光特性測定装置
    201.
    发明专利
    光特性測定装置 有权
    光学特性测量装置

    公开(公告)号:JPWO2014162547A1

    公开(公告)日:2017-02-16

    申请号:JP2015509798

    申请日:2013-04-03

    CPC classification number: G01J3/0216 G01J1/0422 G01J3/0254 G01J2001/0481

    Abstract: より正確な測定値を得ることができる光特性測定装置を提供する。光特性測定装置1は、入射した光を拡散反射する積分球内部表面3aを有する積分球2と、測定対象物101が出射した光を、通過及び反射させて、前記積分球に導光する導光部と、を備え、導光部は、積分球側及び測定対象物101側以外の面は、光を正反射するように形成されている。

    Abstract translation: 提供一种能够获得更精确的测量的光学特性测量装置。 光学特性测量装置1包括具有积分球内表面3a,以漫反射入射光的积分球2中,光测量对象101被发射时,通过并反射,它被引导到积分球引导 包括光学单元,所述导光部,比101积分球侧以外的表面和测量对象被形成为正反射光。

    Reference light source for calibration, and calibration system using the same
    204.
    发明专利
    Reference light source for calibration, and calibration system using the same 有权
    用于校准的参考光源和使用其的校准系统

    公开(公告)号:JP2009052978A

    公开(公告)日:2009-03-12

    申请号:JP2007218791

    申请日:2007-08-24

    Inventor: IMURA KENJI

    Abstract: PROBLEM TO BE SOLVED: To easily allow precise calibration in a user side, without using a black-body radiation light source such as an A light source, in a reference light source for the calibration used for calibrating wavelengths and sensitivities of a spectral luminance meter and the spectral illuminance meter.
    SOLUTION: This reference light source for the calibration uses a plurality of single wavelength light sources emitting respectively reference lights of single wavelengths different each other. A control processing means 5 measures not only an intensity by an intensity monitoring sensor 4, but also a wavelength by a wavelength monitoring spectrometer 3, and finds a reference brightness by an intensity-brightness converting data. The reliability of the obtained reference brightness is enhanced thereby, the sensitivity of the spectral luminance meter 101 to be calibrated is corrected with high precision and reliability, in the user side, the reference light source can use, as the single wavelength light sources, inexpensive LEDs 21-27 capable of providing a large number of wavelengths, and capable of arranging reference wavelengths with a density required for securing the precision of a correction factor by interpolation, and the correction precision is thereby enhanced over the whole measuring wavelength range.
    COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题:为了容易地允许用户侧的精确校准,而不使用诸如A光源的黑体辐射光源,在用于校准波长的校准的参考光源和用于校准波长的灵敏度 光谱亮度计和光谱照度计。 解决方案:用于校准的该参考光源使用多个单个波长光源发射分别彼此不同的单个波长的参考光。 控制处理装置5不仅测量强度监测传感器4的强度,而且测量波长监测光谱仪3的波长,并通过强度 - 亮度转换数据求出参考亮度。 所获得的参考亮度的可靠性得到提高,因此,校正光谱亮度计101的灵敏度以高精度和可靠性被校正,在用户侧,参考光源可以使用作为单波长光源的廉价 LED 21-27能够提供大量的波长,并且能够布置具有通过插值确保校正因子精度所需的密度的参考波长,从而在整个测量波长范围内增强校正精度。 版权所有(C)2009,JPO&INPIT

    Spectrometry device and spectrometry method

    公开(公告)号:US09952101B2

    公开(公告)日:2018-04-24

    申请号:US15531772

    申请日:2015-11-19

    Abstract: A spectroscopic measurement apparatus includes a light source, an integrator, a first spectroscopic detector, a second spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, and a sample attachment portion for attaching the measurement object. The first spectroscopic detector receives the light output from the integrator, disperses the light of a first wavelength region, and acquires first spectrum data. The second spectroscopic detector receives the light output from the integrator, disperses the light of a second wavelength region, and acquires second spectrum data. The first wavelength region and the second wavelength region include a wavelength region partially overlapping each other.

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