公开(公告)号：US09841487B2

公开(公告)日：2017-12-12

申请号：US14928062

申请日：2015-10-30

Applicant: CHROMA ATE INC.

Inventor： Hou-Chun Chen ,  Shin-Wen Lin ,  Ching-Hua Chu ,  Po-Kai Cheng

IPC: G01R31/00 ,  G01R35/00 ,  G01R31/28

CPC classification number: G01R35/005 ,  G01R31/2834 ,  G01R31/2882

Abstract: A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

公开(公告)号：US20170292973A1

公开(公告)日：2017-10-12

申请号：US15480427

申请日：2017-04-06

Applicant: Chroma ATE Inc.

Inventor： Chien-Ming CHEN

IPC: G01R1/04 ,  H01R13/629

CPC classification number: G01R1/0466 ,  H01R13/6275 ,  H01R13/62905 ,  H01R13/62955 ,  H01R13/62966 ,  H01R2201/20

Abstract: An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be tested, a lifting arm is lowered so that a contact portion is in contact with the electronic device, and a locking mechanism is actuated to detain the press head on the socket plate. A pressing force generating device exerts a pressing force onto the electronic device and the socket plate, and at least a portion of a reaction force can be directed back to the locking mechanism. The locking mechanism is adapted to detain the press head on the socket plate. When the pressing force generating device generates a predetermined pressing force to certainly establish electrical connection between the electronic device and the chip socket, the reaction force produced by the chip socket may be distributed over the locking mechanism.

公开(公告)号：US20170227599A1

公开(公告)日：2017-08-10

申请号：US15420154

申请日：2017-01-31

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi WU ,  Chien-Hung LO

IPC: G01R31/28 ,  F28D15/00 ,  G05D23/19 ,  F25B21/04

CPC classification number: G01R31/2875 ,  F25B21/04 ,  F25B2321/021 ,  F25B2321/0212 ,  F25B2321/0252 ,  F28D15/00 ,  G01R31/2877 ,  G05D23/19 ,  G05D23/1919

Abstract: A dual loop type temperature control module and an electronic device testing apparatus having the same are provided. The temperature control module comprises a first loop through which a first working fluid of a first temperature flows, a second loop through which a second working fluid of a second temperature flows, a controller for controlling a first switching valve such that the first or second working fluid flows through a temperature regulating device, and a second switching valve such that the working fluid flowing through the temperature regulating device returns to the first or second loop. The temperature regulating device adjusts a thermoelectric cooling device to reach two different reference temperatures based on the rise/fall of its temperature dependent on the working fluid. The thermoelectric cooling device regulates the temperature of the tested object under a wide range of temperature difference and with accuracy based on the reference temperatures to facilitate the detection of high/low temperature.

公开(公告)号：US09706098B2

公开(公告)日：2017-07-11

申请号：US14958904

申请日：2015-12-03

Applicant: CHROMA ATE INC.

Inventor： Yi-Lung Weng ,  Chien-Hsun Chu

IPC: H04N5/225 ,  H04N5/235 ,  H04N17/00

CPC classification number: H04N5/2256 ,  H04N5/2354 ,  H04N17/002

Abstract: An inspection system for obtaining an adjusted light intensity image includes a light source, an image capturing device and a controller. A field of view of the image capturing device is adjusted within an illumination area of the light source. A plurality of light emitting units of the light source are turned on in sequence. The image capturing device captures a calibration image when each of the light emitting units is turned on to obtain a plurality of the calibration images. The controller adjusts the light emitting intensities of the light emitting units respectively according to the light intensity distributions of the calibration images to obtain a specific intensity distribution of an inspection image in the field of view and compensate a vignette effect of the image capturing device.

公开(公告)号：US09647650B2

公开(公告)日：2017-05-09

申请号：US14971044

申请日：2015-12-16

Applicant: CHROMA ATE INC.

Inventor： Cheng-Hsien Chang ,  Ching-Hua Chu ,  Shin-Wen Lin

IPC: H03K5/135 ,  G06F1/04 ,  H03K5/00

CPC classification number: H03K5/135 ,  G06F1/04 ,  G06F1/06 ,  H03K2005/00078

Abstract: A clock generating device includes a first timing delay module, a multiplexer, and a second timing delay module. The multiplexer is electrically connected to the first timing delay module. The second timing delay module is electrically connected to the multiplexer. The first timing delay module generates a plurality of delayed clock signals based on a reference clock signal. The multiplexer outputs a first delayed clock signal and a second delayed clock signal, among the plurality of delayed clock signals, based on a clock generating signal. The second timing delay module generates an output clock signal based on the clock generating signal, the first delayed clock signal and the second delayed clock signal.

公开(公告)号：US09638740B2

公开(公告)日：2017-05-02

申请号：US14048785

申请日：2013-10-08

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming Chen ,  Herbert Tsai ,  Chin-Yi Ou Yang

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2601 ,  G01R31/2887 ,  G01R31/2893

Abstract: A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.

公开(公告)号：US09568245B2

公开(公告)日：2017-02-14

申请号：US14681093

申请日：2015-04-08

Applicant: CHROMA ATE INC.

Inventor： Hsiu-Wei Kuo ,  Xin-Yi Wu ,  Ben-Mou Yu ,  Ming-Chang Wu ,  Mao-Sheng Liu ,  Kuei-Wen Lien

IPC: F27B17/00 ,  F27B1/08 ,  F27D7/04

CPC classification number: F27B1/08 ,  F27B17/0083 ,  F27D7/04 ,  F27D2007/045

Abstract: The disclosure discloses a heating furnace including a housing, a first rack, a chamber, and at least one fan. The first rack is disposed in the housing. The chamber is disposed in the housing and located at a side of the first rack. The chamber includes an inlet, a first sidewall, and a second sidewall. The first sidewall is adjacent to the first rack. The first sidewall has a plurality of vents. The first sidewall and the second sidewall are disposed to face each other. A width is spaced between the first sidewall and the second sidewall, and the width is larger than or equal to 200 mm. The fan is disposed in the housing for generating an airflow to the inlet.

