Backlight apparatus with remote light source
    12.
    发明授权
    Backlight apparatus with remote light source 有权
    带远程光源的背光装置

    公开(公告)号:US08308330B2

    公开(公告)日:2012-11-13

    申请号:US12475666

    申请日:2009-06-01

    Applicant: Günther Nath

    Inventor: Günther Nath

    Abstract: An apparatus for optical examination of documents. The apparatus includes a light source, a plurality of panels which are exchangeable with each other, a viewing unit having a window formed by at least one of the plurality of exchangeable panels through which window light emitted from the light source exits for examination of documents by an observer. Further included is a coupling unit configured to supply the light emitted from the light source into the viewing unit. The light source and the viewing unit are coupled together by a light guide and the light guide is adapted to supply the light from the light source to the coupling unit. At least one of the plurality of exchangeable panels is a fluorescent panel including a fluorescent substance. The fluorescent panel is fluorescent in the yellow-red-infrared wavelength range when being illuminated with light in the ultraviolet-blue-green wavelength range.

    Abstract translation: 一种用于光学检查文件的设备。 该装置包括光源,可彼此交换的多个面板,观察单元,其具有由多个可更换面板中的至少一个形成的窗口,通过该窗口从光源发射的窗光通过该窗口离开以便通过 观察员 进一步包括被配置为将从光源发射的光提供到观察单元中的耦合单元。 光源和观察单元通过光导耦合在一起,并且光导适合于将来自光源的光提供给耦合单元。 多个可更换面板中的至少一个是包括荧光物质的荧光板。 当以紫外 - 蓝 - 绿色波长范围的光照射时,荧光板在黄 - 红 - 红外波长范围内是荧光的。

    Method and apparatus for inspection of semiconductor devices
    13.
    发明授权
    Method and apparatus for inspection of semiconductor devices 失效
    用于半导体器件检查的方法和装置

    公开(公告)号:US07326929B2

    公开(公告)日:2008-02-05

    申请号:US11348029

    申请日:2006-02-06

    Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.

    Abstract translation: 通过用宽带红外辐射照射被检查的每个半导体器件,然后形成从半导体器件镜面反射的辐射的图像,提供半导体器件和这种器件的阵列中的缺陷的高对比度图像的技术。 许多这样的器件的半导体器件和阵列具有金属背衬层,其将照明反射回适当定位和对准的相机中,该相机被选择为对半导体器件材料相对透明的红外波长敏感。

    Inspection device of solar cell panel
    14.
    发明专利
    Inspection device of solar cell panel 审中-公开
    太阳能电池板检查装置

    公开(公告)号:JP2007078404A

    公开(公告)日:2007-03-29

    申请号:JP2005263839

    申请日:2005-09-12

    CPC classification number: G01N21/958 G01N21/3563 G01N21/956 G01N2201/06133

    Abstract: PROBLEM TO BE SOLVED: To provide an inspection device of a solar cell panel constituted so that the crack of the cover glass of the solar cell panel present in the solar cell used on a satellite and the internal fine flaw of the crystal layer of the cover glass are inspected. SOLUTION: The inspection device of the solar cell panel is constituted so as to detect the crack of the cover glass of the solar cell panel and the internal fine flaw of the crystal layer of the solar cell panel and equipped with an array type illuminator wherein a plurality of illumination elements are arranged two-dimensionally and a CCD camera comprising an imaging element having sensitivity in an infrared region in order to image the area to be inspected of the solar cell irradiated with the light from the array type illuminator. COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种太阳能电池面板的检查装置,其构造成使得存在于卫星上使用的太阳能电池中的太阳能电池板的玻璃罩的裂纹和晶体层的内部细小缺陷 的玻璃被检查。 解决方案:太阳能电池板的检查装置构成为检测太阳能电池板的玻璃罩的裂纹和太阳能电池面板的晶体层的内部细小的缺陷,并配备有阵列型 照明器,其中多个照明元件被二维布置;以及CCD照相机,其包括在红外区域中具有灵敏度的成像元件,以便对来自阵列照明器的光照射的太阳能电池的被检查区域进行成像。 版权所有(C)2007,JPO&INPIT

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