公开(公告)号：US08411269B2

公开(公告)日：2013-04-02

申请号：US13545445

申请日：2012-07-10

Applicant: Katsumi Shibayama ,  Helmut Teichmann ,  Tomofumi Suzuki ,  Dietmar Hiller ,  Ulrich Starker

Inventor： Katsumi Shibayama ,  Helmut Teichmann ,  Tomofumi Suzuki ,  Dietmar Hiller ,  Ulrich Starker

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0202 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/2803

Abstract: In the spectroscopy module 1, a light detecting element 4 is provided with a light passing opening 4b through which light made incident into a body portion 2 passes. Therefore, it is possible to prevent deviation of the relative positional relationship between the light passing opening 4b and a light detection portion 4a of the light detecting element 4. Further, an optical element 7, which guides light made incident into the body portion 2, is arranged at the light passing opening 4b. Therefore, light, which is to be made incident into the body portion 2, is not partially blocked at a light incident edge portion of the light passing opening 4b, but light, which is to be made incident into the body portion 2, can be guided securely. Therefore, according to the spectroscopy module 1, it is possible to improve the reliability.

公开(公告)号：US20120241615A1

公开(公告)日：2012-09-27

申请号：US13405804

申请日：2012-02-27

Applicant: Hiroto TOMIOKA

Inventor： Hiroto TOMIOKA

IPC: G01J5/02

CPC classification number: G01J5/085 ,  G01J3/0243 ,  G01J3/42 ,  G01J5/046 ,  G01J5/0831 ,  G01J5/0862 ,  H01P1/2005

Abstract: A terahertz wave detection device includes a wavelength filter transmitting terahertz waves having a predetermined wavelength, and a detection portion detecting the terahertz waves having the predetermined wavelength that have passed through the wavelength filter by converting the terahertz waves into heat, wherein the wavelength filter includes a metal layer having a plurality of holes communicating with an incident surface onto which the terahertz waves are incident and an emission surface from which the terahertz waves having the predetermined wavelength are emitted, and a dielectric portion filling in the plurality of holes and made of a dielectric, wherein the plurality of holes are formed with a predetermined pitch along a direction that is perpendicular to a normal line of the incident surface.

Abstract translation: 一种太赫兹波检测装置包括：发送具有预定波长的太赫兹波的波长滤波器，以及检测部分，通过将太赫兹波转换成热量来检测已经通过波长滤波器的具有预定波长的太赫兹波，其中波长滤波器包括 金属层具有多个与太赫波入射的入射面连通的孔，并且发射出具有预定波长的太赫兹波的发射面，以及填充在多个孔中并由电介质构成的电介质部 ，其中所述多个孔沿着垂直于入射表面的法线的方向以预定间距形成。

公开(公告)号：US20120105845A1

公开(公告)日：2012-05-03

申请号：US13275698

申请日：2011-10-18

Applicant: Esko Herrala

Inventor： Esko Herrala

IPC: G01J3/28

CPC classification number: G01J3/021 ,  G01J3/0208 ,  G01J3/0243

Abstract: Optical radiation from a sample is received by the slit and it is passed through an aperture in a reflective plane of a folding mirror towards a curved reflective surface of a collimating mirror. The slit and the curved reflective surface have a common optical axis. The reflective plane and the curved reflective surface face each other. The optical radiation passed through the folding mirror is collimated by the curved reflective surface. The collimated optical radiation is directed to the reflective plane of the folding mirror by the curved reflective surface. The collimated optical radiation is reflected in a direction other than the common optical axis of the slit and the curved reflective surface by the reflective plane.

Abstract translation: 来自样品的光辐射由狭缝接收，并且将其穿过折射镜的反射平面中的孔朝向准直镜的弯曲反射表面。 狭缝和弯曲的反射表面具有共同的光轴。 反射面和弯曲反射面相互面对。 通过折叠镜的光学辐射被弯曲的反射表面准直。 准直光学辐射通过弯曲的反射表面被引导到折叠反射镜的反射平面。 准直光学辐射沿着狭缝的共同光轴和反射平面的弯曲反射表面以外的方向反射。

