温度测量装置和温度测量方法

    公开(公告)号:CN102692282B

    公开(公告)日:2014-08-06

    申请号:CN201210080758.1

    申请日:2012-03-23

    Abstract: 本发明提供温度测量装置和温度测量方法。能够同时测量多个处理腔室内的温度测量对象物的温度。该温度测量装置包括:第1光分离部件,其用于将来自光源的光分成多个测量用的光;多个第2光分离部件,其用于将多个测量用的光分别分成测量光和参照光;第3光分离部件,其用于将测量光分成n个测量光即第1测量光~第n测量光;参照光反射部件,其用于将多个参照光分别反射;一个光路长度变化部件,其用于使从参照光反射部件反射的参照光的光路长度变化;多个光检测器,其用于对从温度测量对象物反射的第1测量光~第n测量光与从参照光反射部件反射的多个参照光之间的干涉进行测量。

    温度测量装置和温度测量方法

    公开(公告)号:CN102692282A

    公开(公告)日:2012-09-26

    申请号:CN201210080758.1

    申请日:2012-03-23

    Abstract: 本发明提供温度测量装置和温度测量方法。能够同时测量多个处理腔室内的温度测量对象物的温度。该温度测量装置包括:第1光分离部件,其用于将来自光源的光分成多个测量用的光;多个第2光分离部件,其用于将多个测量用的光分别分成测量光和参照光;第3光分离部件,其用于将测量光分成n个测量光即第1测量光~第n测量光;参照光反射部件,其用于将多个参照光分别反射;一个光路长度变化部件,其用于使从参照光反射部件反射的参照光的光路长度变化;多个光检测器,其用于对从温度测量对象物反射的第1测量光~第n测量光与从参照光反射部件反射的多个参照光之间的干涉进行测量。

    Sensor And Method Utilizing Multiple Optical Interferometers
    4.
    发明申请
    Sensor And Method Utilizing Multiple Optical Interferometers 有权
    传感器和利用多光学干涉仪的方法

    公开(公告)号:US20090174885A1

    公开(公告)日:2009-07-09

    申请号:US12348262

    申请日:2009-01-02

    Applicant: Chian Chiu Li

    Inventor: Chian Chiu Li

    Abstract: Disclosed is a low-cost high-resolution compact accelerometer which utilizes multiple self-mixing optical interferometers. The device is also a micro-opto-electro-mechanical systems (MOEMS) sensor. The interferometers are used to detect acceleration as well as monitor the wavelength, temperature, and refractive index and perform differential measurements. In addition, photodetectors are employed to monitor the input optical power.

    Abstract translation: 公开了一种低成本的高分辨率紧凑型加速度计,其使用多个自混合光学干涉仪。 该器件还是微光电机械系统(MOEMS)传感器。 干涉仪用于检测加速度以及监测波长,温度和折射率,并进行差分测量。 此外,光电探测器用于监视输入光功率。

    THERMO-OPTIC SYSTEM EMPLOYING SELF REFERENCE
    5.
    发明公开
    THERMO-OPTIC SYSTEM EMPLOYING SELF REFERENCE 审中-公开
    与自我参照THERMO光学系统

    公开(公告)号:EP1992158A1

    公开(公告)日:2008-11-19

    申请号:EP07751106.1

    申请日:2007-02-21

    Abstract: A thermo-optic system, which may be used for example in thermal imaging, includes an array of optical elements each having a thermally responsive optical property, the optical elements including signal elements and reference elements configured to provide (1) a common-mode response of the optical property to ambient temperature and (2) a differential-mode response of the optical property to a thermal signal appearing across the array of optical elements. The system also includes an optical readout subsystem configured to (1) illuminate the array of optical elements with optical energy at a readout wavelength corresponding to the optical property so as to generate a composite optical signal having common-mode and differential-mode signal components corresponding to the common-mode and differential-mode responses respectively of the signal and reference elements, and (2) filter the composite optical signal to generate a filtered optical signal being substantially the differential-mode image component.