Abstract translation: 本公开公开了一种加热炉，其包括壳体，第一齿条，腔室和至少一个风扇。 第一个机架设置在外壳中。 腔室设置在壳体中并且位于第一齿条的一侧。 腔室包括入口，第一侧壁和第二侧壁。 第一侧壁与第一机架相邻。 第一侧壁具有多个通风孔。 第一侧壁和第二侧壁被设置为彼此面对。 宽度在第一侧壁和第二侧壁之间间隔开，并且宽度大于或等于200mm。 风扇设置在壳体中以产生到入口的气流。

公开(公告)号：US20160165110A1

公开(公告)日：2016-06-09

申请号：US14958904

申请日：2015-12-03

Applicant: CHROMA ATE INC.

Inventor： Yi-Lung WENG ,  Chien-Hsun CHU

IPC: H04N5/225 ,  G06T7/00 ,  H04N17/00 ,  G06K9/46

CPC classification number: H04N5/2256 ,  H04N5/2354 ,  H04N17/002

Abstract: An inspection system for obtaining an adjusted light intensity image includes a light source, an image capturing device and a controller. A field of view of the image capturing device is adjusted within an illumination area of the light source. A plurality of light emitting units of the light source are turned on in sequence. The image capturing device captures a calibration image when each of the light emitting units is turned on to obtain a plurality of the calibration images. The controller adjusts the light emitting intensities of the light emitting units respectively according to the light intensity distributions of the calibration images to obtain a specific intensity distribution of an inspection image in the field of view and compensate a vignette effect of the image capturing device.

Abstract translation: 用于获得调节光强度图像的检查系统包括光源，图像捕获装置和控制器。 在光源的照明区域内调整图像拍摄装置的视场。 光源的多个发光单元依次接通。 当每个发光单元被打开时，图像捕获装置捕获校准图像，以获得多个校准图像。 控制器根据校准图像的光强度分布来分别调整发光单元的发光强度，以获得视场中的检查图像的特定强度分布并补偿摄像装置的暗影效果。

公开(公告)号：US09250292B2

公开(公告)日：2016-02-02

申请号：US13854372

申请日：2013-04-01

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming Chen

IPC: G01R31/28

CPC classification number: G01R31/2896 ,  G01R31/2887

Abstract: A testing system for testing semiconductor package stacking chips is disclosed. The system includes a testing socket, a testing arm, and a testing mechanism. The testing mechanism includes a probe testing device. The probe testing device has a testing chip inside and a plurality of testing probes electrically connected to the testing chip. The plurality of testing probes extends toward the testing socket for contacting a chip-under-test loaded on the testing socket. When the testing mechanism moves to an upper position between the testing socket and the testing arm, the testing arm moves downward in the vertical direction and presses down the testing mechanism thereby coercing the plurality of testing probes in the testing mechanism to closely abut against the chip-under-test, so that the testing chip inside the testing mechanism can electrically connect to the chip-under-test for forming a test loop.

Abstract translation: 公开了一种用于测试半导体封装堆叠芯片的测试系统。 该系统包括测试插座，测试臂和测试机构。 测试机构包括探针测试装置。 探针测试装置内部具有测试芯片，并且多个测试探针电连接到测试芯片。 多个测试探针延伸到测试插座，用于接触加载在测试插座上的芯片下测试。 当测试机构移动到测试插座和测试臂之间的上部位置时，测试臂沿垂直方向向下移动并按压测试机构，从而迫使测试机构中的多个测试探针紧紧靠在芯片上 - 测试，使测试机构内的测试芯片可以电连接到芯片下测试以形成测试回路。

公开(公告)号：US20150066414A1

公开(公告)日：2015-03-05

申请号：US14261427

申请日：2014-04-25

Applicant: CHROMA ATE INC.

Inventor： Chin-Yi Ouyang ,  Liang-Yu Hsu

IPC: G01R31/28

CPC classification number: G01R31/2894 ,  G01R31/287

Abstract: An automatic retest method for a system-level IC test equipment and the IC test equipment is disclosed, wherein the IC test equipment includes multiple testing units, a loading/unloading unit, and a processing unit; each testing unit is capable of testing an IC individually and has a pass rate. When the testing unit finishes a test operation, it will send test report of the IC to the processing unit. The processing unit will determine whether the IC has reached a pass threshold of the testing unit. The processing unit will issue a command, according to a predetermined rule, to transfer the IC that failed to reach the pass threshold to one of the testing units conforming to the predetermined rule to conduct a retest operation. Finally, the processing unit will confirm whether the IC that failed to reach the pass threshold has reached the pass threshold in the retest operation.

Abstract translation: 公开了一种用于系统级IC测试设备和IC测试设备的自动再测试方法，其中IC测试设备包括多个测试单元，加载/卸载单元和处理单元; 每个测试单元都能够单独测试IC并具有合格率。 当测试单元完成测试操作时，它将向处理单元发送IC的测试报告。 处理单元将确定IC是否已达到测试单元的通过阈值。 处理单元将根据预定规则发出命令，将未达到通过阈值的IC传送到符合预定规则的测试单元之一，以进行重新测试操作。 最后，处理单元将确认在重新测试操作中未达到通过阈值的IC是否达到通过阈值。