HIGH RESOLUTION STRUCTURED ILLUMINATION MICROSCOPY
    11.
    发明申请
    HIGH RESOLUTION STRUCTURED ILLUMINATION MICROSCOPY 审中-公开
    高分辨率结构照明显微镜

    公开(公告)号:WO2010088418A1

    公开(公告)日:2010-08-05

    申请号:PCT/US2010/022443

    申请日:2010-01-28

    Inventor: LIU, Zhaowei

    Abstract: Disclosed are systems, apparatus, methods and devices, including a method that includes generating two or more sequential surface plasmon interference patterns, at least one of the two or more sequential surface plasmon interference patterns being different from another of the two or more sequential surface plasmon interference patterns, and capturing respective images of a specimen resulting from the interference patterns. Also disclosed is a method that includes generating two or more sequential optical interference patterns, at least one of the two or more sequential optical interference patterns being different from another of the interference patterns, and removing from each of the generated interference patterns, using a beam stopper, a corresponding zero-order diffraction light component included in the respective generated patterns to obtain resultant corresponding two or more sequential optical interference patterns, directed at a specimen, with missing respective zero-order light components.

    Abstract translation: 公开了一种系统,装置,方法和装置,包括一种方法,包括产生两个或多个顺序表面等离子体激元干涉图案,两个或更多个顺序表面等离子体激元干涉图案中的至少一个不同于两个或多个顺序表面等离子体激元 干涉图案,并捕获由干涉图案产生的样本的各个图像。 还公开了一种方法,其包括生成两个或多个顺序光学干涉图案,所述两个或更多个顺序光学干涉图案中的至少一个与干涉图案中的另一个不同,以及使用光束从每个所生成的干涉图案中移除 阻挡器,包括在各个生成的图案中的对应的零级衍射光分量,以获得指向样本的相应的两个或更多个顺序的光学干涉图案,缺少相应的零级光分量。

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