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公开(公告)号：EP0706639A1
公开(公告)日：1996-04-17
申请号：EP94923551
申请日：1994-07-20
Applicant: SPACETEC IMC CORP
Inventor： HILTON JOHN A
IPC: G01D5/26 , G01D5/34 , G01L1/00 , G01L1/24 , G01L5/16 , G01L5/22 , G06F3/038 , G06F3/041 , G01D7/00
CPC classification number: G01L1/248 , G01D5/34 , G01L5/161 , G01L5/166 , G01L5/223 , G06F3/03543 , G06F3/038 , G06F3/041 , G06F3/0414 , Y10T74/20201
Abstract: A force and torque converter (1) is provided that senses force and torque applied to the device (1). The converter (1) includes a base (10), a grip (9), resilient connection members (2, 4, 6) that extend radially and coplanarly from a central hub (8), located within the grip (9), and that connect to the grip, and sensing mechanisms to sense the displacement of the connection members (2, 4, 6). The displacements are resolved to determine the force and torque that is applied to the device (1), with respect to a Cartesian coordinate system.
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公开(公告)号：EP0480961A1
公开(公告)日：1992-04-22
申请号：EP90909754.0
申请日：1990-06-26
Applicant: SIRA LIMITED
IPC: G01L1
CPC classification number: G01L1/248
Abstract: Appareil pour mesurer les contraintes en un point donné d'un objet, comprenant: un dispositif pour appliquer une charge à variation cyclique de période T sur ledit objet; un détecteur qui enregistre et mesure le rayonnement thermique depuis ce point et sur un intervalle-échantillon de temps t, t étant inférieur à T, un moyen qui détermine la phase du premier intervalle t par rapport à la variation cyclique du rayonnement thermique émis par ledit point en réaction à la charge appliquée et qui, à partir des valeurs du rayonnement thermique et de la phase ainsi enregistrées et mesurées, calcule la contrainte en ce point.
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公开(公告)号：US12066343B2
公开(公告)日：2024-08-20
申请号：US17467836
申请日：2021-09-07
Inventor： Yousuke Irie
CPC classification number: G01L1/248 , G01J5/0003 , G01J2005/0077 , G06T7/20 , G06T2207/10048 , G06T2207/30236 , H04N5/33
Abstract: A stress properties measurement method for measuring properties of stresses generated in a structure includes acquiring, from a first imaging device, a plurality of thermal images corresponding to temperatures of a surface of the structure, the plurality of thermal images being different in imaging time from each other, generating a stress distribution image corresponding to each of the plurality of thermal images, acquiring a stress value of a first section that is smaller in stress gradient than a predetermined value and respective stress values of a plurality of second sections where stresses are concentrated for the stress distribution images, and deriving correlation properties of stresses at a section of the structure based on the stress value of the first section acquired and the respective stress values of the plurality of second sections acquired.
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公开(公告)号：US11808657B2
公开(公告)日：2023-11-07
申请号：US17563627
申请日：2021-12-28
Inventor： Yousuke Irie
CPC classification number: G01M11/081 , G01L1/248 , G01M5/0008
Abstract: A stress distribution image processing device including:
a processing unit configured to:
designate a normalization region which includes a portion of stress equal to or larger than a predetermined threshold value in a screen of a stress distribution image of a target object; and
normalize pixels in the normalization region based on stress values in the normalization region to obtain a normalized image.-
公开(公告)号：US09970833B2
公开(公告)日：2018-05-15
申请号：US14259519
申请日：2014-04-23
Applicant: The Boeing Company
Inventor： Gary E. Georgeson , Morteza Safai
Abstract: A witness material for monitoring an environmental history of an object may include a material containing a dye of a type that fluoresces in response to actinic radiation in one or both of a shift in color and a change in intensity when subjected to a predetermined stress above a predetermined level; and the material forming a coating on one or more of an outer container for the object, an inner container for the object, a tape that is applied to an outer container for the object, a tape that is applied to an inner container for the object, a shrink wrap enclosing the object, an outer surface of the object, and an inner surface of the object.
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Patent Agency Ranking
16.发明授权Prism-coupling systems and methods for characterizing ion-exchanged waveguides with large depth-of-layer 有权用于表征具有大深度层的离子交换波导的棱镜耦合系统和方法公开(公告)号：US09534981B2
公开(公告)日：2017-01-03
申请号：US14966642
申请日：2015-12-11
Applicant: CORNING INCORPORATED
IPC: G01B11/16 , G01M11/08 , G02B6/134 , G02B6/34 , G02B6/14 , G02B6/36 , G01L1/24 , C03C21/00 , G01N21/41 , G01N21/84 , G01B11/22 , G01N21/23 , G02B5/04 , G01B11/06
CPC classification number: G01M11/08 , C03C21/002 , G01B11/0641 , G01B11/22 , G01L1/24 , G01L1/248 , G01N21/23 , G01N21/41 , G01N21/8422 , G01N2021/4126 , G02B5/04 , G02B6/1345 , G02B6/14 , G02B6/34 , G02B6/362
Abstract: Prism-coupling systems and methods for characterizing large depth-of-layer waveguides formed in glass substrates are disclosed. One method includes making a first measurement after a first ion-exchange process that forms a deep region and then performing a second measurement after a second ion-exchange process that forms a shallow region. Light-blocking features are arranged relative to the prism to produce a mode spectrum where the contrast of the mode lines for the strongly coupled low-order modes is improved at the expense of loss of resolution for measuring characteristics of the shallow region. Standard techniques for determining the compressive stress, the depth of layer or the tensile strength of the shallow region are then employed. A second measurement can be made using a near-IR wavelength to measure characteristics of the deeper, first ion-exchange process. Systems and methods of measuring ion-exchanged samples using shape control are also disclosed.