公开(公告)号：US20120092678A1

公开(公告)日：2012-04-19

申请号：US13333351

申请日：2011-12-21

Applicant: Noam Babayoff

Inventor： Noam Babayoff

IPC: G01B11/24

CPC classification number: H04N13/15 ,  A61B1/00009 ,  A61B1/00096 ,  A61B1/0615 ,  A61B1/0638 ,  A61B1/0646 ,  A61B1/0676 ,  A61B1/0684 ,  A61B1/24 ,  A61B1/247 ,  A61B5/0068 ,  A61B5/0088 ,  A61B5/1077 ,  A61B5/1079 ,  A61C9/0053 ,  A61C9/0066 ,  A61C19/04 ,  G01B11/24 ,  G01B11/25 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/10 ,  G01J3/462 ,  G01J3/50 ,  G01J3/501 ,  G01J3/508 ,  G01J3/51 ,  G01N21/255 ,  G06F19/00 ,  G06T7/0012 ,  G06T7/12 ,  G06T7/90 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/30036 ,  H01L27/14868 ,  H04N13/207 ,  H04N13/257 ,  H04N13/271 ,  H04N13/296

Abstract: Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract translation: 提供了一种用于确定诸如齿段的结构的表面拓扑结构和相关联颜色的装置，所述结构包括扫描器，用于为沿着与深度方向基本正交的二维阵列的点提供深度数据;以及图像获取装置， 为阵列的每个点提供颜色数据，同时相对于结构的设备的空间布置基本上保持不变。 处理器组合阵列中每个点的颜色数据和深度数据，从而提供结构表面的三维颜色虚拟模型。 还提供了用于确定结构的表面拓扑和相关联颜色的相应方法。

公开(公告)号：US08018591B2

公开(公告)日：2011-09-13

申请号：US12465276

申请日：2009-05-13

Applicant: Katsumi Shibayama ,  Tomofumi Suzuki

Inventor： Katsumi Shibayama ,  Tomofumi Suzuki

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/0297

Abstract: In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is bonded to a front plane 2a of a substrate 2 with an optical resin adhesive 63. Thus, it is possible to reduce a stress generated onto the light detecting element 5 due to a thermal expansion difference between the light detecting element 5 and the substrate 2. Additionally, on the light detecting element 5, a first pool portion 101 is formed so as to be located at least between the light detecting portion 5a and the light passing hole 50 when viewed from a direction substantially perpendicular to the front plane 2a. Thus, when the light detecting element 5 is attached to the substrate 2 via the optical resin adhesive 63, the optical resin adhesive 63 is pooled to remain at the first pool portion 101. Thus, the optical resin adhesive 63 is prevented from penetrating into the light passing hole 50.

Abstract translation: 在光谱模块1中，在光检测元件5中形成有通过向分光部4前进的光L1通过的光通过孔50.因此，能够防止光通过孔50与 光检测元件5的光检测部分5a偏离。 此外，光检测元件5利用光学树脂粘合剂63接合到基板2的前面2a。因此，可以减少由于光的热膨胀差而在光检测元件5上产生的应力 检测元件5和基板2.此外，在光检测元件5上，当从基本上垂直的方向观察时，第一池部分101形成为至少位于光检测部分5a和光通过孔50之间 到前平面2a。 因此，当光检测元件5通过光学树脂粘合剂63附着到基板2上时，将光学树脂粘合剂63汇集以保持在第一池部101处。因此，防止光学树脂粘合剂63渗透到 光通过孔50。

公开(公告)号：US07990538B2

公开(公告)日：2011-08-02

申请号：US12447595

申请日：2007-11-01

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N31/12

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US20110122408A1

公开(公告)日：2011-05-26

申请号：US12992456

申请日：2009-05-07

Applicant: Katsumi Shibayama ,  Takafumi Yokino

Inventor： Katsumi Shibayama ,  Takafumi Yokino

IPC: G01J3/18

CPC classification number: G02B7/022 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/18 ,  G01J3/2803

Abstract: The present invention provides a highly reliable spectral module. The spectral module (1) of the present invention comprises a substrate (2) for transmitting therethrough light incident on one surface (2a); a lens unit (3), having an entrance surface (3a) opposing the other surface (2b) of the substrate (2), for transmitting therethrough the light entering from the entrance surface (3a) after passing through the substrate (2); a spectroscopic unit (4), formed with the lens unit (3), for spectrally resolving and reflecting the light having entered the lens unit (3); a photodetector (4) for detecting the light reflected by the spectroscopic unit (4); and a support unit (8), disposed between the other surface (2b) and the entrance surface (3a), for supporting the lens unit (3) against the substrate (2). Since the support unit (8) forms a gap between the other surface (2b) and the entrance surface (3a) in the spectral module (1), the other surface (2b) and the entrance surface (3a) are prevented from coming into contact with each other and causing damages, whereby the spectral module (1) can improve its reliability.

