公开(公告)号：WO2012064656A1

公开(公告)日：2012-05-18

申请号：PCT/US2011/059596

申请日：2011-11-07

Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC ,  COFFIN, John, Magie

Inventor： COFFIN, John, Magie

IPC: G01J3/453 ,  G01B9/02

CPC classification number: G01J3/453 ,  G01B9/02068

Abstract: A novel means of provided a hybrid flexure mounted moving mirror component in an interferometer is introduced herein. In particular, a linear bearing in combination with a novel flexure mounting having novel tilt and velocity control of the moving optical component is provided. Such an arrangement enables correction of the errors at the mirror itself while also solving the problem of isolating vibration and noise caused by the imperfections in the bearing surfaces used in many conventional interferometers. Using such a coupled flexure mounting of the present invention, in addition to the above benefits, also enhances velocity control because the resultant low mass of the moving mirror assembly enables the systems disclosed herein to respond faster than conventional mirror velocity controlled interferometer instruments and with a lower velocity error so as to provide a more stable and lower noise spectra from the analytical instrument.

Abstract translation: 本文介绍了一种在干涉仪中提供混合挠曲安装的移动镜组件的新颖手段。 特别地，提供了一种与具有新的移动光学部件的倾斜和速度控制的新型挠曲安装结合的线性轴承。 这种布置使得能够校正镜子本身的误差，同时也解决了由许多常规干涉仪中使用的支承表面中的缺陷引起的隔离振动和噪声的问题。 使用本发明的这种耦合的弯曲安装件，除了上述益处之外，还增强了速度控制，因为所得到的移动反射镜组件的低质量使得本文公开的系统能够使传统的反射镜速度控制的干涉仪仪器和 降低速度误差，以便从分析仪器提供更稳定和更低的噪声谱。

公开(公告)号：WO2012051363A1

公开(公告)日：2012-04-19

申请号：PCT/US2011/056051

申请日：2011-10-13

Applicant: ALCON LENSX, INC. ,  RAKSI, Ferenc

Inventor： RAKSI, Ferenc

IPC: G01J3/02 ,  G02B26/08 ,  G01B9/02 ,  G01J3/453

CPC classification number: G01J3/02 ,  G01B9/02044 ,  G01B9/02091 ,  G01J3/0205 ,  G01J3/0237 ,  G01J3/0289 ,  G01J3/453 ,  G02B26/0891

Abstract: A spectrometer is presented that includes s spectrally dispersive optical element (120) to spectrally disperse a received light, a leveraged-optics adjustable deflector (142-1, 142-2, 142-3) to adjustably deflect the spectrally dispersed light, and a detector array (160) to receive the spectrally dispersed and adjustably deflected light. The received light can inlcude an interference beam combined from a returned image beam and a reference beam in a Spectral Domain Optical Coherence Tomograph. The detector array can include a linear sensor array. The leveraged-optics adjustable deflector can include an optical element with an adjustable transmissive property or an adjustable reflective property, wherein the adjustable deflector is adjustable by a mechanical adjustment being optically leveraged into a smaller optical adjustment.

Abstract translation: 提出了一种光谱仪，其包括光谱分散光学元件（120）以光谱分散接收的光，杠杆光学可调节偏转器（142-1,142-2,142-3）以可调节地偏转光谱分散的光，以及 检测器阵列（160），以接收光谱分散和可调偏转的光。 接收到的光可以在光谱域光学相干断层扫描仪中包含从返回的图像束和参考光束组合的干涉光束。 检测器阵列可以包括线性传感器阵列。 杠杆光学可调偏转器可以包括具有可调节的透射性质或可调节的反射特性的光学元件，其中可调节的偏转器可通过光学地利用于更小的光学调节的机械调节来调节。

公开(公告)号：WO2012037694A2

公开(公告)日：2012-03-29

申请号：PCT/CA2011/050599

申请日：2011-09-26

Applicant: QUEEN'S UNIVERSITY AT KINGSTON ,  WEBSTER, Paul J. L. ,  FRASER, James M. ,  YANG, Victor X. D.

Inventor： WEBSTER, Paul J. L. ,  FRASER, James M. ,  YANG, Victor X. D.

