Abstract:
A charged particle beam emitting device includes at least two charged particle beam guns (2, 2'), each of the at least two charged particle beam guns (2, 2') having a separate charged particle emitter (4, 4') with an emitting surface for emitting a respective charged particle beam (12. 12'). The charged particle beam emitting device further includes an aperture element (18) comprising at least one aperture opening (16) and a deflector unit (14, 24). The deflector unit (14) is adapted for alternatively directing the charged particle beams (12, 12') of the at least two charged particle beam guns (2, 2') on the at least one aperture opening (16) so that, at the same time, one of the at least two charged particle beams (12, 12') is directed on the aperture opening (16) while the respective other charged particle beam of the at least two charged particle beams (12, 12') is deflected from the aperture opening (16) by the deflector unit (14, 24). At the same time, only one of the two charged particle beam guns (2, 2') is used so that the temporarily unused charged particle beam gun can be subjected to a cleaning procedure. This ensures that the emitting surfaces of both charged particle beam guns (2, 2') can be alternatively frequently cleaned with minimum interruption of the operation of the charged particle beam device.
Abstract:
The invention relates to an electron source for generating an electron beam and to an X-ray source for generating X-ray radiation. The invention concerns an electron source (1) for generating an electron beam (22), in which source a first electron emitter (20) for generating electrons and at least one second electron emitter (21) for generating electrons are disposed, the first electron emitter (20) and the at least one second electron emitter (21) being designed such that they can be operated alternately and being arranged in a stationary manner relative to one another. In addition, at least one common device for focusing the electrons of the first electron emitter (20) and of the at least one second electron emitter (21) is provided in the electron source (1), wherein the formed electron beam (22) from the first electron emitter (20) and the formed electron beam (22) from the at least one second electron emitter (21) can be directed onto a common focusing surface (23) by the at least one device for focusing the electrons. Furthermore, the invention relates to an X-ray source (100), the X-ray source (100) comprising an electron source (1) and an anode (24), the electron source (1) being designed in the manner described above.
Abstract:
Elektronenquelle zur Erzeugung eines Elektronenstrahls sowie Röntgenquelle zur Erzeugung von Röntgenstrahlung Die Erfindung betrifft eine Elektronenquelle (1) zur Erzeugung eines Elektronenstrahls (23), in der ein erster Elektronenemitter (20) zur Erzeugung von Elektronen und zumindest ein zweiter Elektronenemitter (21) zur Erzeugung von Elektronen angeordnet sind, wobei der erste Elektronenemitter (20) und der zumindest eine zweite Elektronenemitter (21) alternativ betreibbar ausgestaltet sind und zueinander ortsfest angeordnet sind. Zusätzlich ist bei der Elektronenquelle (1) wenigstens eine gemeinsame Vorrichtung zur Fokussierung der Elektronen des ersten Elektronenemitters (20) und des zumindest einen zweiten Elektronenemitters (21) vorgesehen, wobei durch die wenigstens eine Vorrichtung zur Fokussierung der Elektronen der gebildete Elektronenstrahl (22) des ersten Elektronenemitters (20) und der gebildete Elektronenstrahl (22) des zumindest einen zweiten Elektronenemitters (21) auf eine gemeinsame Fokussierfläche (23) gerichtet werden können. Ferner betrifft die Erfindung eine Röntgenquelle (100), wobei die Röntgenquelle (100) eine Elektronenquelle (1) und eine Anode (24) aufweist, wobei die Elektronenquelle (1) derart ausgebildet ist.
Abstract:
PROBLEM TO BE SOLVED: To provide a technology which is advantageous for shortening the time required for replacing an electrode of an electron gun.SOLUTION: An electron beam lithography apparatus for drawing a pattern on a substrate by electron beams emitted from an electron gun includes: an adjustment chamber for adjusting a standby electrode constituting the electron gun as a standby of an electrode; and a drive mechanism in which the used electrode is detached from the electron gun and the standby electrode adjusted in the adjustment chamber is incorporated into the electron gun. The supply of electric power to the standby electrode is included in adjustment of the standby electrode.