REFLECTION TARGET X-RAY SOURCE WITH STEERED BEAM ON TARGET

    公开(公告)号:EP4358112A2

    公开(公告)日:2024-04-24

    申请号:EP23198277.8

    申请日:2023-09-19

    CPC classification number: H01J35/153 H01J35/30

    Abstract: A method for controlling an x-ray source comprises generating an electron beam for striking the target to generate x-rays and steering the electron beam to a desired location on the target using a first and a second steering system distributed along a flight tube. In this way, the beam can be steering to the desired location while also passing through the center of a focusing lens to maintain optimal beam characteristics. Also possible is scanning the electron beam over the target to find a fiducial mark. Then, a desired location can be found as an offset from this mark.

    X-RAY ANALYSIS APPARATUS AND METHOD
    4.
    发明公开

    公开(公告)号:US20240298400A1

    公开(公告)日:2024-09-05

    申请号:US18593530

    申请日:2024-03-01

    Abstract: The present invention relates to an X-ray analysis apparatus and an X-ray method for analysing a sample. The X-ray analysis apparatus includes an X-ray source comprising an anode and a cathode, and configured to irradiate an irradiated area on a target surface of the anode. The X-ray analysis apparatus further includes a steering arrangement, a processor and a controller. The steering arrangement is configured to position the irradiated area on the target surface of the anode. The processor is configured to receive X-ray analysis information, and to determine a change in position of the irradiated area on the target surface based on the X-ray analysis information. The controller is configured to control the steering arrangement to move the irradiated area on the target surface according to the change in position determined by the processor.

    X-RAY GENERATION APPARATUS, X-RAY IMAGING APPARATUS, AND ADJUSTMENT METHOD OF X-RAY GENERATION APPARATUS

    公开(公告)号:US20240087833A1

    公开(公告)日:2024-03-14

    申请号:US18509608

    申请日:2023-11-15

    Inventor: Yoichi ANDO

    CPC classification number: G01N23/046 H01J35/153 H01J35/112

    Abstract: An X-ray imaging apparatus includes an X-ray generation apparatus including an X-ray generation tube having an electron gun and a target configured to receive an electron beam from the electron gun to generate X-rays, a support structure supporting the tube, and a deflector configured to deflect the electron beam, an X-ray detector configured to detect the X-rays from the X-ray generation apparatus, and a control apparatus configured to control the X-ray generation apparatus. The support structure supports the tube to permit at least the target to be pivoted in a state in which the deflector is fixed, and the control apparatus determines, based on use amount of the X-ray generation apparatus and/or change of the X-rays generated by the X-ray generation apparatus, whether it is necessary to pivot the target.

    X-ray generating apparatus, X-ray imaging apparatus, and method of adjusting X-ray generating apparatus

    公开(公告)号:US12080509B2

    公开(公告)日:2024-09-03

    申请号:US18616914

    申请日:2024-03-26

    Inventor: Yoichi Ando

    CPC classification number: H01J35/30 H01J35/153 H05G1/32

    Abstract: An X-ray generating apparatus includes an X-ray generating tube including an electron gun and a target configured to generate X-rays upon receiving an electron beam emitted from the electron gun, a deflector configured to deflect the electron beam, a driving circuit configured to apply an accelerating voltage between a cathode of the electron gun and the target, and an adjuster configured to adjust deflection of the electron beam by the deflector in accordance with the accelerating voltage or an amount of change in the accelerating voltage so as to reduce a change in incident position of the electron beam onto the target due to a change in the accelerating voltage.

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