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公开(公告)号:WO2022109142A2
公开(公告)日:2022-05-27
申请号:PCT/US2021/059901
申请日:2021-11-18
Applicant: MICRON TECHNOLOGY, INC.
Inventor: BONITZ, Rainer F. , HUO, Binbin
IPC: G06F11/14 , G06F11/20 , G06F11/22 , G06F11/30 , G06F11/0757 , G06F11/0772 , G06F11/1428 , G06F11/1443 , G06F11/2007 , G06F11/221 , G06F11/26 , G06F11/302 , G06F11/3027 , G06F11/3034 , G06F2201/81 , G06F2201/865 , G06F2201/88 , G06F3/0619 , G06F3/0659 , G06F3/0679
Abstract: A computing system can comprise a processing resource and a memory device coupled together via a first transmission link. The processing resource can be configured to test the first transmission link in response to the memory device failing to execute a command by sending the command to the memory device again for retry and monitoring the first transmission link for signals that indicate whether the command was executed by the memory device.
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公开(公告)号:WO2021220092A1
公开(公告)日:2021-11-04
申请号:PCT/IB2021/053002
申请日:2021-04-12
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION , IBM UNITED KINGDOM LIMITED , IBM (CHINA) INVESTMENT COMPANY LIMITED
Inventor: ANAND, Vishal
IPC: G06F9/50 , G06F11/3006 , G06F11/3409 , G06F2201/81 , G06F9/5038 , G06F9/5077
Abstract: Methods, computer program products, and systems are presented. The method computer program products, and systems can include, for instance: receiving, by a manager node, from a plurality of compute nodes metrics data, the manager node and the plurality of compute nodes defining a first local cluster of a first computing environment, wherein nodes of the compute nodes defining the first local cluster have running thereon container based applications, wherein a first container based application runs on a first compute node of the plurality of compute nodes defining the first local cluster, and wherein a second compute node of the plurality of compute nodes defining the first local cluster runs a second container based application; wherein the manager node has received from an orchestrator availability data specifying a set of compute nodes available for hosting the first application.
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公开(公告)号:WO2020123446A2
公开(公告)日:2020-06-18
申请号:PCT/US2019/065380
申请日:2019-12-10
Applicant: MICRON TECHNOLOGY, INC.
Inventor: CHEN, Zhengang , MYLAVARAPU, Sai, Krishna , SHEN, Zhenlei , XIE, Tingjun , KWONG, Charles, S.
IPC: G06F3/06 , G06F11/07 , G06F11/073 , G06F11/076 , G06F11/1048 , G06F11/1068 , G06F11/141 , G06F2201/81 , G06F2201/835 , G11C16/26 , G11C16/32 , G11C16/3404 , G11C2029/0409 , G11C2029/0411 , G11C29/42 , G11C29/44 , G11C29/4401 , G11C29/50012 , G11C29/52
Abstract: Described herein are embodiments related to defect detection in memory components of memory systems with time-varying bit error rate. A processing device performs an error recovery flow (ERF) to recover a unit of data comprising data and a write timestamp indicating when the unit of data was written. The processing device determines whether to perform a defect detection operation to detect a defect in the memory component using a bit error rate (BER), corresponding to the read operation, and the write timestamp in the unit of data. The processing device initiates the defect detection operation responsive to the BER condition not being expected for the calculated W2R (based on the write timestamp). The processing device can use an ERF condition and the write timestamp to determine whether to perform the defect detection operation. The processing device initiates the defect detection operation responsive to the ERF condition not being expected the calculated W2R (based on the write timestamp).
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