Abstract:
An automatic floor-planning method includes extracting a register and a logic operation cell in a semiconductor integrated-circuit unit, extracting a first register set and a second register set that are assumed to input and receive a signal to and from the logic operation cell directly or via other logic operation cell, respectively, creating a set of the logic operation cells as a cluster cell, determining a layout of the cluster cell and the register, selecting a logic level block for which a floor plan is performed, and determining an arrangement and wiring area such that the arrangement and wiring area of the logic level block includes as many cells as possible that belong to the logic level block.
Abstract:
A switching function determines whether to use delayed acknowledgment in following processing on the basis of whether received data is a nullsuccessivenull or nullnon-successivenull type of data. That is, when the type of the received data is nullsuccessive,null delayed acknowledgment is basically used in the processing. On the other hand, when the type of the received data is nullnon-successive,null delayed acknowledgment is basically not used. When the received data is nullnon-successive,null a normal receiving processing is performed according to TCP.
Abstract:
A semiconductor device including a large capacity non-volatile memory and at least one random access memory, said the access time of said device being matched to the access time of each random access memory. The semiconductor memory device is comprised of: a non-volatile memory FLASH having a first reading time; a random access memory DRAM having a second reading time which is more than 100 times shorter than the first reading time; a circuit that includes a control circuit connected to both the FLASH and the DRAM and enabled to control accesses to those FLASH and DRAM; and a plurality of I/O terminals connected to the circuit. As a result, FLASH data is transferred to the DRAM before the DRAM is accessed, thereby matching the access time between the FLASH and the DRAM. Data is written back from the DRAM to the FLASH as needed, thereby keeping data matched between the FLASH and the DRAM and storing the data.
Abstract:
The well voltage of a CMOS circuit having low-threshold-voltage MOSFETs is controlled when the power supply is turned on, during normal operation, and when the supply voltage is cut off. The CMOS circuit can thus operate stably with lower power consumption, because latching-up is reduced when the supply voltage is applied to the CMOS circuit or when the supply voltage is cut off, and subthreshold current is decreased during normal operation.
Abstract:
A non-volatile semiconductor memory device of the present invention is provided with a semiconductor substrate having a main surface, an ONO film (a laminated film of an oxide film, a nitride film and an oxide film) formed on the main surface and having a charge storage part, a pair of buried diffusion bit lines formed in the semiconductor substrate located on both sides of the ONO film, oxide films deposited on the main surface so as to cover the buried diffusion bit lines, and a transfer gate electrode formed on the ONO film.
Abstract:
The disclosed invention effectively prevents fraudulent access to data whose usage is restricted to a time limit, such access attempted by manipulating the clock internal to a playback device and a terminal device. A nonvolatile memory device of the invention comprises a control circuit and a nonvolatile memory circuit which includes a storage region for restriction information to restrict access to contents information provided by web-based rental service. The restriction information includes access time limit information and access time stamp information. The control circuit performs an access decision action which comprises deciding whether access to the contents information is enabled or disabled, based on real time information which is supplied externally and the restriction information, and updating the access time stamp information to the real time information. The control circuit decides that access is disabled if the real time information is later than the access time limit given by the access time limit information or if the real time information is earlier than the access time stamp given by the access time stamp information; otherwise, the control circuit decides that the access is enabled. The control circuit performs the access decision action, at least, at the start of access to said contents information and at the end of the access.
Abstract:
A photomask for aberration measurement of the present invention comprises a substrate that allows exposure light to pass through, a plurality of aperture patterns for measurement that are formed on the top surface of substrate in a plurality of measurement pattern formation regions, a light blocking film that is formed in the measurement pattern formation regions on the rear surface of substrate and that has a rear surface aperture pattern for substantially differentiating the respective incident angles of the exposure light to plurality of aperture patterns for measurement and a plurality of reference patterns that is formed in a single, or in a plurality, of reference pattern formation region(s) on the top surface of substrate, wherein the rear surface of substrate in the reference pattern formation region(s) is formed so that the respective incident angles of the exposure light to plurality of reference patterns becomes the substantially the same.
Abstract:
A connection gate circuit includes first and second N channel MOS transistors connected in series between a first bit line of a pair of bit lines and a first global IO line of a pair of IO lines, and third and fourth N channel MOS transistors connected in series between a second bit line of the pair of bit lines and a second global IO line of the pair of IO lines. The first and second N channel MOS transistors have their gates receiving a sense amplifier activation signal activating a sense amplifier. The third and fourth N channel MOS transistors have their gates receiving a column selection signal.
Abstract:
A multistage high frequency power amplifier-circuit device has a plurality of semiconductor amplification elements connected in a cascade. The circuit device is provided with a bias control circuit used to control the bias voltage or bias current of the output semiconductor amplification element in each stage so as to reduce the variation of the output power with respect to the power control signal voltage in an area around the threshold voltage of the semiconductor amplification elements. This realizes a high frequency power amplifier circuit device provided with excellent controllability of the output power and high efficiency at the time of low power output realized with use of such a control voltage as a power control signal.
Abstract:
There are provided an electronic component for high frequency power amplification provided with a high-sensitivity output power detection circuit which is immune to the influence of changes in the use environment thereof, free of an output mismatch, small in size, and low in insertion loss and a wireless communication system using the electronic component. There are provided an output detection transistor which receives, at a control terminal, a voltage extracted from the intermediate node of an impedance matching circuit provided between the final-stage power amplification transistor of a high-frequency power amplification circuit and an output terminal thereof via a capacitor element and allows a current proportional to an output power to flow, a bias generation circuit for giving an operating point to the control terminal of the transistor, a current mirror circuit for transferring the current flowing in the output detection transistor, and a current-to-voltage conversion transistor for converting the transferred current to a voltage.