CPC classification number: B23K26/032 ,  A61B18/20 ,  A61B2017/00057 ,  A61B2018/00642 ,  B22F3/105 ,  B22F3/1055 ,  B22F2003/1057 ,  B22F2998/10 ,  B23K1/0056 ,  B23K9/0956 ,  B23K15/0013 ,  B23K15/02 ,  B23K15/08 ,  B23K15/085 ,  B23K26/03 ,  B23K26/1429 ,  B23K26/20 ,  B23K26/362 ,  B23K26/382 ,  B23K2203/42 ,  B23K2203/52 ,  B28B1/001 ,  B28B17/0081 ,  B29C64/153 ,  B29C64/386 ,  B29C67/0077 ,  B29C67/0088 ,  B33Y30/00 ,  C21D10/00 ,  C22F3/00 ,  G01B9/0203 ,  G01B11/22 ,  G01J3/453 ,  G01N21/84 ,  G01N2021/8416

Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.

Abstract translation: 提供的方法和系统用于在诸如手术激光或焊接应用的材料改性过程的背景下使用光学干涉测量。 产生成像光的成像光源。 反馈控制器基于使用成像光产生的干涉测量输出来控制材料修改过程的至少一个处理参数。 基于零差滤波提供处理干涉图的方法。 提供了使用干涉测量输出来生成材料修改处理的记录的方法。

公开(公告)号：WO2011083420A3

公开(公告)日：2011-10-13

申请号：PCT/IB2011050020

申请日：2011-01-04

Applicant: ECOLE POLYTECH ,  VILLIGER MARTIN ,  PACHE CHRISTOPHE ,  LASSER THEO

Inventor： VILLIGER MARTIN ,  PACHE CHRISTOPHE ,  LASSER THEO

IPC: G02B21/12 ,  G01B9/02 ,  G01N21/47

CPC classification number: G02B21/125 ,  G01B9/02002 ,  G01B9/02057 ,  G01B9/02091 ,  G01B2290/50 ,  G01B2290/70 ,  G01J3/453

Abstract: The invention relates to an optical coherence microscopy system for fast, phase resolved imaging by means of optical coherence microscopy with decoupled illumination and detection apertures, producing a dark-field effect with an enhanced optical contrast. The setup uses a light source with an appropriate temporal coherence, an interferometer and an array detector combined with a spectrometer. The dark-field effect is produced by optical filter means in the illumination and detection paths, positioned in conjugated planes of the sample microscope objective. These optical means comprise for example refractive or diffractive elements, amplitude or phase masks, or programmable spatial light modulators. The object is scanned via a scanning unit allowing a point scan of the object.

Abstract translation: 本发明涉及一种光学相干显微术系统，用于借助光学相干显微镜（具有去耦合照明和检测孔径）的快速相位分辨成像，产生具有增强的光学对比度的暗场效应。 该设置使用具有适当时间相干性的光源，干涉仪和与光谱仪组合的阵列检测器。 暗场效应由照明和检测路径中的光学过滤装置产生，位于样品显微镜物镜的共轭平面中。 这些光学装置包括例如折射或衍射元件，振幅或相位掩模，或可编程空间光调制器。 物体通过扫描单元进行扫描，允许对物体进行点扫描。

公开(公告)号：WO2010090842A2

公开(公告)日：2010-08-12

申请号：PCT/US2010021528

申请日：2010-01-20

Applicant: RARE LIGHT INC ,  MESSERSCHMIDT ROBERT G

Inventor： MESSERSCHMIDT ROBERT G

IPC: G01J3/44 ,  G01J3/10

CPC classification number: G01J3/44 ,  G01J3/433 ,  G01J3/453 ,  G01J2003/104 ,  G01J2003/106

Abstract: Raman spectroscopy apparatuses are described that detect the spectral characteristics of a sample wherein the apparatus consists of a multiplicity of modulated discrete light sources adapted to excite a sample with electromagnetic radiation,, a filter adapted to isolate a predetermined wavelength emitted by the sample wherein the wavelength is further modulated at different frequencies, and a detector for detecting the isolated wavelength. The apparatus may further consist of an interferometer, such as a Michelson interferometer, adapted to modulate the excitation energy. Also provided herein are methods, systems, and kits incorporating the Raman spectroscopy apparatus.

