Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method

    公开(公告)号:US10921241B2

    公开(公告)日:2021-02-16

    申请号:US15532896

    申请日:2016-04-27

    Abstract: An oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device may include: a microchannel structure which has a support, a substrate which is formed on the support and made of a semiconductor or dielectric material, a cover part which has a prism structure and is installed on the support, and a microchannel which is formed in any one of an upper portion of the support and a lower end of the cover part; a sample injection part which forms an adsorption layer for a sample on a substrate by injecting a buffer solution containing the sample made of a biomaterial into the microchannel; a polarized light generation part which emits polarized incident light through an incident surface of the prism to the adsorption layer at an incident angle that satisfies a p-wave antireflection condition; and a polarized light detection part.

    APPARATUS AND METHOD FOR DETECTING COMPOSITE MATERIAL DAMAGE DUE TO IMPACT BY USING DISTRIBUTED OPTICAL FIBERS

    公开(公告)号:US20200340871A1

    公开(公告)日:2020-10-29

    申请号:US16961160

    申请日:2019-01-10

    Abstract: An apparatus and method for detecting composite material damage due to impact by using distributed optical fiber are disclosed. In the apparatus and method for detecting composite material damage due to impact by using distributed optical fiber, the position and level of damage occurring in a composite material due to low-velocity impact can be effectively and economically detected by measuring the residual strain of optical fiber distributed on the surface of the composite material or inside the composite material. In the apparatus and method for detecting composite material damage due to impact by using distributed optical fiber, there is no need to always operate a sensor in real time, so that detection errors due to temporary failures, malfunctions, etc. of the sensor, as well as a problem of constantly supplying power to the sensor, can be essentially removed.

    Electromagnetic wave impedance measuring apparatus and calibration method of impedance

    公开(公告)号:US10802064B2

    公开(公告)日:2020-10-13

    申请号:US16332349

    申请日:2016-10-27

    Abstract: An electromagnetic wave impedance measuring apparatus includes a network analyzer, configured to measure scattering parameters according to a frequency, including a first port and a second port; and a multilayer substrate, connected to the first port and the second port by a coaxial cable, having a via connecting conductive layers to each other and including three or more conductive layers including at least an uppermost layer, a lowermost layer, and an intermediate layer. The multilayer substrate includes a test sample disposed between the uppermost layer and the lowermost layer; a through calibration standard disposed between the uppermost layer and the lowermost layer; a reflect calibration standard disposed between the uppermost layer and the lowermost layer; and a line calibration standard disposed between the uppermost layer and the lowermost layer. Each of the test sample, the through calibration standard, the reflect calibration standard, and the line calibration standard is connected by a first error box, having the via, and a second error box having the via of the same structure as the via of the first error box.

    Plasma Generation Apparatus
    217.
    发明申请

    公开(公告)号:US20190355558A1

    公开(公告)日:2019-11-21

    申请号:US16461687

    申请日:2018-01-02

    Abstract: A plasma generation apparatus includes a plasma generation unit. The plasma generation unit has a spherical or elliptical cavity. The plasma generation unit receives radio-frequency (RF) power in such a manner that bounce resonance of electrons is performed to generate plasma in the cavity. The cavity has a plasma extraction hole to communicate with an external space.

    Magnetic field sensor and apparatus for measuring magnetic field

    公开(公告)号:US10466313B2

    公开(公告)日:2019-11-05

    申请号:US15534861

    申请日:2015-11-18

    Abstract: A magnetic field sensor of the present invention includes a first electrode including a magnetic material, a second electrode including a non-magnetic material, a common electrode disposed between the first electrode and the second electrode and connected to a ground terminal, a power supplier of which one end is connected to the first electrode and the second electrode and of which another end is connected to the common electrode to supply power of a frequency band required, a variable resistor configured to control at least one of a resistance value between the first electrode and the power supplier or a resistance value between the second electrode and the power supplier, and a differential amplifier connected to the first electrode through a positive terminal and connected to the second electrode through a negative terminal to output a difference value between a first capacitance generated by the first electrode and a second capacitance generated by the second electrode in response to external application of a magnetic field.

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