FIRE HAZARD PREVENTION SYSTEM
    12.
    发明申请
    FIRE HAZARD PREVENTION SYSTEM 审中-公开
    消防危害预防系统

    公开(公告)号:WO2003034011A2

    公开(公告)日:2003-04-24

    申请号:PCT/IL2002/000810

    申请日:2002-10-06

    IPC: G01K

    Abstract: This invention provides a new safety device for monitoring the cooking process of conventional range-top by adding a temperature measurement unit and algorithm to detect abnormal cooking scenarios. The safety device includes an active radiation signal generator, which emits radiation at a known frequency. The system differentiates between the passive signal and reflected signal of the total emitted radiation signal in order to calculate the accurate emissivity value of the target object. The safety device is programmed to identify different heating scenarios by comparing the actual temperature/time curve of target object to temperature/time curves of known cooking scenarios. When a hazardous situation is identified, actions are taken to prevent fire.

    Abstract translation: 本发明提供了一种新的安全装置,用于通过添加温度测量单元和算法来检测异常烹饪场景来监测传统范围顶部的烹饪过程。 安全装置包括以已知频率发射辐射的主动辐射信号发生器。 该系统对被发射的辐射信号的被动信号和反射信号进行区分,以计算目标物体的精确发射率值。 将安全装置编程为通过将目标物体的实际温度/时间曲线与已知烹饪场景的温度/时间曲线进行比较来识别不同的加热场景。 当发现危险情况时,采取行动防止火灾。

    Method And Apparatus For Determining The Emissivity, Area And Temperature Of An Object
    15.
    发明申请
    Method And Apparatus For Determining The Emissivity, Area And Temperature Of An Object 有权
    用于确定物体的发射率,面积和温度的方法和装置

    公开(公告)号:US20100256945A1

    公开(公告)日:2010-10-07

    申请号:US11951698

    申请日:2007-12-06

    Inventor: Ronald N. Murata

    Abstract: Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the object derived from a three or more band infrared measurement sensor. As such, the methods and apparatus may only require a regression analysis of the temperature of the object without any regression analysis of the emissivity and area of the object.

    Abstract translation: 提供方法和装置来确定物体的发射率,温度和面积。 方法和装置被设计成使得物体的发射率和面积可以单独地确定为取决于从三个或更多个带状红外测量传感器导出的物体的温度的函数。 因此,方法和装置可以仅需要物体的温度的回归分析,而不对物体的发射率和面积进行任何回归分析。

    Emissivity distribution measuring method and apparatus
    16.
    发明申请
    Emissivity distribution measuring method and apparatus 审中-公开
    发射率分布测量方法和装置

    公开(公告)号:US20040008753A1

    公开(公告)日:2004-01-15

    申请号:US10613072

    申请日:2003-07-07

    CPC classification number: G01J5/602 G01J5/0003 G01J2005/0074

    Abstract: Method and apparatus for measuring a distribution of emissivity on a surface of an object body, on the basis of a light emitted from the surface of the object body, wherein a temperature of the object body at each picture element of its image is calculated on the basis of a radiant intensity ratio at each pair of corresponding picture elements of a first image and a second image which are obtained with respective two radiations of respective first and second wavelengths selected from the light emitted from the surface of the object body, to measure a distribution of the temperature on the surface of the object body, and an emissivity value at each picture element of the image of the object body is calculated on the basis of the measured distribution of the temperature, and according to a predetermined relationship between the temperature and the emissivity value.

    Abstract translation: 基于从物体的表面发射的光来测量物体表面上的发射率分布的方法和装置,其中在其物体的每个像素处的物体的温度在 在从对象体的表面发射的光中选出的各自的第一和第二波长的相应的两个辐射获得的第一图像和第二图像的每对相应图像元素的辐射强度比的基础,以测量 基于测量的温度分布来计算物体表面上的温度分布和物体的图像的每个像素的发射率值,并且根据温度和 发射率值。

    Non-contact temperature measurement of a film growing on a substrate
    17.
    发明授权
    Non-contact temperature measurement of a film growing on a substrate 失效
    在基板上生长的膜的非接触式温度测量

    公开(公告)号:US5377126A

    公开(公告)日:1994-12-27

    申请号:US759427

    申请日:1991-09-13

    Abstract: Apparatus and method for non-contact temperature measurement of a film growing on a substrate which accounts for the change in emissivity due to the change in film thickness. The system employs an adaptively calibrated pyrometer wherein the substrate emittance is continuously computed so that the temperature measurement is accurate regardless of the emittance variation. The new system is easily constructed by adding data processing system software and hardware to conventional pyrometers.