Abstract translation: 公开了用于表征玻璃基板中形成的大深度深度波导的棱镜耦合系统和方法。 一种方法包括在形成深区域的第一离子交换过程之后进行第一测量，然后在形成浅区域的第二离子交换过程之后进行第二测量。 遮光特征相对于棱镜布置以产生模式光谱，其中以牺牲用于测量浅区域的特性的分辨率损失为代价，强耦合低阶模式的模式线的对比度得到改善。 然后采用用于确定压缩应力，层的深度或浅区域的拉伸强度的标准技术。 可以使用近红外波长进行第二次测量，以测量较深的第一离子交换过程的特性。 还公开了使用形状控制测量离子交换样品的系统和方法。
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公开(公告)号：US09513178B2
公开(公告)日：2016-12-06
申请号：US14358815
申请日：2012-11-16
Inventor： Ákos Sándor Tar , György Gábor Cserey , József Veres
Abstract: The invention is a sensor device comprising a carrier element (24), at least one light emitting element (20) arranged on the carrier element (24), at least one light detecting element (22) arranged on the carrier element (24), a cover layer (12) reflecting at least one part of the light emitted by the light emitting element (20) to the at least one light detecting element (22), and at least one transparent filler element (16, 18) filling at least partly the space between the carrier element (24) and the cover layer (12) and being made of a flexible material.
Abstract translation: 本发明是包括载体元件（24），布置在载体元件（24）上的至少一个发光元件（20）），布置在载体元件（24）上的至少一个光检测元件（22）的传感器装置， 将由所述发光元件（20）发射的光的至少一部分反射到所述至少一个光检测元件（22）的覆盖层（12），以及至少填充至少一个透明填充元件（16,18） 部分地是载体元件（24）和覆盖层（12）之间的空间，并由柔性材料制成。
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公开(公告)号：US06388247B2
公开(公告)日：2002-05-14
申请号：US09802802
申请日：2001-03-09
Applicant: Haruhiko H. Asada , Stephen Mascaro
Inventor： Haruhiko H. Asada , Stephen Mascaro
IPC: G01L522
Abstract: A device for detecting the posture a finger or forces applied to a finger, the finger having a fingernail illuminated by light, comprises at least one photodetector for measuring a change in light reflected by an area of the finger beneath the fingernail in response to the posture of the finger or forces applied to the finger. The photodetector provides a signal corresponding to the change in light reflected. The device also includes a processor for receiving the signal and determining whether the change corresponds to a specified condition. The photodetector may be enclosed in a housing and coupled to the fingernail.
Abstract translation: 用于检测手指或手指施加的力的装置，所述手指具有由光照亮的指甲，所述手指包括至少一个光电检测器，用于响应于所述姿势来测量由指甲下方的手指区域反射的光的变化 的手指或力施加到手指。 光检测器提供对应于反射光的变化的信号。 该设备还包括一个处理器，用于接收信号并确定该变化是否对应于指定的条件。 光电检测器可以封闭在壳体中并且联接到指甲。
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公开(公告)号：US06236037B1
公开(公告)日：2001-05-22
申请号：US09253437
申请日：1999-02-19
Applicant: Haruhiko H. Asada , Stephen Mascaro , Kuo-Wei Chang
Inventor： Haruhiko H. Asada , Stephen Mascaro , Kuo-Wei Chang
IPC: G01L522
Abstract: A device for detecting contact pressure applied to a finger, the finger having a fingernail illuminated by light, comprises at least one photodetector for measuring a change in light reflected by an area of the finger beneath the fingernail in response to the contact pressure applied to the finger. The photodetector provides a signal corresponding to the change in light reflected. The device also includes a processor for receiving the signal and determining whether the change corresponds to a specified condition. The photodetector may be enclosed in a housing and coupled to the fingernail.
Abstract translation: 一种用于检测施加到手指的接触压力的装置，所述手指具有由光照亮的指甲，包括至少一个光电检测器，用于响应于施加到所述手指的接触压力来测量由指甲下方的手指的区域反射的光的变化 手指。 光检测器提供对应于反射光的变化的信号。 该设备还包括一个处理器，用于接收信号并确定该变化是否对应于指定的条件。 光电检测器可以封闭在壳体中并且联接到指甲。
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公开(公告)号：US5728944A
公开(公告)日：1998-03-17
申请号：US605291
申请日：1996-01-17
Applicant: Richard H. Nadolink
Inventor： Richard H. Nadolink
CPC classification number: G01L1/248 , G01N2203/0641
Abstract: A stress detection apparatus is provided. A piece of semiconductor grade, ngle crystal silicon mounted on the material is illuminated by an infrared source with radiation having a wavelength in the range of 800-1100 nanometers. An infrared detector monitors the photoelastic effects of illuminating the single crystal silicon with the radiation.
Abstract translation: 提供一种应力检测装置。 安装在材料上的一片半导体级单晶硅由具有在800-1100纳米范围内的波长的红外源照射。 红外检测器监测用辐射照射单晶硅的光弹效应。
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