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公开(公告)号：US07705978B2
公开(公告)日：2010-04-27
申请号：US11348019
申请日：2006-02-06
Applicant: Mau-Song Chou , Jonathan W. Arenberg , Mark A. Menard
Inventor： Mau-Song Chou , Jonathan W. Arenberg , Mark A. Menard
CPC classification number: G01N21/3563 , G01N21/8806 , G01N21/956 , G01N25/72 , G01N2201/06133
Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
Abstract translation: 通过用宽带红外辐射照射被检查的每个细胞，然后形成从细胞长期反射的辐射图像，提供太阳能电池和太阳能电池板中的缺陷的高对比度图像的技术。 多结太阳能电池具有金属背衬层，其将照明反射回适当定位和对准的相机中，其被选择为对于太阳能电池材料相对透明的红外波长敏感。
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公开(公告)号：US20090294693A1
公开(公告)日：2009-12-03
申请号：US12475666
申请日：2009-06-01
Applicant: Günther Nath
Inventor： Günther Nath
CPC classification number: G01J1/08 , G01J1/04 , G01J1/0474 , G01J1/58 , G01N21/8803 , G01N21/8806 , G01N2021/8835 , G01N2021/8845 , G01N2201/06133 , G01N2201/0634
Abstract: An apparatus for optical examination of documents. The apparatus includes a light source, a viewing unit having a window through which light emitted from the light source exits for examination of documents by an observer. A method for optical examination of a document. The method steps include: providing a light source; emitting light from the light source into a viewing unit; emitting light from the viewing unit through a window; applying fluid to a document to be viewed; and, bringing the document into contact with the window such that an observer can examine the document.
Abstract translation: 一种用于光学检查文件的设备。 该装置包括光源，具有窗口的观察单元，通过该窗口从光源射出的光从出口观察观察者检查文件。 一种用于光学检查文件的方法。 方法步骤包括：提供光源; 将光从光源发射到观察单元; 通过窗口从观察单元发射光; 将流体施加到待查看的文件上; 并且使文档与窗口接触，使得观察者可以检查该文档。
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3.发明公开Method and apparatus for inspection of semiconductor devices 审中-公开Gerätund Verfahren zur Inspektion von Halbleiterbauelementen
公开(公告)号：EP1816463A1
公开(公告)日：2007-08-08
申请号：EP07250204.0
申请日：2007-01-18
Applicant: Northrop Grumman Corporation
Inventor： Chou, Mau-Song , Arenberg, Jonathan W. , Menard, Mark A. , Chung, Thomas T.
CPC classification number: G01N21/8806 , G01N21/3563 , G01N21/9501 , G01N25/72 , G01N2201/06133
Abstract: A technique for providing high-contrast images of defects in semiconductor devices (10) and arrays of such devices (10), by illuminating each semiconductor device (10) under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer (16) that specularly reflects the illumination back into an appropriately positioned and aligned camera (14), selected to be sensitive to infrared wavelengths at which the semiconductor device (10) materials are relatively transparent.
Abstract translation: 一种用于通过用宽带红外辐射照射被检查的每个半导体器件（10）来提供半导体器件（10）中的缺陷的高对比度图像和这种器件（10）的阵列的技术，然后形成镜面的辐射图像 从半导体器件反射。 许多这样的器件的半导体器件和阵列具有金属背衬层（16），其将照明反射回适当定位和对准的相机（14），其选择为对半导体器件（10）材料的红外波长敏感 比较透明
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公开(公告)号：US20070181809A1
公开(公告)日：2007-08-09
申请号：US11348029
申请日：2006-02-06
Applicant: Mau-Song Chou , Jonathan Arenberg , Mark Menard , Thomas Chung
Inventor： Mau-Song Chou , Jonathan Arenberg , Mark Menard , Thomas Chung
IPC: G02F1/01
CPC classification number: G01N21/8806 , G01N21/3563 , G01N21/9501 , G01N25/72 , G01N2201/06133
Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.
Abstract translation: 通过用宽带红外辐射照射被检查的每个半导体器件，然后形成从半导体器件镜面反射的辐射的图像，提供半导体器件和这种器件的阵列中的缺陷的高对比度图像的技术。 许多这样的器件的半导体器件和阵列具有金属背衬层，其将照明反射回适当定位和对准的相机中，该相机被选择为对半导体器件材料相对透明的红外波长敏感。
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公开(公告)号：US20070181180A1
公开(公告)日：2007-08-09
申请号：US11348019
申请日：2006-02-06
Applicant: Mau-Song Chou , Jonathan Arenberg , Mark Menard
Inventor： Mau-Song Chou , Jonathan Arenberg , Mark Menard
IPC: H01L31/00
CPC classification number: G01N21/3563 , G01N21/8806 , G01N21/956 , G01N25/72 , G01N2201/06133
Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
Abstract translation: 通过用宽带红外辐射照射被检查的每个细胞，然后形成从细胞长期反射的辐射图像，提供太阳能电池和太阳能电池板中的缺陷的高对比度图像的技术。 多结太阳能电池具有金属背衬层，其将照明反射回适当定位和对准的相机中，其被选择为对于太阳能电池材料相对透明的红外波长敏感。
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Patent Agency Ranking6.发明授权
公开(公告)号：US4832495A
公开(公告)日：1989-05-23
申请号：US107962
申请日：1987-10-13
Applicant: Daniel D. Briggs , Peter Vischer
Inventor： Daniel D. Briggs , Peter Vischer
IPC: G01N21/59
CPC classification number: G01N21/5907 , G01N2021/5942 , G01N2021/5957 , G01N2201/06126 , G01N2201/06133 , G01N2201/0636 , G01N2201/0646
Abstract: An apparatus for measuring the relative coverage of a predetermined portion of a sheet of translucent material with an opaque medium such as ink or photographic emulsion, comprising: a light source for providing a relatively constant intensity source of light over a predetermined measuring area; a positioning device for positioning the predetermined portion of the sheet of material to be measured over the predetermined measuring area of the light source; a light measuring device for measuring the relative amount of light from the light source which is transmitted through the predetermined portion of the sheet of material to be measured, whereby the relative amount of opaque medium coverage of the portion of the sheet to be measured is readily determinable by comparison of the measured amount of light transmitted through the predetermined portion of the sheet to be measured with predetermined calibration values.