Abstract translation: 描述了检测样品的光谱特性的拉曼光谱设备，其中该设备由适于利用电磁辐射激发样品的多个调制的离散光源组成，适于隔离样品发射的预定波长的滤光器，其中波长 以不同频率进一步调制，以及用于检测隔离波长的检测器。 该设备还可以包括适于调制激发能量的干涉仪，例如迈克尔逊干涉仪。 本文还提供了结合拉曼光谱仪器的方法，系统和试剂盒。

公开(公告)号：WO2009019690A2

公开(公告)日：2009-02-12

申请号：PCT/IL2008/001073

申请日：2008-08-05

Applicant: NOVA MEASURING INSTRUMENTS LTD. ,  BRILL, Boaz ,  GOLBER, Rafael ,  MUZIKOVSKY, Vladimir

Inventor： BRILL, Boaz ,  GOLBER, Rafael ,  MUZIKOVSKY, Vladimir

IPC: G01N21/21

CPC classification number: G01N21/956 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0291 ,  G01J3/447 ,  G01J3/453 ,  G01J2003/1213

Abstract: An optical measurement Method and System for spectroscopy are disclosed for evaluating the parameters of a sample. The device generally includes a broadband source for generating a light beam. Reflected light beam are simultaneously analyzed as a function of the position within the beam to provide information at multiple wavelengths and/or angular distribution. A Furier filter, comprising dispersion element and a two-dimensional photodetector array are used so that the beam may be simultaneously or consicuently analyzed at multiple angles of returned from the sample (diffracted) light at multiple wavelengths.

Abstract translation: 公开了用于评估样品参数的光学测量方法和系统。 该装置通常包括用于产生光束的宽带源。 作为光束内的位置的函数同时分析反射光束，以提供多个波长和/或角度分布的信息。 使用包括色散元件和二维光电检测器阵列的富尔滤光器，使得可以以从多个波长的样品（衍射）光返回的多个角度同时或仔细地分析光束。

公开(公告)号：WO2005074525A3

公开(公告)日：2007-04-05

申请号：PCT/US2005002601

申请日：2005-01-28

Applicant: GEN DYNAMICS ADVANCED INF SYS

Inventor： ZAUGG THOMAS C

IPC: G01B9/02 ,  G01J3/453 ,  G01N21/35 ,  G02B6/122 ,  G02B6/34

CPC classification number: G01J3/453 ,  B82Y20/00 ,  G01N21/3581 ,  G02B6/1225 ,  G02B6/29349 ,  G02B6/2935

Abstract: Novel spectroscopy techniques using entangled photons are disclosed. In one technique, entangled photons are directed to a sample of interest, while the photons with which they are entangled are resolved according to frequency. The photons transmitted by or reflected from the sample and the frequency-resolved photons are detected. Such detection may be by way of an electronic coincidence counter or a biphoton sensitive material, which absorbs entangled photons while allowing other photon pairs to pass. Detection information is used to derive spectroscopic properties of the sample. In another technique, a Fourier transform spectroscopy technique using entangled photons is disclosed. Entangled photons are directed to a sample, while the photons with which they are entangled are directed to a Michelson interferometer. The photons transmitted by or reflected from the sample and the photons leaving the Michelson interferometer are detected. Such detection may be by way of an electronic coincidence counter or a biphoton sensitive material. Detection information is used to derive spectroscopic properties of the sample.

Abstract translation: 公开了使用纠缠光子的新型光谱技术。 在一种技术中，纠缠的光子被引导到感兴趣的样本，而与它们相互纠缠的光子根据频率被解析。 检测由样品发射或反射的光子和频率分辨的光子。 这种检测可以通过电子符合计数器或双光子敏感材料，其吸收缠结的光子，同时允许其他光子对通过。 检测信息用于导出样品的光谱特性。 在另一种技术中，公开了使用纠缠光子的傅里叶变换光谱技术。 纠缠的光子被引导到样品，而与它们相互纠缠的光子被引导到迈克尔逊干涉仪。 检测由样品透射或反射的光子和离开迈克尔逊干涉仪的光子。 这种检测可以通过电子重合计数器或双光子敏感材料。 检测信息用于导出样品的光谱特性。

公开(公告)号：WO2006041997A2

公开(公告)日：2006-04-20

申请号：PCT/US2005/035951

申请日：2005-10-05

Applicant: TOMOPHASE CORPORATION ,  WANG, Feiling ,  LI, Xiao-Li ,  NORRIS, Peter, E.

