中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

1492 records (took 0.033 seconds)

    Infrared spectrophotometer and auxiliary device
    195.
    发明专利
    Infrared spectrophotometer and auxiliary device 审中-公开
    红外分光光度计和辅助装置

    公开(公告)号：JP2010230370A

    公开(公告)日：2010-10-14

    申请号：JP2009076168

    申请日：2009-03-26

    Applicant: Shimadzu Corp ,  株式会社島津製作所

    Inventor： WADA KIYOSHI

    IPC: G01J3/02 ,  G01J3/42 ,  G01J3/45

    CPC classification number: G01N21/35 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/4535 ,  G01N21/15 ,  G01N21/3504 ,  G01N21/3563 ,  G01N21/3577 ,  G01N21/552 ,  G01N2021/3595 ,  G01N2201/0238

    Abstract: PROBLEM TO BE SOLVED: To prevent data measured by an infrared spectrophotometer from being adversely affected by moisture vapor. SOLUTION: An internal space receiving therein an optical system of an auxiliary device is sealed by providing tubes 35, 36 and the like to shield a space where measurement light passes from ambient air, and a dehumidifier 38 is provided in the space where the measurement light passes. The dehumidifier is disposed in a relatively narrow space, so that the space where the measurement light passes can be efficiently dehumidified within a short period of time so as to reduce humidity in the space to suppress absorption of moisture vapor which would otherwise occur on an optical path. This makes it possible to prevent a negative influence of moisture vapor on measurement data, while reducing a standby time due to the dehumidification. COPYRIGHT: (C)2011,JPO&INPIT

    Abstract translation: 要解决的问题：防止红外分光光度计测量的数据受到水汽的不利影响。 解决方案：在其中容纳辅助装置的光学系统的内部空间通过提供管子35,36等来密封，以屏蔽测量光从环境空气通过的空间，并且在空间中设置除湿器38 测量光通过。 除湿器设置在比较狭窄的空间中，使得测量光通过的空间可以在短时间内有效地除湿，以便减少空间中的湿度，以抑制在光学上会发生的湿气的吸收 路径。 这使得可以防止湿气对测量数据的负面影响，同时减少由于除湿引起的待机时间。 版权所有（C）2011，JPO＆INPIT

    Spectral measuring device
    196.
    发明专利
    Spectral measuring device 有权
    光谱测量装置

    公开(公告)号：JP2010151512A

    公开(公告)日：2010-07-08

    申请号：JP2008327845

    申请日：2008-12-24

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： IGUCHI KAZUYA ,  SUZUKI KENGO

    IPC: G01J3/02 ,  G01J1/02 ,  G01N21/01

    CPC classification number: G01N21/0332 ,  G01J3/0254 ,  G01J3/0286 ,  G01J3/0291 ,  G01N21/255 ,  G01N21/645 ,  G01N2201/065

    Abstract: PROBLEM TO BE SOLVED: To provide a spectral measuring device, simply and efficiently controlling a sample to a desired temperature. SOLUTION: This spectral measuring device 1A includes: an integrating sphere 20 for observing light to be measured emitted from a sample S to be measured; and a dewer 50 holding a medium R for controlling the temperature of the sample S to cover the sample S and whose second container 50b is located facing the interior of the integrating sphere 20. The dewer 50 holding the medium R to cover the sample S is thus used to thereby simply control the sample S to a desired temperature. The second container 50b is thus located facing the interior of the integrating sphere 20 to thereby control the temperature of the sample S by the medium R while controlling effect from an external environment of the integrating sphere 20 upon the sample S. Accordingly, the sample S can be efficiently controlled to a desired temperature. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题：为了提供光谱测量装置，简单且有效地将样品控制到期望的温度。 解决方案：该光谱测量装置1A包括：用于观察从待测样品S发射的待测光的积分球20; 以及保持用于控制样品S的温度以覆盖样品S并且其第二容器50b面向积分球20的内部的介质R的移液器50。保持介质R以覆盖样品S的脱水器50是 从而简单地将样品S控制到期望的温度。 因此，第二容器50b面向积分球20的内部，从而通过介质R控制样品S的温度，同时控制来自积分球20的外部环境对样品S的影响。因此，样品S 可以有效地控制到所需的温度。 版权所有（C）2010，JPO＆INPIT

    Spectroscopic module and its manufacturing method
    198.
    发明专利
    Spectroscopic module and its manufacturing method 审中-公开
    光谱模块及其制造方法

    公开(公告)号：JP2009300417A

    公开(公告)日：2009-12-24

    申请号：JP2008311020

    申请日：2008-12-05

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： SHIBAYAMA KATSUMI ,  YOSHINO TAKAFUMI ,  KASAHARA TAKASHI ,  ITO MASASHI ,  UI ANNA

    IPC: G01J3/18 ,  G01J3/36 ,  G02B7/00

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/0297 ,  G01J2003/1213 ,  G02B5/1814 ,  G02B7/025 ,  Y10T156/10

