X-RAY MODULE
    13.
    发明公开
    X-RAY MODULE 审中-公开

    公开(公告)号:US20230290604A1

    公开(公告)日:2023-09-14

    申请号:US18140223

    申请日:2023-04-27

    Abstract: An X-ray module includes; a housing; an electron gun that emits an electron beam inside the housing; a target disposed inside the housing and fixed to the housing, to generate an X-ray when the electron beam is incident on the target; a permanent magnet that is disposed outside the housing and deflects the electron beam by means of a magnetic force; and a heat radiating unit having a higher thermal conductivity than a thermal conductivity of the permanent magnet and thermally connected to the permanent magnet.

    X-RAY ANALYSIS APPARATUS AND METHOD
    16.
    发明公开

    公开(公告)号:EP4425158A1

    公开(公告)日:2024-09-04

    申请号:EP23159987.9

    申请日:2023-03-03

    CPC classification number: G01N23/20008 H01J35/153

    Abstract: The present invention relates to an X-ray analysis apparatus and an X-ray method for analysing a sample. The X-ray analysis apparatus includes an X-ray source comprising an anode and a cathode, and configured to irradiate an irradiated area on a target surface of the anode. The X-ray analysis apparatus further includes a steering arrangement, a processor and a controller. The steering arrangement is configured to position the irradiated area on the target surface of the anode. The processor is configured to receive X-ray analysis information, and to determine a change in position of the irradiated area on the target surface based on the X-ray analysis information. The controller is configured to control the steering arrangement to move the irradiated area on the target surface according to the change in position determined by the processor.

    REFLECTION TARGET X-RAY SOURCE WITH STEERED BEAM ON TARGET

    公开(公告)号:EP4358112A3

    公开(公告)日:2024-07-31

    申请号:EP23198277.8

    申请日:2023-09-19

    CPC classification number: H01J35/153 H01J35/30 H05G1/52

    Abstract: A method for controlling an x-ray source comprises generating an electron beam for striking the target to generate x-rays and steering the electron beam to a desired location on the target using a first and a second steering system distributed along a flight tube. In this way, the beam can be steering to the desired location while also passing through the center of a focusing lens to maintain optimal beam characteristics. Also possible is scanning the electron beam over the target to find a fiducial mark. Then, a desired location can be found as an offset from this mark.

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