Inventor： WANG, Feiling ,  LI, Xiao-Li ,  NORRIS, Peter, E.

IPC: A61B5/00

CPC classification number: G01N21/4795 ,  A61B5/0059 ,  A61B5/0066 ,  A61B5/441 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/027 ,  G01J3/10 ,  G01J3/42 ,  G01J3/4338 ,  G01J3/447 ,  G01J3/453 ,  G01N21/39

Abstract: Designs, implementations, and techniques for optically measuring a sample to obtain spectral absorbance map of the sample. Light at different wavelength bands may be used to detect different absorption features in the sample. Multiple light sources may be used including tunable lasers.

Abstract translation: 用于光学测量样品以获得样品的光谱吸收图的设计，实现和技术。 可以使用不同波段的光来检测样品中不同的吸收特征。 可以使用多个光源，包括可调激光器。

公开(公告)号：WO2006001712A3

公开(公告)日：2006-04-06

申请号：PCT/NO2005000235

申请日：2005-06-28

Applicant: OPTONOR AS ,  VIKHAGEN EIOLF

Inventor： VIKHAGEN EIOLF

IPC: G01B9/02 ,  G01B11/16 ,  G01J3/433 ,  G01J3/453 ,  G01N20060101 ,  G01N21/17 ,  G01N21/84 ,  G01N21/88 ,  G01L1/24

CPC classification number: G01B9/02098 ,  G01B9/02082 ,  G01B11/162 ,  G01B2290/35 ,  G01J3/433 ,  G01J3/453 ,  G01N21/1717 ,  G01N21/88 ,  G01N2021/8472

Abstract: This invention relates to a method and system for measuring characteristics in or beneath a material surface being subject to a periodic movement. The method comprises the projection of an expanded light beam toward the surface, receipt and splitting of the light reflected from the surface into two light paths, applying a periodic fluctuation into at least one of said paths, combining the light beams and directing them toward a detector device for producing an interference pattern on the surface of said detector device.

Abstract translation: 本发明涉及一种用于测量受到周期性运动的材料表面中或之下的特性的方法和系统。 该方法包括将扩展的光束投影到表面，将从表面反射的光接收和分裂成两个光路，将周期性波动施加到至少一个所述路径中，组合光束并将它们引向 检测器装置，用于在所述检测器装置的表面上产生干涉图案。

公开(公告)号：WO2006001712A2

公开(公告)日：2006-01-05

申请号：PCT/NO2005/000235

申请日：2005-06-28

Applicant: OPTONOR AS ,  VIKHAGEN, Eiolf

Inventor： VIKHAGEN, Eiolf

IPC: G01B11/00

CPC classification number: G01B9/02098 ,  G01B9/02082 ,  G01B11/162 ,  G01B2290/35 ,  G01J3/433 ,  G01J3/453 ,  G01N21/1717 ,  G01N21/88 ,  G01N2021/8472

Abstract: This invention relates to amethod and system for measuring characteristics in or beneath a material surface being subject to a periodic movement. The method comprises the projection of an expanded light beam toward the surface, receipt and splitting of the light reflected from the surface into two light paths, applying a periodic fluctuation into at least one of said paths, combining the light beams and directing them toward a detector device for producing an interference pattern on the surface of said detector device.

Abstract translation: 本发明涉及用于测量受到周期性运动的材料表面中或之下的特性的方法和系统。 该方法包括将扩展的光束投射到表面，将从表面反射的光接收和分裂成两个光路，将周期性波动施加到至少一个所述路径中，组合光束并将它们引向 检测器装置，用于在所述检测器装置的表面上产生干涉图案。