OPTICAL MEASUREMENT METHOD AND OPTICAL MEASUREMENT APPARATUS

    公开(公告)号:US20180073923A1

    公开(公告)日:2018-03-15

    申请号:US15677606

    申请日:2017-08-15

    Abstract: There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.

    CHEMICAL SIGNATURE RESOLVED DETECTION OF CONCEALED OBJECTS
    227.
    发明申请
    CHEMICAL SIGNATURE RESOLVED DETECTION OF CONCEALED OBJECTS 有权
    化学签名解决隐藏目标的检测

    公开(公告)号:US20160370298A1

    公开(公告)日:2016-12-22

    申请号:US15122170

    申请日:2015-02-13

    Abstract: The invention provides a method for chemical signature resolved detection of a concealed object within a system. The method includes irradiating the system at a plurality of positions with aplurality of electromagnetic radiation of specific wavelength; capturing a certain component of the scattered electromagnetic radiation from the object at a plurality of locations along various 3D planes around the system; obtaining a plurality of profiles from the captured component of the scattered electromagnetic radiation; filtering the profiles to obtain a chemical signature specific to the object; and resolving the chemical signatures to detect the concealed object, wherein, the step of detection includes determination of the shape, size and location of the object.

    Abstract translation: 本发明提供了一种用于系统内隐蔽物体的化学特征解析检测的方法。 该方法包括在多个具有特定波长的电磁辐射的位置照射系统; 在围绕系统的各种3D平面的多个位置处捕获来自物体的散射电磁辐射的某一分量; 从所述散射电磁辐射的拍摄成分获得多个轮廓; 过滤轮廓以获得特定于物体的化学特征; 以及解析所述化学特征以检测所述隐藏对象,其中,所述检测步骤包括确定所述物体的形状,大小和位置。

    SWIR Targeted Agile Raman System for Detection of Unknown Materials Using Dual Polarization
    230.
    发明申请
    SWIR Targeted Agile Raman System for Detection of Unknown Materials Using Dual Polarization 有权
    SWIR目标敏捷拉曼系统,用于利用双极化检测未知材料

    公开(公告)号:US20140104607A1

    公开(公告)日:2014-04-17

    申请号:US13842034

    申请日:2013-03-15

    Abstract: The present disclosure provides for a system and method for analyzing a sample comprising at least one unknown material. A first location may be scanned to generate a SWIR hyperspectral image. The SWIR hyperspectral image may be generated using dual polarization techniques. The SWIR hyperspectral image may be analyzed to target a second location comprising the unknown material. This second location may be further analyzed using Raman spectroscopic techniques and a Raman data set may be generated. The Raman data set may be further analyzed to associate the unknown material with a know material.

    Abstract translation: 本公开提供了用于分析包含至少一种未知材料的样品的系统和方法。 可以扫描第一位置以产生SWIR高光谱图像。 可以使用双极化技术生成SWIR高光谱图像。 可以分析SWIR高光谱图像以瞄准包括未知材料的第二位置。 可以使用拉曼光谱技术进一步分析该第二位置,并且可以生成拉曼数据集。 可以进一步分析拉曼数据集以将未知材料与知识材料相关联。

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