公开(公告)号：US20230400478A1

公开(公告)日：2023-12-14

申请号：US18327148

申请日：2023-06-01

Applicant: CHROMA ATE INC.

Inventor： I-Shih TSENG ,  Chin-Yi OUYANG ,  I-Ching TSAI ,  Xin-Yi WU ,  Yan-Lin WU

IPC: G01R1/04

CPC classification number: G01R1/0458

Abstract: A liquid cooling system, a liquid cooling method, and an electronic device-testing apparatus having the system are disclosed. When an electronic device is accommodated in a chip slot of a test socket, a cooling liquid supply device supplies a cooling liquid to the chip slot through a fluid inlet portion, and the cooling liquid at least flows over parts of the upper and lower surfaces of the electronic device and then flows out from a fluid outlet portion. The chip slot of the test socket serves as the flow space for the cooling liquid so that the cooling liquid can flow over the upper and lower surfaces of the electronic device, and the electronic device can be immersed in the continuously flowing cooling liquid. The flowing cooling liquid can also take away foreign matter, avoiding the influence of the foreign matter on the test.

公开(公告)号：US11705833B2

公开(公告)日：2023-07-18

申请号：US17697978

申请日：2022-03-18

Applicant: CHROMA ATE INC.

Inventor： Yu-Ting Lin ,  Cheng-Tsung Lin

IPC: H02P21/22 ,  H02P6/08 ,  H02P25/026 ,  H02P9/00

CPC classification number: H02P6/08 ,  H02P9/009 ,  H02P25/026

Abstract: The present application discloses a motor controller, a motor control method and a computer program product for vehicle assist control. An assist torque command for a motor device to perform vehicle assist control is generated according to an execution command of a vehicle assist determination unit and a rotor position signal and a rotor speed signal of a motor device. An original position signal of the motor device and the rotor position signal are calculated, and a position ratio calculation is performed to generate a front-order torque command. A torque damping command is generated according to the speed ratio calculation based on the rotor speed signal, and is calculated with the front-order torque command to generate an assist torque command. Thus, position information of the rotor of the motor device can be directly used in the calculation and speed information is at the same time used for an assist calculation, thereby preventing an error and solving the issue of sliding during parking.

公开(公告)号：US11630147B2

公开(公告)日：2023-04-18

申请号：US17551246

申请日：2021-12-15

Applicant: CHROMA ATE INC.

Inventor： Ming Cheng Huang ,  Tsung-I Lin ,  Hui-Jung Wu ,  Chien-Ming Chen

IPC: G01R31/28 ,  G01R1/04

Abstract: The present invention relates to a low-thermal resistance pressing device for a socket, which mainly comprises a housing, an inner collar, a heat conductive pressing block, a bearing collar and a locking member. The locking member on the housing is used to lock the socket. The inner collar is threadedly engaged with the housing. The bearing collar is located between the inner collar and the heat conductive pressing block. In the case of rotating the inner collar in the housing, the bearing collar drives the heat conductive pressing block to move axially so as to exert an axial force to a device to be tested. Because the heat conductive pressing block protrudes from the upper and lower surfaces of the housing, one end thereof can be in contact with a temperature control module, and the other end thereof can be in contact with the device to be tested.

公开(公告)号：US20220157639A1

公开(公告)日：2022-05-19

申请号：US17521952

申请日：2021-11-09

Applicant: Chroma Ate Inc.

Inventor： CHIEN-MING CHEN ,  CHIN-YI OUYANG

IPC: H01L21/683 ,  H01L21/677

Abstract: The present invention relates to a chip transfer device capable of floatingly positioning a chip and a method for floatingly positioning a chip. When a chip is placed in a chip socket, a control unit controls an air pressure switching valve to allow at least one vent hole to be communicated with a positive air pressure source. An air flow from the positive air pressure source blows a lower surface of the chip through the vent hole, so that the at least one chip is air-floated. Accordingly, when the chip socket is communicated with the positive air pressure source, the air flow blows the lower surface of the chip in the chip socket through the vent hole, so that the chip is air-floated in the chip socket to reduce the error displacement of the chip offset.

公开(公告)号：US20220136970A1

公开(公告)日：2022-05-05

申请号：US17476595

申请日：2021-09-16

Applicant: CHROMA ATE INC.

Inventor： HSUAN-AN CHEN ,  CHI-MING WEN

IPC: G01N21/64 ,  G01J3/44 ,  G01J3/02

Abstract: A fluorescence detection system is provided and adapted to provide a selectable excitation beam to an optical transmission path for irradiation of a device under test, including a driving module, a lighting module, a first optical module and a second optical module. The driving module includes a first shaft and a second shaft parallel thereto. The lighting module is fixed to the first shaft. The first optical module and the second optical module are fixed to the second shaft. A driving operation enables the driving module to rotate the lighting module, the first optical module and the second optical module simultaneously, determining quickly a combination of one light source, one filter and one spectroscopic module on the optical transmission path, with the combination corresponding in position to the device under test, so as to reduce the volume and cost the fluorescence detection system.