Abstract translation: 本发明提供了一种高度可靠的光谱模块。 本发明的光谱模块（1）包括用于透射入射在一个表面（2a）上的光的衬底（2）; 具有与所述基板（2）的另一个表面（2b）相对的入射面（3a）的透镜单元（3），用于透过从所述入射面（3a）通过所述基板（2）后的光; 形成有透镜单元（3）的光谱单元（4），用于光谱分辨和反射已经进入透镜单元（3）的光; 用于检测由所述分光单元（4）反射的光的光电检测器（4）; 以及设置在所述另一表面（2b）和所述入射表面（3a）之间的用于将所述透镜单元（3）支撑在所述基板（2）上的支撑单元（8）。 由于支撑单元（8）在光谱模块（1）中在另一表面（2b）和入射表面（3a）之间形成间隙，所以防止另一表面（2b）和入射表面（3a）进入 彼此接触并造成损害，从而光谱模块（1）可以提高其可靠性。

公开(公告)号：US20100149537A1

公开(公告)日：2010-06-17

申请号：US12447595

申请日：2007-11-01

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N21/55 ,  G01N21/59

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US07724378B2

公开(公告)日：2010-05-25

申请号：US12379343

申请日：2009-02-19

Applicant: Noam Babayoff

Inventor： Noam Babayoff

IPC: G01B11/24

CPC classification number: H04N13/15 ,  A61B1/00009 ,  A61B1/00096 ,  A61B1/0615 ,  A61B1/0638 ,  A61B1/0646 ,  A61B1/0676 ,  A61B1/0684 ,  A61B1/24 ,  A61B1/247 ,  A61B5/0068 ,  A61B5/0088 ,  A61B5/1077 ,  A61B5/1079 ,  A61C9/0053 ,  A61C9/0066 ,  A61C19/04 ,  G01B11/24 ,  G01B11/25 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/10 ,  G01J3/462 ,  G01J3/50 ,  G01J3/501 ,  G01J3/508 ,  G01J3/51 ,  G01N21/255 ,  G06F19/00 ,  G06T7/0012 ,  G06T7/12 ,  G06T7/90 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/30036 ,  H01L27/14868 ,  H04N13/207 ,  H04N13/257 ,  H04N13/271 ,  H04N13/296

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract translation: 用于确定诸如齿段的结构的表面拓扑和相关联颜色的装置包括用于为基本上与深度方向正交的二维阵列的点提供深度数据的扫描器，以及用于提供颜色的图像获取装置 数据，而阵列相对于结构的空间布置基本上保持不变。 处理器组合阵列中每个点的颜色数据和深度数据，从而提供结构表面的三维颜色虚拟模型。 还提供了用于确定结构的表面拓扑和相关联颜色的相应方法。

公开(公告)号：US20090284741A1

公开(公告)日：2009-11-19

申请号：US12465276

申请日：2009-05-13

Applicant: Katsumi SHIBAYAMA ,  Tomofumi SUZUKI

Inventor： Katsumi SHIBAYAMA ,  Tomofumi SUZUKI

IPC: G01J3/02

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/0297

Abstract: In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is bonded to a front plane 2a of a substrate 2 with an optical resin adhesive 63. Thus, it is possible to reduce a stress generated onto the light detecting element 5 due to a thermal expansion difference between the light detecting element 5 and the substrate 2. Additionally, on the light detecting element 5, a first pool portion 101 is formed so as to be located at least between the light detecting portion 5a and the light passing hole 50 when viewed from a direction substantially perpendicular to the front plane 2a. Thus, when the light detecting element 5 is attached to the substrate 2 via the optical resin adhesive 63, the optical resin adhesive 63 is pooled to remain at the first pool portion 101. Thus, the optical resin adhesive 63 is prevented from penetrating into the light passing hole 50.

Abstract translation: 在光谱模块1中，在光检测元件5中形成有通过向分光部4前进的光L1通过的光通过孔50.因此，能够防止光通过孔50与 光检测元件5的光检测部分5a偏离。 此外，光检测元件5利用光学树脂粘合剂63接合到基板2的前面2a。因此，可以减少由于光的热膨胀差而在光检测元件5上产生的应力 检测元件5和基板2.此外，在光检测元件5上，当从基本上垂直的方向观察时，第一池部分101形成为至少位于光检测部分5a和光通过孔50之间 到前平面2a。 因此，当光检测元件5通过光学树脂粘合剂63附着到基板2上时，将光学树脂粘合剂63汇集以保持在第一池部101处。因此，防止光学树脂粘合剂63渗透到 光通过孔50。