-21
Applicant: SiTime Corporation
Inventor: Aaron Partridge , Markus Lutz , Pavan Gupta
IPC: H01L21/46 , B81C1/00 , H01L41/113 , H01L23/051 , B81B7/00
Abstract: In a MEMS device, an oxide layer is disposed between first and second semiconductor layers and MEMS resonator is formed within a cavity in the first semiconductor layer. A first electrically conductive feature functionally coupled to the MEMS resonator is exposed at a surface of the first semiconductor layer, and an insulating region is exposed at the surface of the first semiconductor layer adjacent the first electrically conductive feature. A semiconductor cover layer is bonded to the surface of the first semiconductor layer to hermetically seal the MEMS resonator within the cavity. A second electrically conductive feature extends through the semiconductor cover layer to contact the first electrically conductive feature, and an isolation trench extends through the semiconductor cover layer to the insulating region to electrically isolate a conductive path formed by the first and second electrically conductive features.
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公开(公告)号:US10287162B2
公开(公告)日:2019-05-14
申请号:US15805031
申请日:2017-11-06
Applicant: SiTime Corporation
Inventor: Pavan Gupta , Aaron Partridge , Markus Lutz
IPC: H01L23/34 , B81B7/00 , B81C1/00 , H01L23/498 , H01L23/31
Abstract: A low-profile packaging structure for a microelectromechanical-system (MEMS) resonator system includes an electrical lead having internal and external electrical contact surfaces at respective first and second heights within a cross-sectional profile of the packaging structure and a die-mounting surface at an intermediate height between the first and second heights. A resonator-control chip is mounted to the die-mounting surface of the electrical lead such that at least a portion of the resonator-control chip is disposed between the first and second heights and wire-bonded to the internal electrical contact surface of the electrical lead. A MEMS resonator chip is mounted to the resonator-control chip in a stacked die configuration and the MEMS resonator chip, resonator-control chip and internal electrical contact and die-mounting surfaces of the electrical lead are enclosed within a package enclosure that exposes the external electrical contact surface of the electrical lead at an external surface of the packaging structure.
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