    Thermal imaging detector array with optial readout
    6.
    发明公开
    Thermal imaging detector array with optial readout 审中-公开
    具有对准读数的热成像探测器阵列

    公开(公告)号:EP1953510A2

    公开(公告)日:2008-08-06

    申请号:EP08103926.5

    申请日:2006-08-22

    CPC classification number: G01J5/58 G01J5/38 G01J5/40 G01J2005/583

    Abstract: The present invention relates to thermal detectors and the application of such to devices and methods of detecting the infrared images using thermal detectors. For example, by using optical measuring systems in combination with at least one light source to measure changes position of a movable anchored surface coupled to an absorption surface such that the movable anchored surface changes position due to absorption of infrared radiation by the absorption surface. In another example, by combining a detector pixel (infrared radiation sensitive) with an optical measuring device such as an interferometer.

    Abstract translation: 本发明涉及热探测器及其应用于使用热探测器探测红外图像的设备和方法。 例如,通过结合至少一个光源使用光学测量系统来测量耦合到吸收表面的可移动锚定表面的改变位置,使得可移动锚定表面由于吸收表面吸收红外辐射而改变位置。 在另一个例子中,通过将检测器像素(对红外辐射敏感)与诸如干涉仪的光学测量装置组合。

    Temperature control system
    7.
    发明专利
    Temperature control system 有权
    温度控制系统

    公开(公告)号:JP2012069809A

    公开(公告)日:2012-04-05

    申请号:JP2010214347

    申请日:2010-09-24

    CPC classification number: H01L21/67248 G01J9/02 G01J2005/583

    Abstract: PROBLEM TO BE SOLVED: To provide a temperature control system capable of controlling the temperature of an object to be processed with higher accuracy than prior art.SOLUTION: The temperature control system comprises: a susceptor having a top face on which an object to be processed can be mounted and a passage for a temperature control medium formed inside; temperature measurement means for measuring the temperature of the object to be processed mounted on the top face of the susceptor; first temperature control means for controlling the temperature of the temperature control medium flowing through the passage; and second temperature control means interposed between the susceptor and the first temperature control means and controlling the temperature of the temperature control medium based on the measurement results from the temperature measurement means.

    Abstract translation: 要解决的问题:提供一种能够以比现有技术更高的精度控制待处理物体的温度的温度控制系统。 解决方案:温度控制系统包括:基座,其具有可以安装待加工物体的顶面和用于形成在内部的温度控制介质的通道; 温度测量装置,用于测量安装在基座的顶面上的被加工物体的温度; 用于控制流经通道的温度控制介质的温度的第一温度控制装置; 以及插入在基座和第一温度控制装置之间的第二温度控制装置,并且基于来自温度测量装置的测量结果来控制温度控制介质的温度。 版权所有(C)2012,JPO&INPIT

    VERFAHREN UND VORRICHTUNG ZUR KONTAKLOSEN TEMPERATURÜBERWACHUNG UND TEMPERATURREGELUNG
    8.
    发明申请
    VERFAHREN UND VORRICHTUNG ZUR KONTAKLOSEN TEMPERATURÜBERWACHUNG UND TEMPERATURREGELUNG 审中-公开
    方法和装置用于非接触式温度监测和温度控制

    公开(公告)号:WO2004065923A1

    公开(公告)日:2004-08-05

    申请号:PCT/DE2004/000018

    申请日:2004-01-11

    Inventor: SCHUELE, Georg

    Abstract: Verfahren zur Temperaturbestimmung einer Probe (21), mit den Schritten Richten eines Sondierlichtstrahls (12, 22, 32) auf die Probe, wobei wenigstens zwei Teilstrahlen des Sondielichtstrahls unterschiedlich lange Wegstrecken in der Probe durchlaufen, indem sie aus wenigstens zwei unterschiedlichen Tiefen in der Probe reflektiert oder rückgestreut werden, Zurückführen der reflektierten oder rückgestreuten Teilstrahlen in eine Analyseeinheit, Erzeugen eines Interferenzmusters in einer Analyseeinheit mittels einer interferometrischen Vorrichtung, welche einen Strahl als Referenzlichtstrahl nutzt, und Auswerten des erzeugten Interferenzmusters in einer Auswerteeinheit, wobei in der Auswerteeinheit die Signalintensität der reflektierten oder rückgestreuten Teilstrahlen gegen die optische Weglänge bestimmt wird und aus der Temperaturverschiebung der Signalintensität die Temperaturverschiebung und die Temperatur der Probe ermittelt wird.

