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    Scanning laser microscope
    223.
    发明申请
    Scanning laser microscope 有权
    扫描激光显微镜

    公开(公告)号：US20040195497A1

    公开(公告)日：2004-10-07

    申请号：US10798013

    申请日：2004-03-11

    Applicant: OLYMPUS CORPORATION

    Inventor： Hiroshi Sasaki

    IPC: G01N023/04 ,  H01J003/14 ,  H01J005/16

    CPC classification number: G01N21/6458 ,  G01N2021/1774 ,  G01N2021/3137 ,  G01N2021/3174 ,  G01N2021/6417 ,  G01N2021/6471 ,  G01N2201/06113 ,  G01N2201/067 ,  G01N2201/105 ,  G02B21/0032 ,  G02B21/16

    Abstract: In case of irradiating a sample with laser beam, dispersing light emitted from the sample to a spectrum, and fetching and detecting from a wavelength band extraction portion light in at least one band area from the dispersed spectrum, when at least one of a plurality of optical elements arranged between the sample and the dispersive element is switched, a positional relationship between the wavelength band extraction portion and a spectrum image formation position which is displaced in a dispersion direction due to a change in angle of light entering the dispersive element.

    Abstract translation: 在用激光束照射样品的情况下，将从样品发射的光分散到光谱，并且从波长带提取部分中取出并检测来自分散光谱的至少一个带区域中的光，当多个 布置在样品和分散元件之间的光学元件被切换，波长带提取部分与由于进入分散元件的光的角度的变化而在色散方向上移位的光谱图像形成位置之间的位置关系。

    MULTIPLEXED SINGLE MOLECULE ANALYZER
    225.
    发明申请
    MULTIPLEXED SINGLE MOLECULE ANALYZER 审中-公开
    多单分子分析仪

    公开(公告)号：WO2016100701A1

    公开(公告)日：2016-06-23

    申请号：PCT/US2015/066440

    申请日：2015-12-17

    Applicant: SINGULEX, INC.

    Inventor： LIVINGSTON, Richard ,  GILBERT, Michelle ,  FELBERG, Jacqueline ,  BISHOP, Jeffrey

    IPC: G01N33/58 ,  G01N33/53 ,  G01N21/62

    CPC classification number: G01N21/6428 ,  G01J3/4406 ,  G01N21/645 ,  G01N21/6452 ,  G01N33/5302 ,  G01N33/536 ,  G01N33/58 ,  G01N33/6845 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6441 ,  G01N2201/0612 ,  G01N2201/103 ,  G01N2201/104 ,  G01N2201/105

    Abstract: Analyzers and analyzer systems that include an analyzer for determining multiple label species, methods of using the analyzer and analyzer systems to analyze samples, are disclosed herein. The analyzer includes one or more sources of electromagnetic radiation to provide electromagnetic radiation at wavelengths within the excitation bands of one or more fluorophore species to an interrogation space that is translated through the sample to detect the presence or absence of molecules of different target analytes. The analyzer may also include one or more detectors configured to detect electromagnetic radiation emitted from the one or more fluorophore species. The analyzer for determining multiple target molecule species provided herein is useful for diagnostics because the concentration of multiple species of target molecules may be determined in a single sample and with a single system.

    Abstract translation: 本文公开了包括用于确定多个标签种类的分析器，使用分析仪和分析仪系统分析样品的方法的分析仪和分析仪系统。 分析仪包括一个或多个电磁辐射源，以将一个或多个荧光团物质的激发带内的波长处的电磁辐射提供给通过样品翻译的询问空间，以检测不同目标分析物的分子的存在或不存在。 分析器还可以包括被配置为检测从一个或多个荧光团物种发射的电磁辐射的一个或多个检测器。 用于确定本文提供的多种靶分子物质的分析仪可用于诊断，因为可以在单个样品中和单个系统中确定多种目标分子的浓度。

    APPARATUS, SYSTEM AND METHOD FOR DETECTING MATTER
    227.
    发明申请
    APPARATUS, SYSTEM AND METHOD FOR DETECTING MATTER 审中-公开
    装置，系统和检测方法

    公开(公告)号：WO2013115650A1

    公开(公告)日：2013-08-08

    申请号：PCT/NO2013/000001

    申请日：2013-01-24

    Applicant: TOMRA SORTING AS

    Inventor： BALTHASAR, Dirk ,  ONSRUD, Ole

    IPC: G01N21/84

    CPC classification number: G01N21/55 ,  G01N21/84 ,  G01N2021/845 ,  G01N2201/105 ,  G02B26/105

    Abstract: The present invention relates to an apparatus (10) for detecting matter, the apparatus comprising: a first light source (14a) adapted to emit a first light beam (16a); a second light source (14b) adapted to emit a second light beam (16b), wherein the apparatus is arranged such that the first and second light beams converge towards a scanning element (20), e.g. a rotating polygon mirror; the scanning element adapted to redirect the converging first and second light beams towards the matter to be detected; and a detector (26) adapted to receive light (38) reflected by the matter via the scanning element.

