LASER SCANNING MICROSCOPE APPARATUS
    205.
    发明申请
    LASER SCANNING MICROSCOPE APPARATUS 审中-公开
    激光扫描显微镜设备

    公开(公告)号:US20160306152A1

    公开(公告)日:2016-10-20

    申请号:US15132053

    申请日:2016-04-18

    Abstract: A laser scanning microscope apparatus includes an irradiation unit including an objective lens, a photodetector unit, an XY-scanning unit, and a Z-scanning unit. The irradiation unit focuses a laser beam with the objective lens to a specimen. The photodetector unit detects light generated from a position irradiated with the laser beam focused. The XY-scanning unit scans the laser beam in an X-direction perpendicular to an optical axis of the objective lens and in a Y-direction perpendicular to the optical axis and the X-direction. The Z-scanning unit scans the laser beam in a Z-direction parallel to the optical axis. When acquiring XY-two-dimensional image data by detecting the light while scanning the irradiated position in the X-direction and the Y-direction, the apparatus detects the light while scanning the irradiated position also in the Z-direction.

    Abstract translation: 激光扫描显微镜装置包括具有物镜,光电检测器单元,XY扫描单元和Z扫描单元的照射单元。 照射单元将具有物镜的激光束聚焦到样本。 光检测器单元检测从被聚焦的激光束照射的位置产生的光。 XY扫描单元在垂直于物镜的光轴的X方向和垂直于光轴和X方向的Y方向扫描激光束。 Z扫描单元沿平行于光轴的Z方向扫描激光束。 当通过在X方向和Y方向扫描照射位置时检测光来获取XY二维图像数据时,该装置也在沿Z方向扫描照射位置的同时检测光。

    Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection
    206.
    发明授权
    Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection 有权
    光学分析装置,光学分析方法和使用单个发光粒子检测的光学分析的计算机程序

    公开(公告)号:US09423349B2

    公开(公告)日:2016-08-23

    申请号:US14178442

    申请日:2014-02-12

    Abstract: In the scanning molecule counting method detecting light of a light-emitting particle in a sample solution using a confocal or multiphoton microscope, there is provided an optical analysis technique enabling the scanning in a sample solution with moving a light detection region in a broader area or along a longer route while making the possibility of detecting the same light-emitting particle as different particles as low as possible and remaining the size or shape of the light detection region unchanged as far as possible. In the inventive optical analysis technique, there are performed detecting light from the light detection region and generating time series light intensity data during moving the light detection region along the second route whose position is moved along the first route, and thereby, the signal indicating light from each light-emitting particle in a predetermined route is individually detected using the time series light intensity data.

    Abstract translation: 在使用共聚焦或多光子显微镜检测样品溶液中的发光粒子的光的扫描分子计数方法中,提供了一种光学分析技术,其能够在较宽区域中移动光检测区域的样品溶液中进行扫描,或 沿着较长的路线,同时尽可能地检测与不同粒子相同的发光粒子的可能性,并尽可能地保持光检测区域的尺寸或形状不变。 在本发明的光学分析技术中,在沿着沿第一路线移动位置的第二路径移动光检测区域的同时,进行来自光检测区域的检测光并产生时间序列光强度数据,由此,指示光 使用时间序列光强度数据分别检测来自预定路线中的每个发光粒子。

    METHOD AND APPARATUS FOR DETECTING A TRENCH CREATED IN A THIN FILM SOLAR CELL
    209.
    发明申请
    METHOD AND APPARATUS FOR DETECTING A TRENCH CREATED IN A THIN FILM SOLAR CELL 有权
    用于检测在薄膜太阳能电池中产生的TRENCH的方法和装置

    公开(公告)号:US20150185162A1

    公开(公告)日:2015-07-02

    申请号:US14555190

    申请日:2014-11-26

    Inventor: Ryogo HORII

    Abstract: A method and an apparatus for precisely detecting a trench S in a product W to become a thin film solar cell are provided. In the product W, a lower electrode layer 12, in which the trench S is created, and light absorbing layers 13 and 14 are layered on a substrate 11 in this order. The method includes the steps of: detecting infrared rays for imaging, of which the wavelengths are in such a range that can transmit through the light absorbing layers 13 and 14 and which are irradiated from the product W, by means of an infrared ray imaging apparatus 16 that is provided above the light absorbing layers 13 and 14 so that image data for radiation intensity distribution can be taken; and detecting the trench S in the lower electrode layer 12 on the basis of this image data for radiation intensity distribution.

    Abstract translation: 提供了一种用于精确检测产品W中的沟槽S以成为薄膜太阳能电池的方法和装置。 在产品W中,产生沟槽S的下电极层12和光吸收层13和14依次层叠在基板11上。 该方法包括以下步骤:通过红外线成像装置检测波长处于可透过光吸收层13和14并从产品W照射的范围内的成像用红外线 16,其设置在光吸收层13和14的上方,使得可以拍摄用于辐射强度分布的图像数据; 并且根据该用于辐射强度分布的图像数据检测下电极层12中的沟槽S.

    METHODS AND APPARATUS TO OBTAIN SUSPENDED PARTICLE INFORMATION
    210.
    发明申请
    METHODS AND APPARATUS TO OBTAIN SUSPENDED PARTICLE INFORMATION 有权
    获取悬浮粒子信息的方法和设备

    公开(公告)号:US20150070696A1

    公开(公告)日:2015-03-12

    申请号:US14490129

    申请日:2014-09-18

    Abstract: An apparatus for obtaining suspended particle information includes an optical array to divide light to a first path and a second path, a platform to orient a first and second container with either the first or second path, and a first and second photodetector to receive at least a direct illuminating component of the light of the first and second path after said light penetrates through the first and second container. A detector interface receives transmission signals from the first and second photodetectors of the direct illuminating component of the light after penetrating through the first and second container and a calculation engine computes the particle information based on a ratio of the received transmission signals.

    Abstract translation: 一种用于获得悬浮粒子信息的装置包括:将光分成第一路径和第二路径的光学阵列,用于使具有第一或第二路径的第一和第二容器定向的平台,以及第一和第二光电检测器,以至少接收 在所述光穿过第一和第二容器之后第一和第二路径的光的直接照明分量。 检测器接口在穿透第一和第二容器之后接收来自光的直接照明部件的第一和第二光电检测器的传输信号,并且计算引擎基于所接收的传输信号的比率来计算粒子信息。

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