Abstract:
A first tunable wavelength pulse light source (22) is driven by a reference signal to emit a first optical pulse. An optical demultiplexer (24) demultiplexes a first optical pulse emitted from the first pulse light source (22) into a reference optical pulse and an incident optical pulse to be sent into an object to be measured. An optical multiplexer (26) multiplexes the reference optical pulse and an outgoing optical pulse passing through the object to output multiplexed light. A second pulse light source (23) generates a second optical pulse which is synchronous with the first optical pulse and delays a predetermined time for each period of the first optical pulse. A sampling unit (27, 27a, 27b) receives the multiplexed light and the second optical pulse to obtain an optical pulse train signal proportional to the intensity of the multiplexed light obtained in synchronism with the second optical pulse. From the optical pulse train signal from the sampling unit (27, 27a, 27b), a signal processor (37) obtains an envelope formed by peaks of individual optical pulses forming the optical pulse train. The wavelength dispersion of the object is obtained by measuring the delay time of the outgoing optical pulse passing through the object on the basis of intervals between the peaks of the envelope.
Abstract:
Le procédé de l'invention consiste à effectuer, pour chaque pixel à traiter d'une image thermique d'un objet, trois mesures différentes, par exemple à l'aide d'un polariseur à trois orientations différentes, à en déduire les paramètres de Stockes de l'onde issue de l'objet correspondant au pixel considéré, à calculer les paramètres polarimétriques d'ellipticité et d'inclinaison du grand axe de l'ellipse de l'onde partiellement polarisée, et à reconstruire la surface tridimensionnelle visible de l'objet en déterminant pour chacun de ces pixels ses coordonnées grâce aux relations existant entre les paramètres polarimétriques de l'onde et l'indice optique du matériau constituant l'objet, et le vecteur normal à la surface de l'objet à l'emplacement du pixel.
Abstract:
A system and method for controlling polarisation state determining parameters of a polarised beam of light in an ellipsometer or polarimeter and the like system, so that they are in ranges wherein the sensitivity, of a sample system characterising PSI and DELTA value monitoring detector (DET) used to measure changes in said polarisation state resulting from interaction with a "composite sample system," comprised of a sample system per se. (SS) and a beam polarisation state determining variable retarder, to noise and measurement errors etc. therein), is reduced. This allows determining sample system per se. characterising PSI and DELTA values, from Composite Sample System characterising PSI and DELTA values, by compensating for the presence of components, (VR1) and/or (VR2), added to an ellipsometer or polarimeter and the like system. The arrangement also improves the ability of an ellipsometer or polarimeter and the like system fitted with components (VR1) and/or (VR2) to provide usably accurate and precise sample system characterising PSI and DELTA determining data values, wherein a sample system per se. investigating polarised beam of light is oriented at other than a Principal or Brewster Angle of Incidence thereto, the use of which Angle of Incidence would otherwise be difficult, if not impossible. The arrangement also allows determination of the "Handedness" of a polarised beam of light, and of sample system Jones or Mueller Matrix component values; and provides means for making system components (VR1) and/or (VR2) added to an ellipsometer or polarimeter and the like system, essentially end user transparent when desired, without removal thereof from said ellipsometer or polarimeter and the like system.
Abstract:
An apparatus (10) comprises an optical filter (12), which resolves electromagnetic radiation into a sequence of resolved polarization components, an imaging device (14), having a storage device (16), and a driver (18). The imaging device (14) receives the sequence of resolved polarization components from the optical filter (12) and stores them in the storage device (16). The driver (18), which receives the video synchronization signal, produces a filter synchronization signal which is provided to the optical filter (12) to cause the optical filter (12) to produce the sequence of resolved polarization components so the optical filter (12) is in synchronization with the imaging device (14). This apparatus (10) is used to view the polarization properties of a scene.
Abstract:
A polarization viewer comprising a mechanism (12, 18, 20) for forming a broadview image having a spectral width greater than 2 angstroms and 50° based on polarization information of a scene. The polarization viewer is also comprised of a mechanism (12, 18, 20) for providing polarization information to the forming mechanism. The providing mechanism is in communication with the forming mechanism. In a first embodiment, the providing mechanism includes a camera mechanism in communication with the forming mechanism. The camera mechanism includes a fixed polarizer analyzer (12) disposed such that electromagnetic radiation entering the camera mechanism passes through the polarizer analyzer (12). The providing mechanism can also include a mechanism for steering a polarization plane of the radiation. The steering mechanism is disposed such that radiation passing through the polarizer analyser first passes through the steering mechanism. The steering mechanism preferably includes a first twist crystal (18) and at least a second twist crystal (20) aligned with the first twist crystal such that radiation passing through the first crystal has a first state and a second state.
Abstract:
A polarizing optical element (7) which comprises a first substrate (7a) having a first surface formed with first and second gratings (7c, 7d) so as to cross relative to each other at a predetermined crossing angle (T), each of which first and second gratings (7c, 7d) has a grating pitch (Λ) equal to or smaller than the wavelength of a laser beam which may be incident upon the polarizing optical element (7). A magneto-optical head system of a type comprising a laser source for emitting and projecting a laser beam on a magneto-optical recording medium and utilizing a magneto-optical effect for reading information, recorded on the magneto-optical recording medium, by the utilization of reflected or transmitted laser beams reflected from or transmitted through the magneto-optical recording medium and utilizing the polarized optical element (7) is also disclosed.
Abstract:
The method and the device are based on interference techniques. Two quasi-monochromatic radiations (2a, 2b; 102a, 102b; 202a, 202b) with slightly different optical frequencies are generated. A radiation is converted into a 45° linearly-polarized radiation, while the other presents the polarization state imposed by a body under test (4, 204). In each radiation, horizontal and vertical polarization components are separated, and then recombined into two different beams (20a, 21a; 34, 35) comprising radiations at both frequencies, respectively polarized in the same plane. Beatings between the two components of each beam are originated and from the two electrical signals in the radio frequency range thus obtained the information is extracted on the relative phase and the amplitude of the two components of the radiation with polarization imposed by the body under test (4, 204).
Abstract:
An apparatus including: a conductive body that supports propagating plasmons; and at least one structure that generates the propagating plasmons when illuminated by two-dimensionally (2D) elliptically polarized light (EPL), wherein the structure is formed to give opposite initial phases to the plasmons corresponding to opposite elliptical polarizations of the EPL.
Abstract:
Example embodiments of methods, apparatus, and systems for measuring polarimetric parameters using spectroscopy are disclosed herein. Particular embodiments concern circular dichroism (CD) spectrometers that use a vertically aligned beam. In such embodiments, the solution being analyzed may have a top surface that forms a convex or concave meniscus, creating a surface through which the measuring beam passes that may refract the beam in undesirable ways. Accordingly, particular embodiments of the disclosed technology include one or more meniscus-compensating (meniscus-effect-reducing) components or subsystems. These components and/or subsystems can be used alone or in combination with one another to reduce the undesirable refractive effects caused by the meniscus at the solution' s surface, thereby improving the resulting quality of the spectroscopy measurement and potentially improving the speed with which CD spectroscopy can be performed.