    Abstract translation: 本发明涉及一种用于检测物体的装置（10），该装置包括：适于发射第一光束（16a）的第一光源（14a）; 适于发射第二光束（16b）的第二光源（14b），其中所述设备被布置成使得所述第一和第二光束朝向扫描元件（20）会聚。 旋转多面镜; 所述扫描元件适于将所述会聚的第一和第二光束朝向待检测的物体重定向; 以及适于经由扫描元件接收由物体反射的光（38）的检测器（26）。

    DEVICE FOR OPTICALLY SCANNING AND MEASURING AN ENVIRONMENT
    228.
    发明申请
    DEVICE FOR OPTICALLY SCANNING AND MEASURING AN ENVIRONMENT 审中-公开
    用于光学扫描和测量环境的设备

    公开(公告)号：WO2013110402A1

    公开(公告)日：2013-08-01

    申请号：PCT/EP2012/075178

    申请日：2012-12-12

    Applicant: FARO TECHNOLOGIES, INC. ,  NEUNDORF, Christoph ,  BECKER, Reinhard

    Inventor： NEUNDORF, Christoph ,  BECKER, Reinhard

    IPC: G01C15/00 ,  G02B26/10

    CPC classification number: G01B11/14 ,  G01C15/002 ,  G01N21/47 ,  G01N2201/06113 ,  G01N2201/105 ,  G02B26/10

    Abstract: A device for optically scanning and measuring an environment is designed as a laser scanner (10), with a base (14), a measuring head (12) which is rotatable relative to the base (14), a mirror (16) which is rotatably relative to the measuring head (12), wherein, in at least one operating mode, the laser scanner (10) is mounted on a cart (W) by means of a mounting device (40), the cart (W) moves the base (14) which is fixedly connected with the mounting device (40), the measuring head (12) rests relative to the base (14), the mirror (16) rotates, and the measuring head (12) is locked with the mounting device (40) by means of locking means (34k, 40k).

    Abstract translation: 设计用于光学扫描和测量环境的装置被设计为激光扫描器（10），其具有基座（14），可相对于基座（14）旋转的测量头（12），反射镜（16），其 可旋转地相对于测量头（12），其中，在至少一个操作模式中，激光扫描仪（10）借助于安装装置（40）安装在推车（W）上，手推车（W） 底座（14），其与安装装置（40）固定连接，测量头（12）相对于基座（14）搁置，反射镜（16）旋转，测量头（12）与安装 装置（40）通过锁定装置（34k，40k）。

    AN ILLUMINATION SYSTEM FOR DETECTING THE DEFECT IN A TRANSPARENT SUBSTRATE AND A DETECTION SYSTEM INCLUDING THE SAME
    229.
    发明申请
    AN ILLUMINATION SYSTEM FOR DETECTING THE DEFECT IN A TRANSPARENT SUBSTRATE AND A DETECTION SYSTEM INCLUDING THE SAME 审中-公开
    用于检测透明基板中的缺陷的照明系统和包括其的检测系统

    公开(公告)号：WO2013097215A1

    公开(公告)日：2013-07-04

    申请号：PCT/CN2011/085131

    申请日：2011-12-31

    Applicant: SAINT-GOBAIN GLASS FRANCE ,  GUO, Xiaofeng ,  LI, Huifen ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

    Inventor： GUO, Xiaofeng ,  LI, Huifen ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

    IPC: G01N21/958 ,  G01N21/896

    CPC classification number: G01N21/8806 ,  F21K9/27 ,  F21Y2103/10 ,  F21Y2115/10 ,  G01N21/896 ,  G01N21/958 ,  G01N2021/8816 ,  G01N2201/0633 ,  G01N2201/105

    Abstract: This invention relates to illumination device for providing near isotropic illumination, and particularly to an illumination system for detecting the defect in a transparent substrate and a detection system comprising the same. According to an embodiment of the invention, an illumination system is provided, which comprises: an illumination system for detecting the defect in a transparent substrate, comprising light source receptacle in bar shape; a plurality of first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and a plurality of second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle, wherein the first line of spot light sources and the second line of spot light sources are substantially arranged in a line, the first line of spot light sources and the second line of spot light sources locate in difference half of the receptacle in the longitudinal direction, the first light and the second light converge to a scan line, and the projections of the first and the second lights, which are converged at each point on the scan line, in a plane P passing the scan line and perpendicular to the transparent substrate are located at different sides of a line in the plane P, which passes the point and is perpendicular to the scan line.

    Abstract translation: 本发明涉及用于提供近似各向同性照明的照明装置，特别涉及用于检测透明基板中的缺陷的照明系统和包括该照明系统的检测系统。 根据本发明的实施例，提供了一种照明系统，其包括：用于检测透明基板中的缺陷的照明系统，包括条形光源插座; 多个第一点光源，每个发射各自的第一光，各个第一光基本上彼此平行，并且所述第一光点光源沿着所述插座的纵向布置到第一线光源; 以及多个第二点光源，每个发射各自的第二光，所述各个第二光基本上彼此平行，并且所述第二点光源沿着所述插座的纵向布置到第二线点光源， 其特征在于，所述第一线点光源和所述第二线点光源基本上配置成一行，所述点光源的第一线和所述第二线点光源位于所述插座的长度方向的不同的一半上， 第一光和第二光会聚到扫描线，并且在通过扫描线并垂直于透明基板的平面P中会聚在扫描线上的每一点的第一和第二光的突起是 位于平面P中的线的不同侧，该平面P通过点并且垂直于扫描线。

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