LASER INDUCED BREAKDOWN SPECTROSCOPY SAMPLE CHAMBER
    221.
    发明申请
    LASER INDUCED BREAKDOWN SPECTROSCOPY SAMPLE CHAMBER 审中-公开
    激光诱导破碎光谱样品室

    公开(公告)号:WO2016109115A3

    公开(公告)日:2016-09-15

    申请号:PCT/US2015063876

    申请日:2015-12-04

    CPC classification number: G01J3/443 G01J3/0208 G01J3/0262 G01N21/15 G01N21/718

    Abstract: An apparatus (100) for laser induced breakdown spectroscopy (LIBS), comprising a sample chamber (112), a laser source (115) connected to an excitation optics assembly (120), the excitation optics assembly (120) connected to a first port (132) on the sample chamber (112), a collimator assembly (125) connected to a spectrometer (130), the collimator assembly (125) connect to a second port (135) on the sample chamber (112), and a first lens tube (150) positioned on the first port (132) and a second lens tube (155) positioned on the second port (135), the first lens tube (150) protecting the first port (132) connected to the excitation optics assembly (120) and the second lens tube (155) protecting the second port (135) connected to the collimator assembly (125) from particles emitted when a laser pulse from the laser source (115) ablates a surface of a target sample (145) and generates a plasma. The protection can alternatively be provided by a transparent partition (260) positioned between the first port (132) and the target sample (145).

    Abstract translation: 一种用于激光诱导击穿光谱(LIBS)的装置(100),包括样品室(112),连接到激发光学组件(120)的激光源(115),所述激发光学组件(120)连接到第一端口 (112)上的第二端口(132),连接到光谱仪(130)的准直器组件(125),准直器组件(125)连接到样品室(112)上的第二端口(135) 位于第一端口(132)上的透镜管(150)和位于第二端口(135)上的第二透镜管(155),第一透镜管(150)保护连接到激发光学组件的第一端口 (115)的激光脉冲消除来自激光源(115)的激光脉冲消除的颗粒,从而保护连接到准直器组件(125)的第二端口(135)的第二透镜管(120)和第二透镜管(155) 并产生等离子体。 替代地,保护可以由位于第一端口(132)和目标样品(145)之间的透明隔板(260)提供。

    COMBINED RAMAN SPECTROSCOPY AND LASER-INDUCED BREAKDOWN SPECTROSCOPY
    222.
    发明申请
    COMBINED RAMAN SPECTROSCOPY AND LASER-INDUCED BREAKDOWN SPECTROSCOPY 审中-公开
    组合拉曼光谱和激光诱发的断裂光谱

    公开(公告)号:WO2016099911A1

    公开(公告)日:2016-06-23

    申请号:PCT/US2015/063594

    申请日:2015-12-03

    Inventor: WANG, Peidong

    Abstract: An apparatus (10) includes a single laser source (20) configurable to produce laser pulses (35) directable towards a target substance (30), a focusing lens (25) optically positionable between the single laser source (20) and the target substance (30), the focusing lens (25) focusing a first laser pulse (35) to ablate at least a portion of the target substance (30) when in a first focusing lens position to generate a plasma plume, the plume emitting atomic emission lines characteristic of elements including the target substance, the focusing lens (25) focusing a second laser pulse (35) in the target substance (30) when in a second focusing lens position, resulting in Raman scattering, a collection optics assembly (45) to detect signals representing the atomic emission lines characteristic of the target substance (30) and the Raman scattering, and a spectrometer (40) to detect signals received from the collection optics assembly (45).