    Abstract: PROBLEM TO BE SOLVED: To provide a spectroscopic module manufacturing method and a spectroscopic module capable of making light appropriately incident onto a main body part. SOLUTION: A photo-detection unit 10 constituted by pasting a photo-detection element 5 and a light transmission plate 56 to each other is pasted to the front surface 2a of a substrate 2 by an optical plastic agent 63 in the method for manufacturing the spectroscopic module 1. Since a light passage hole 50 of the photo-detection element 5 is covered with the light transmission plate 56 at this time, the optical plastic agent 63 is prevented from entering the light passage hole 50. Since the light passage hole 50 is formed in a semiconductor substrate 91 after the semiconductor substrate 91 provided with a photo-detection part 5a and the light transmission plate 56 are pasted to each other at the preparation of the photo-detection unit 10, it is possible to reliably prevent anything that could cause the occurrence of refraction, scattering, etc. from entering the light passage hole 50. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种能够适当地入射到主体部分上的光的光谱模块制造方法和分光模块。 解决方案：通过将光检测元件5和透光板56彼此粘贴而构成的光检测单元10通过光学塑料剂63粘贴到基板2的前表面2a上， 由于光检测元件5的光通过孔50此时被透光板56覆盖，所以防止光学塑料剂进入光通路孔50.由于光通过 在准备光电检测单元10时，在设置有光检测部分5a和透光板56的半导体基板91彼此粘贴之后，在半导体基板91中形成孔50，可以可靠地防止 任何可能导致折射，散射等进入光通过孔50的物体。（C）2010，JPO＆INPIT

    Spectrometer
    199.
    发明专利
    Spectrometer 有权
    光谱仪

    公开(公告)号：JP2009257998A

    公开(公告)日：2009-11-05

    申请号：JP2008109044

    申请日：2008-04-18

    Applicant: Yokogawa Electric Corp ,  横河電機株式会社

    Inventor： YAMAMOTO TOMOKAZU ,  KANEKO TSUTOMU ,  KOJIMA MANABU

    IPC: G01J3/18 ,  G01J3/22 ,  G01J3/36 ,  G02B13/00 ,  G02B17/08

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0286 ,  G01J3/0291

    Abstract: PROBLEM TO BE SOLVED: To provide a spectrometer for excellently holding wavelength resolution to change of environmental temperature without using specific materials on a board fixing optical components.
    SOLUTION: The spectrometer for receiving light with a light receiving element is improved by wavelength dispersing light to be measured with a wavelength dispersion element. The spectrometer includes: first combination lenses comprising a plurality of lenses and for being emitted to the wavelength dispersion element by making parallel light of the light to be measured; second combination lenses comprising a plurality of lenses and for being received with the light receiving element by condensing the light to be measured, wavelength-dispersed with the wavelength dispersion element; and a board fixing the wavelength dispersion element, the first combination lenses, and the second combination lenses. A linear expansion coefficient of a composite focal distance of the first combination lenses, a linear expansion coefficient of a composite focal distance of the second combination lenses and a linear expansion coefficient of materials forming the board are made substantially equal.
    COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种用于在不固定光学元件的板上固定波长分辨率以改变环境温度的光谱仪。 解决方案：通过用波长色散元件波长分散待测光，提高了用光接收元件接收光的光谱仪。 该光谱仪包括：包括多个透镜的第一组合透镜，并通过使待测光的平行光发射到波长色散元件; 第二组合透镜，其包括多个透镜，并且通过使被测光与所述波长分散元件进行波长分散而使所述受光元件收敛; 以及固定波长色散元件，第一组合透镜和第二组合透镜的板。 第一组合透镜的复合焦距的线膨胀系数，第二组合透镜的复合焦距的线膨胀系数和形成板的材料的线膨胀系数基本相等。 版权所有（C）2010，JPO＆INPIT

    Colorimetry unit
    200.
    发明专利
    Colorimetry unit 有权
    彩色单元

    公开(公告)号：JP2009133848A

    公开(公告)日：2009-06-18

    申请号：JP2008285983

    申请日：2008-11-06

    Applicant: Byk-Gardner Gmbh ,  ベーユプスィロンカー−ガードネル ゲーエムベーハー

    Inventor： SPERLING UWE ,  PETER SCHWARZ

    IPC: G01J3/50 ,  G01N21/01

    CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0297 ,  G01J3/52 ,  G01J3/524

    Abstract: PROBLEM TO BE SOLVED: To provide a method and device for determining a surface characteristic. SOLUTION: A colorimetry unit 1 includes a radiation device 2 for radiating light onto a surface 9 to be inspected. The radiation device has at least one light source 6 of semiconductor base, and a radiation detecting device 12 for receiving at least a part of light scattered by the surface 9 and outputting the signal characteristic of this light. The radiation detecting device 12 allows spectral analysis of the incoming light. The colorimetry unit 1 has at least one sensor device 10 for determining at least one electric parameter of the light source 6, and a processor device 14 for outputting at least one value U D and I D indicating the feature of the light radiated by the radiation device 2 from the measured parameter. COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种用于确定表面特性的方法和装置。 解决方案：比色单元1包括用于将光照射到待检查的表面9上的辐射装置2。 辐射装置具有半导体基底的至少一个光源6和用于接收由表面9散射的光的至少一部分并输出该光的信号的辐射检测装置12。 放射线检测装置12允许入射光的光谱分析。 比色单元1具有用于确定光源6的至少一个电参数的至少一个传感器装置10和用于输出至少一个值U SB SB D 从测量参数指示由辐射装置2辐射的光的特征。 版权所有（C）2009，JPO＆INPIT

Patent Agency Ranking