Abstract translation: 一种用于用不透明介质如油墨或照相乳剂测量半透明材料片的预定部分的相对覆盖度的装置，包括：用于在预定测量区域上提供相对恒定的强度光源的光源; 定位装置，用于将待测量的材料片的预定部分定位在光源的预定测量区域上; 光测量装置，用于测量透射通过待测量材料片的预定部分的来自光源的光的相对量，由此待测量的片的部分的不透明介质覆盖的相对量容易 可以通过将测量的被测量的光的透射量与预定的校准值进行比较来确定。
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7.发明申请
公开(公告)号：WO2008034954A2
公开(公告)日：2008-03-27
申请号：PCT/FI2007/050503
申请日：2007-09-21
Applicant: METSO PAPER, INC. , MANNINEN, Tuulikki
Inventor： MANNINEN, Tuulikki
CPC classification number: G01N21/8901 , G01N2021/8681 , G01N2021/8917 , G01N2201/0612 , G01N2201/06133 , G01N2201/0697 , G01N2201/084
Abstract: A method and a device for measuring at least one property of a moving web, wherein the web (W) is illuminated with a light source (1) and detected with a camera (2) substantially at the illuminated area. A diode laser light source is used for illuminating the web (W).
Abstract translation: 一种用于测量移动幅材的至少一个性质的方法和装置，其中所述幅材（W）被光源（1）照射并且基本上在照明区域用相机（2）检测。 二极管激光光源用于照射纸幅（W）。
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公开(公告)号：WO2007092146A2
公开(公告)日：2007-08-16
申请号：PCT/US2007/001631
申请日：2007-01-19
Applicant: NORTHROP GRUMMAN CORPORATION , CHOU, Mau-Song , ARENBERG, Jonathan, W. , MENARD, Mark, A.
Inventor： CHOU, Mau-Song , ARENBERG, Jonathan, W. , MENARD, Mark, A.
CPC classification number: G01N21/3563 , G01N21/8806 , G01N21/956 , G01N25/72 , G01N2201/06133
Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
Abstract translation: 通过用宽带红外辐射照射被检查的每个细胞，然后形成从细胞长期反射的辐射图像，提供太阳能电池和太阳能电池板中的缺陷的高对比度图像的技术。 多结太阳能电池具有金属背衬层，其将照明反射回适当定位和对准的相机中，其被选择为对于太阳能电池材料相对透明的红外波长敏感。
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公开(公告)号：WO2007092146A3
公开(公告)日：2007-10-04
申请号：PCT/US2007001631
申请日：2007-01-19
Applicant: NORTHROP GRUMMAN CORP , CHOU MAU-SONG , ARENBERG JONATHAN W , MENARD MARK A
Inventor： CHOU MAU-SONG , ARENBERG JONATHAN W , MENARD MARK A
CPC classification number: G01N21/3563 , G01N21/8806 , G01N21/956 , G01N25/72 , G01N2201/06133
Abstract: A technique for providing high-contrast images of defects in solar cells (10) and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is sepcularly reflected from the cell. Multi-junction solar cells have a metal backing layer that sepcularly reflects the illumination back into an appropriately positioned and aligned camera (14), selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.
Abstract translation: 通过用宽带红外辐射照射被检查的每个电池，然后形成从电池单独反射的辐射图像，提供太阳能电池（10）和太阳能电池板中的缺陷的高对比度图像的技术。 多结太阳能电池具有金属背衬层，其将照明分开地反射回适当定位和对准的相机（14），其选择为对于太阳能电池材料相对透明的红外波长敏感。
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公开(公告)号：US09878842B2
公开(公告)日：2018-01-30
申请号：US14540464
申请日：2014-11-13
Applicant: Dow AgroSciences LLC
Inventor： Kirsti A. Golgotiu , Brent Allen Gibson , Cory A. Christensen
CPC classification number: B65D85/52 , A01G7/06 , G01N21/255 , G01N21/84 , G01N2021/845 , G01N2021/8466 , G01N2201/06133 , G01N2201/062 , G01N2201/0634
Abstract: A system and method is disclosed for imaging and scanning a plurality of plants to capture information related to plant performance. Plants move through the system on a conveyor belt in specialized plant container pot holders.
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