    Abstract translation: 一种设备(10)包括可配置为产生可朝向目标物质(30)可定向的激光脉冲(35)的单个激光源(20),可光学定位在单个激光源(20)和目标物质 (30)中,聚焦透镜(25)在第一聚焦透镜位置聚焦第一激光脉冲(35)以消除目标物质(30)的至少一部分以产生等离子体羽流,所述羽流发射原子发射线 包括目标物质的元件的特征,当处于第二聚焦透镜位置时,聚焦透镜(25)将第二激光脉冲(35)聚焦在目标物质(30)中,导致拉曼散射,收集光学组件(45) 检测表示目标物质(30)的特征的原子发射线和拉曼散射的信号,以及用于检测从收集光学组件(45)接收的信号的光谱仪(40)。

    RAPID MATERIAL ANALYSIS USING LIBS SPECTROSCOPY
    224.
    发明申请
    RAPID MATERIAL ANALYSIS USING LIBS SPECTROSCOPY 审中-公开
    使用LIBS光谱的快速材料分析

    公开(公告)号:WO2015200111A1

    公开(公告)日:2015-12-30

    申请号:PCT/US2015/036617

    申请日:2015-06-19

    Applicant: TSI, INC.

    Abstract: A LIBS measurement system is described herein that provides an orifice, aperture or opening in a substantially V-shaped chute or sleeve that allows access to the material to be analyzed from the underside of the chute. The laser beam is aimed through the hole and return light (signal) is collected through the hole by a photodetector assembly. A diverter device, which is located at an output end of the chute, diverts certain particles away from the chute upon receipt of an actuation signal.

    Abstract translation: 本文描述了LIBS测量系统,其在大致V形的滑槽或套筒中提供孔,孔或开口,其允许从滑槽的下侧进入待分析的材料。 激光束被瞄准穿过孔,并且通过光电检测器组件通过孔收集返回光(信号)。 位于滑槽的输出端的分流装置在接收到致动信号时将某些颗粒从滑槽偏离。

    SYSTEM AND METHOD FOR NON-DESTRUCTIVE, IN-SITU, POSITIVE MATERIAL IDENTIFICATION OF A PIPE
    225.
    发明申请
    SYSTEM AND METHOD FOR NON-DESTRUCTIVE, IN-SITU, POSITIVE MATERIAL IDENTIFICATION OF A PIPE 审中-公开
    一种管道的非破坏性,现场,正性材料鉴定的系统和方法

    公开(公告)号:WO2015199975A2

    公开(公告)日:2015-12-30

    申请号:PCT/US2015034928

    申请日:2015-06-09

    Abstract: A system and method for non-destructive, in situ, positive material identification of a pipe selects three test areas that are separated axially and circumferentially from one another and then polishes a portion of each test area. Within each polished area, a non-destructive test device is used to collect mechanical property data and another non-destructive test device is used to collect chemical property data. An overall mean for the mechanical property data, and for the chemical property data, is calculated using at least two data collection runs. The means are compared to a known material standard to determine, at a high level of confidence, ultimate yield strength and ultimate tensile strength within +/- 10%, a carbon percentage within +/- 25%, and a manganese percentage within +/- 20% of a known material standard.

    Abstract translation: 用于管道的非破坏性,原位,正面材料识别的系统和方法选择沿轴向和周向彼此分离的三个测试区域,然后抛光每个测试区域的一部分。 在每个抛光区域内,使用非破坏性测试装置来收集机械性能数据,另一种非破坏性测试装置用于收集化学性质数据。 使用至少两个数据采集运行计算机械性能数据和化学性质数据的总体平均值。 将该装置与已知材料标准进行比较,以高置信度确定+/- 10%内的极限屈服强度和极限拉伸强度,+/- 25%内的碳百分比,+ / - 已知材料标准的20%。

    OPTICAL MANUFACTURING PROCESS SENSING AND STATUS INDICATION SYSTEM
    227.
    发明申请
    OPTICAL MANUFACTURING PROCESS SENSING AND STATUS INDICATION SYSTEM 审中-公开
    光学制造过程传感和状态指示系统

    公开(公告)号:WO2015148702A1

    公开(公告)日:2015-10-01

    申请号:PCT/US2015/022539

    申请日:2015-03-25

    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.

