Abstract:
An apparatus (100) for laser induced breakdown spectroscopy (LIBS), comprising a sample chamber (112), a laser source (115) connected to an excitation optics assembly (120), the excitation optics assembly (120) connected to a first port (132) on the sample chamber (112), a collimator assembly (125) connected to a spectrometer (130), the collimator assembly (125) connect to a second port (135) on the sample chamber (112), and a first lens tube (150) positioned on the first port (132) and a second lens tube (155) positioned on the second port (135), the first lens tube (150) protecting the first port (132) connected to the excitation optics assembly (120) and the second lens tube (155) protecting the second port (135) connected to the collimator assembly (125) from particles emitted when a laser pulse from the laser source (115) ablates a surface of a target sample (145) and generates a plasma. The protection can alternatively be provided by a transparent partition (260) positioned between the first port (132) and the target sample (145).
Abstract:
An apparatus (10) includes a single laser source (20) configurable to produce laser pulses (35) directable towards a target substance (30), a focusing lens (25) optically positionable between the single laser source (20) and the target substance (30), the focusing lens (25) focusing a first laser pulse (35) to ablate at least a portion of the target substance (30) when in a first focusing lens position to generate a plasma plume, the plume emitting atomic emission lines characteristic of elements including the target substance, the focusing lens (25) focusing a second laser pulse (35) in the target substance (30) when in a second focusing lens position, resulting in Raman scattering, a collection optics assembly (45) to detect signals representing the atomic emission lines characteristic of the target substance (30) and the Raman scattering, and a spectrometer (40) to detect signals received from the collection optics assembly (45).
Abstract:
Methods and systems for characterizing particles in an aerosol are disclosed. A system includes a collection container that utilizes the principles of elutriation to collect particles of selected aerodynamic diameter ranges within a measurement region. A particle detector is used to detect and characterize particles that have settled into the measurement region.
Abstract:
A LIBS measurement system is described herein that provides an orifice, aperture or opening in a substantially V-shaped chute or sleeve that allows access to the material to be analyzed from the underside of the chute. The laser beam is aimed through the hole and return light (signal) is collected through the hole by a photodetector assembly. A diverter device, which is located at an output end of the chute, diverts certain particles away from the chute upon receipt of an actuation signal.
Abstract:
A system and method for non-destructive, in situ, positive material identification of a pipe selects three test areas that are separated axially and circumferentially from one another and then polishes a portion of each test area. Within each polished area, a non-destructive test device is used to collect mechanical property data and another non-destructive test device is used to collect chemical property data. An overall mean for the mechanical property data, and for the chemical property data, is calculated using at least two data collection runs. The means are compared to a known material standard to determine, at a high level of confidence, ultimate yield strength and ultimate tensile strength within +/- 10%, a carbon percentage within +/- 25%, and a manganese percentage within +/- 20% of a known material standard.
Abstract:
본 발명의 일 실시예에 따른 레이저 유도 플라즈마 분광장치는, 레이저 빔을 조사하는 레이저 헤드, 레이저 빔을 대상 시편에 집속시키는 포커싱 렌즈, 상기 포커싱 렌즈를 통과한 레이저 빔의 초점에 위치하는 대상 시편에서 발생되는 제1플라즈마의 전자 밀도 및 전자 에너지를 제어하여 증폭하는 플라즈마 반응부, 상기 플라즈마 반응부에서 증폭된 제2플라즈마를 집속하는 컬렉션 렌즈, 및 상기 컬렉션 렌즈를 통하여 집속되는 제2플라즈마를 분석하는 분광도계를 포함한다.
Abstract:
An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
Abstract:
Die Erfindung betrifft ein optisches Emissionsspektrometer mit einer Anregungsquelle, einem Eintrittsspalt und einem dispersiven Element zur Erzeugung eines Spektrums sowie mit einem abbildenden Element zur Abbildung des Eintrittsspaltes auf eine Fokalkurve, sowie mit einer Anzahl von lichtempfindlichen Detektoren zur Messung von Linien des Spektrums im Bereich der Fokalkurve, wobei als lichtempfindliche Detektoren Silizium-Photomultiplier mit Avalanche-Photodioden in Spaltenanordnung vorgesehen sind.