公开(公告)号：US11061067B2

公开(公告)日：2021-07-13

申请号：US16509671

申请日：2019-07-12

Applicant: Chroma Ate Inc.

Inventor： Xin-Yi Wu

IPC: G01R31/28

Abstract: An apparatus and a method provide a high temperature test and a low temperature test. The apparatus mainly includes a depressing head and a test base, wherein the depressing head includes a cooling module, a heating module, and a heat dissipation module therein, the heat dissipation module includes a finned heat sink and a heat conduction member, and the heat conduction member is thermally coupled to the heating module and the finned heat sink. When the low temperature test is performed, an electronic component is cooled by filling liquid nitrogen into the cooling module of the depressing head. When the high temperature test is performed, the electronic component is heated by the heating module. If the temperature of the electronic device is higher than a predetermined high temperature, the electronic device is cooled by the heat dissipation module.

公开(公告)号：US20210197405A1

公开(公告)日：2021-07-01

申请号：US17063752

申请日：2020-10-06

Applicant: Chroma Ate Inc.

Inventor： Chien-Ming CHEN ,  Meng-Kung LU ,  Ming-Yuan HUANG

IPC: B25J17/02 ,  B25J15/06 ,  B25J9/10

Abstract: A rotatable cushioning pick-and-place device primarily comprises a motor, a body, a cushioning module and a pick-and-place module. The cushioning module is disposed in a first chamber of the body and comprises a rotary bearing which is connected to a drive shaft of the motor, and coupled to a driven shaft sleeve through a rotary follower. The rotary follower is driven by the rotary bearing to drive the driven shaft sleeve to rotate, thereby allowing the rotary bearing to displace relative to the driven shaft sleeve axially. The cushioning spring is arranged between the rotary bearing and the driven shaft sleeve. A first sealing ring and a second sealing ring of the pick-and-place module are fixed on the body to cooperatively and air-tightly seal the second chamber.

公开(公告)号：US10890624B2

公开(公告)日：2021-01-12

申请号：US16180158

申请日：2018-11-05

Applicant: CHROMA ATE INC.

Inventor： Chuan-Tse Lin ,  Ming-Tsung Liu ,  Kuan-Chen Chen ,  Chien-Po Lin

IPC: G01R31/36 ,  H01M10/48 ,  G01R31/387 ,  G01R31/396 ,  H01M10/44

Abstract: A testing fixture for a cell temperature probe includes a microcomputer, a temperature probe, a measurement case, a temperature instrument and heaters. The microcomputer configured to receive a control command for executing a testing process. The measurement case has an outer surface and an inner surface. The outer surface includes a probe-contacting area used for being contacted by the cell temperature probe within a formation device in the testing process. The temperature instrument is electrically connected to the microcomputer and has a sensing terminal disposed on the inner surface of the measurement case. The location of the sensing terminal is aligned with the probe-contacting area in a direction of a thickness of the measurement case. The heaters are electrically connected to the microcomputer and thermally to the measurement case.

公开(公告)号：US20200211199A1

公开(公告)日：2020-07-02

申请号：US16693360

申请日：2019-11-24

Applicant: CHROMA ATE INC.

Inventor： Ting-Wei CHEN ,  Yu-Hsin LIU ,  Ming-Kai HSUEH

IPC: G06T7/174 ,  G06T7/11 ,  G06T7/00 ,  G06T7/90

Abstract: An image inspection method includes capturing a target object image, which the target object image comprises a plurality of graphical features; choosing a block image comprising a specific graphical feature of the plurality of graphical features from the target object image; capturing all the graphical features of the block image to obtain a region of interest (ROI); executing a filtering process or a recovering process on the ROI to obtain a pre-processed region; and inspecting, according to the pre-processed region, the target object image to determine whether the target object image has defects.

公开(公告)号：US20200081060A1

公开(公告)日：2020-03-12

申请号：US16559701

申请日：2019-09-04

Applicant: Chroma Ate Inc.

Inventor： Chin-Yi Ouyang ,  Chien-Ming Chen ,  Meng-Kung Lu

IPC: G01R31/28 ,  G01R1/04

Abstract: The invention relates to a sliding test device for electronic components, which mainly comprises a base, a sliding frame and a pressing member, wherein an electronic component to be tested is placed in a chip receiving module of the base, and the sliding frame is slidably moved with respect to the base under sliding engagement between a first sliding guide and a second sliding guide so that a pressing block of the pressing member is aligned with the electronic component presses the electronic component. According to the present invention, the pressing member presses the electronic component and exerts a sufficient contact force on the electronic component, and a reaction force caused by the contact force and the elastic restoring force of probes is internally balanced in the device.