    Abstract translation: 教导了一种光学制造过程感测和状态指示系统,其能够利用来自制造过程的光发射来推断过程的状态。 在一种情况下,它能够使用这些光学发射来区分两个时间尺度上的热现象,并且执行特征提取和分类,从而使标称工艺条件可以在给定时刻或在一个特定时刻与唯一标称工艺条件区分开来 在制造过程中发生的时间序列。 在其他情况下,它能够利用这些光学发射来导出相应的光谱并识别那些光谱内的特征,使得标称过程条件可以在给定的时刻或者在一系列连续的时刻上与标称过程条件唯一地区分开 在制造过程中发生的时间。

    光谱分析系统
    228.
    发明申请
    光谱分析系统 审中-公开

    公开(公告)号:WO2015062445A1

    公开(公告)日:2015-05-07

    申请号:PCT/CN2014/089330

    申请日:2014-10-23

    Applicant: 清华大学

    Inventor: 陈文聪 蒲以康

    CPC classification number: G01J3/443 G01J3/021 G01J3/0218 G01J3/1804

    Abstract: 一种光谱分析系统,包括切尼-特纳光路结构(10),包括N个光电倍增管的光电倍增管阵列(20),光纤阵列(30),多通道时间门控计数器(40),高压电源(50)和与光电倍增管阵列(20)相连、用于在光谱测量时使其维持在恒定低温环境的温度控制模块(60),其中光纤阵列(30)包括N组光纤,各组光纤的第一端排成与入射狭缝(11)平行方向的一列安装在切尼-特纳光路结构(10)的聚焦平面上、收集不同波长单色光,N组光纤的第二端与N个光电倍增管一一对应地相连以将不同波长的光信号传导到不同的光电倍增管,N为正整数。该系统的优点在于同时具有高灵敏度和高时间分辨能力,可用于采集微弱的快速变化且不重复的光谱信号。

    一种土壤表面氮元素分布的快速测量方法和系统

    公开(公告)号:WO2014094381A1

    公开(公告)日:2014-06-26

    申请号:PCT/CN2013/070978

    申请日:2013-01-25

    CPC classification number: G01N21/718 G01J3/443

    Abstract: 一种土壤表面氮元素分布的快速测量系统和方法,该系统包括:密闭负压舱体(8)、分析装置(5)、二维运动样本台(12)、激光激发装置和原子光谱收集装置;分析装置(5)控制二维运动样本台(12)的运动状态,激光激发装置和原子光谱收集装置用于激发并获取土壤表面的微量原子发射光谱,分析土壤表面被照射位置的氮素含量;分析装置(5),用于承载控制、定标和定量化回归算法,计算土壤表面被照射不同位置的氮素的含量,自动绘制氮素分布图。所述系统和方法,可获得土壤表面有机态氮、速效氮成分、土壤样本表面氮素的分布图像,有效消除空气中氮素对测量结果的影响。

    SILIZIUM-PHOTOMULTIPLIER UND DAMIT VERSEHENES OPTISCHES EMISSIONSSPEKTROMETER
    230.
    发明申请
    SILIZIUM-PHOTOMULTIPLIER UND DAMIT VERSEHENES OPTISCHES EMISSIONSSPEKTROMETER 审中-公开
    硅光电倍增管和由此提供的光学发射光谱仪

    公开(公告)号:WO2014023423A1

    公开(公告)日:2014-02-13

    申请号:PCT/EP2013/002355

    申请日:2013-08-06

    CPC classification number: G01J3/2803 G01J3/443

    Abstract: Die Erfindung betrifft ein optisches Emissionsspektrometer mit einer Anregungsquelle, einem Eintrittsspalt und einem dispersiven Element zur Erzeugung eines Spektrums sowie mit einem abbildenden Element zur Abbildung des Eintrittsspaltes auf eine Fokalkurve, sowie mit einer Anzahl von lichtempfindlichen Detektoren zur Messung von Linien des Spektrums im Bereich der Fokalkurve, wobei als lichtempfindliche Detektoren Silizium-Photomultiplier mit Avalanche-Photodioden in Spaltenanordnung vorgesehen sind.

    Abstract translation: 本发明涉及一种用激发源,一个入口狭缝和用于产生光谱,以及与用于聚焦曲线的入口狭缝,的成像的成像元件的色散元件的光发射光谱仪,以及到多个感光探测器,用于测量聚焦曲线的区域中的频谱的线 ,被提供作为在列顺序的雪崩光电二极管的光敏检测器硅光电倍增器。

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