    Abstract translation: 一种用于确定样品(21)的温度,包括在样品中通过至少两个不同的深度引导Sondierlichtstrahls(12,22,32)到样品中,其中所述Sondielichtstrahls的至少两个部分光束穿过不同长度的路径的样品中的步骤的方法 被反射或散射回,返回的反射或反向散射的光束分量在分析单元经由其利用光束作为参考光束干涉仪装置产生在分析单元的干涉图案,并且评估在评估单元所生成的干涉图案,其中,所述反映在评估单元中的信号强度 或相对于被确定的光路长度和温度位移和样品的温度的反向散射分量光束从信号强度的温度变化来确定。

    MEASUREMENT OF BRIGHTNESS, FLOW VELOCITY AND TEMPERATURE OF RADIANT MEDIA
    9.
    发明申请
    MEASUREMENT OF BRIGHTNESS, FLOW VELOCITY AND TEMPERATURE OF RADIANT MEDIA 审中-公开
    辐射介质的亮度,流速和温度的测量

    公开(公告)号:WO99004229A1

    公开(公告)日:1999-01-28

    申请号:PCT/AU1998/000560

    申请日:1998-07-16

    Abstract: A method and apparatus for measurement of the brightness, flow velocity and temperature of radiant media. A substantially collimated beam (3) of light is directed to a linear polarizer (5) through an interference filter (4). An electro-optically active birefringent crystal (7) separates the linearly polarized output of the polarizer (5) into two characteristic waves and introduces a final phase delay between the wave. The birefringent crystal (7) is electro-optically modulated to introduce a variable phase delay between the characteristic waves. The resultant characteristic waves are combined to interfere and the combination is sampled to produce a signal from which the emission moment of the radiant media can be determined.

    Abstract translation: 用于测量辐射介质的亮度,流速和温度的方法和装置。 基本上准直的光束(3)通过干涉滤光器(4)被引导到线性偏振器(5)。 电光学双折射晶体(7)将偏振器(5)的线偏振输出分离成两个特征波,并在波之间引入最终的相位延迟。 双折射晶体(7)被电光调制以在特征波之间引入可变相位延迟。 所得到的特征波被组合以干扰,并且组合被采样以产生可以确定辐射介质的发射矩的信号。

    BIREFRINGENT OPTICAL TEMPERATURE SENSOR AND METHOD
    10.
    发明申请
    BIREFRINGENT OPTICAL TEMPERATURE SENSOR AND METHOD 审中-公开
    双重光学温度传感器和方法

    公开(公告)号:WO2006058423A1

    公开(公告)日:2006-06-08

    申请号:PCT/CA2005/001815

    申请日:2005-11-30

    Abstract: The invention concerns a tandem interferometer for temperature sensing. The low coherence interferometry (LCI) system comprises a polarization-based sensing interferometer comprising a birefringent crystal having a sensor temperature sensitivity and a birefringence dispersion, and a readout interferometer being either a Fizeau interferometer using an optical wedge or a polarization interferometer using a birefringent wedge. In one embodiment of the invention, the birefringent crystal has dispersion properties similar to that of the birefringent wedge or that of the optical wedge of the readout interferometer. The present invention also provides a signal processing method for correcting the dispersion effect and for noise filtering in LCI-based optical sensors of the tandem interferometer arrangement.

    Abstract translation: 本发明涉及用于温度感测的串联干涉仪。 低相干干涉测量(LCI)系统包括基于偏振的感测干涉仪,其包括具有传感器温度灵敏度和双折射色散的双折射晶体,以及使用光楔的Fizeau干涉仪或使用双折射楔的偏振干涉仪的读出干涉仪 。 在本发明的一个实施例中,双折射晶体具有与双折射楔形或者读出干涉仪的光楔的分散特性相似的分散特性。 本发明还提供一种用于校正串联干涉仪装置的基于LCI的光学传感器中的色散效应和噪声滤波的信号处理方法。

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