    Abstract translation: 用于在基板上生长的膜的非接触式温度测量的装置和方法,其考虑了由于膜厚度的变化引起的发射率的变化。 该系统采用自适应校准的高温计,其中连续地计算衬底发射率,使得温度测量是准确的,而与发射率变化无关。 通过将数据处理系统软件和硬件添加到常规高温计中,可以轻松构建新系统。

    Reflectance probe
    18.
    发明授权
    Reflectance probe 失效
    反射探头

    公开(公告)号:US5282017A

    公开(公告)日:1994-01-25

    申请号:US461285

    申请日:1990-01-05

    Abstract: Apparatus for measuring the value of the directional spectral hemispherical reflectance of the surface of a target when not engaging but being spaced from the target employs a hollow elongated member having a longitudinal axis and first and second opposite ends. The area of the first end is relatively large relative to that of the second end. The first end is open. The member has an inner chamber extending between the ends and has an inner surface adapted to reflect light falling within a specified wave band. The member when the apparatus is in use is positioned with the first end adjacent but spaced from a selected portion of the surface of the target. The longitudinal axis is oriented essentially normal to a region on the selected surface which would be engaged by a line coincident with the axis and sufficiently extended outwardly from the first end. A beam of light falling within said band is directed within at least a portion of the chamber along the axis and outward through the first end to impinge upon the selected surface portion. A portion of the beam is reflected after said impingement backward through the first end into the chamber. The reflected light which strikes the inner surface of the chamber is directed backwardly within the chamber toward the second end. An electrical signal derived from at least a portion of the backwardly directed light provides a measurement of said reflectance value.

    Abstract translation: 用于测量目标表面的方向光谱半球反射值在不接合但与目标间隔时的值的装置采用具有纵向轴线的中空细长构件以及第一和第二相对端。 第一端的面积相对于第二端的面积相对较大。 第一端是开放的 该构件具有在端部之间延伸的内室,并且具有适于反射落入指定波段内的光的内表面。 当设备使用时的构件定位成第一端与目标的表面的选定部分相邻但间隔开。 纵向轴线基本上垂直于所选择的表面上的区域,该区域将被与轴线重合并且从第一端向外充分延伸的线路接合。 落在所述带内的光束沿着轴线被引导到腔室的至少一部分内并且穿过第一端向外引导到所选择的表面部分上。 所述梁的一部分在所述冲击之后通过所述第一端向后反射进入所述室。 撞击室的内表面的反射光在腔室内向后指向第二端。 从后向光的至少一部分导出的电信号提供所述反射率值的测量值。

    Laser radiometer
    19.
    发明授权
    Laser radiometer 失效
    激光辐射计

    公开(公告)号:US4417822A

    公开(公告)日:1983-11-29

    申请号:US319244

    申请日:1981-11-09

    Abstract: The present invention teaches a unique laser radiometer capable of accurately measuring the radiation temperature of a radiant surface and independently measuring the surface's emissivity. A narrow-band radiometer is combined with a laser reflectometer to measure concurrently radiance and emissivity of a remote, hot surface. Together, radiance and emissivity yield the true surface temperature of the remote target. A narrow receiver bandwidth is attained by one of two methods; (a) heterodyne detection or (b) optical filtering. A direct measurement of emissivity is used to adjust the value obtained for the thermal radiation signal to substantially enhance the accuracy of the temperature measurement for a given subject surface. The technique provides substantially high detection sensitivity over a very narrow spectral bandwidth.

    Abstract translation: 本发明教导了一种独特的激光辐射计,能够精确地测量辐射表面的辐射温度并独立地测量表面的发射率。 窄带辐射计与激光反射计相结合,以测量远程热表面的辐射和发射率。 一起,辐射和发射率产生远程目标的真实表面温度。 通过两种方法之一获得窄的接收机带宽; (a)外差检测或(b)光学滤波。 使用辐射率的直接测量来调整对于热辐射信号获得的值,以显着提高给定对象表面的温度测量的精度。 该技术在非常窄的光谱带宽上提供了显着高的检测灵敏度。

    Temperature measurment device
    20.
    发明公开
    Temperature measurment device 审中-公开
    Temperaturmessvorrichtung

    公开(公告)号:EP2762846A2

    公开(公告)日:2014-08-06

    申请号:EP14153517.9

    申请日:2014-01-31

    Abstract: In an embodiment, a temperature measurement device is provided with: light collection means; extraction means; optical intensity calculation means; and temperature measurement means. The light collection means collects the emission spectrum of a measurement subject. The extraction means extracts beams having the wavelength of the atomic spectral lines and a beam having a wavelength in a wavelength region where there are no atomic spectral lines, from the emission spectrum collected by the aforementioned light collection means. The optical intensity calculation means calculates the optical intensities of the beams extracted by the aforementioned extraction means. The temperature measurement means calculates the temperature of the aforementioned measurement subject, based on the intensities of the beams calculated by the aforementioned optical intensity calculation means.

    Abstract translation: 在一个实施例中,温度测量装置具有:光收集装置; 提取手段; 光强计算手段; 和温度测量装置。 光采集装置收集测量对象的发射光谱。 提取装置从由上述光收集装置收集的发射光谱中提取具有原子谱线波长的波束和不存在原子谱线的波长区域中的波长的波束。 光强度计算装置计算由上述提取装置提取的光束的光强度。 温度测量装置基于由上述光强度计算装置计算的光束的强度来计算上述测量对象的温度。

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