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    SYSTEM AND METHOD FOR CALIBRATING IMAGING MEASUREMENTS TAKEN FROM AERIAL VEHICLES.
    241.
    发明申请
    SYSTEM AND METHOD FOR CALIBRATING IMAGING MEASUREMENTS TAKEN FROM AERIAL VEHICLES. 有权
    用于校准来自航空器的成像测量的系统和方法。

    公开(公告)号：US20160069741A1

    公开(公告)日：2016-03-10

    申请号：US14480565

    申请日：2014-09-08

    Applicant: SlantRange, Inc.

    Inventor： Michael Ritter ,  Michael Milton

    IPC: G01J3/02 ,  G01J3/28

    CPC classification number: G01J3/0297 ,  G01J1/0433 ,  G01J1/0474 ,  G01J1/4204 ,  G01J1/44 ,  G01J3/2823 ,  G01J2003/2826

    Abstract: Systems and methods are provided for calibrating spectral measurements taken of one or more targets from an aerial vehicle. Multiple photo sensors may be configured to obtain spectral measurements of one or more ambient light sources. The obtained spectral measurements of the one or more ambient light sources may be used to calibrate the obtained spectral measurements of the target.

    Abstract translation: 提供了用于校准来自空中飞行器的一个或多个目标的光谱测量的系统和方法。 多个光电传感器可被配置为获得一个或多个环境光源的光谱测量。 所获得的一个或多个环境光源的光谱测量可用于校准所获得的目标光谱测量值。

    LIGHT WAVELENGTH MEASUREMENT METHOD AND LIGHT WAVELENGTH MEASUREMENT APPARATUS
    242.
    发明申请
    LIGHT WAVELENGTH MEASUREMENT METHOD AND LIGHT WAVELENGTH MEASUREMENT APPARATUS 有权
    光波长测量方法和光波长测量装置

    公开(公告)号：US20160033331A1

    公开(公告)日：2016-02-04

    申请号：US14775321

    申请日：2014-03-10

    Applicant: OSAKA UNIVERSITY

    Inventor： Tsuyoshi KONISHI ,  Takema SATOH ,  Tomotaka NAGASHIMA

    IPC: G01J3/457 ,  G01J3/18

    CPC classification number: G01J3/457 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1861 ,  G01J2003/2866 ,  G02B6/12

    Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).

    Abstract translation: 测量目标光的波长的光波长测量方法包括：在将目标光分散成多个第二光束的第二色散装置上接收目标光，所述第二光束到达对应于目标光的波长的多个位置（S106， S202）; 并且通过使用多个第二光束作为用于测量由主刻度指定的波长范围内的目标光的波长的游标（S108，S204）来测量目标光的波长。

    HANDHELD LIBS ANALYZER END PLATE PURGING STRUCTURE
    244.
    发明申请
    HANDHELD LIBS ANALYZER END PLATE PURGING STRUCTURE 有权
    手持式分析仪终板采样结构

    公开(公告)号：US20150138545A1

    公开(公告)日：2015-05-21

    申请号：US14608359

    申请日：2015-01-29

    Applicant: SciAps, Inc.

    Inventor： David R. Day ,  Konstantin Derman ,  John Francis Egan ,  Paul Edward Soucy

    IPC: G01J3/02 ,  G01J3/443

    CPC classification number: G01J3/0272 ,  G01J3/0297 ,  G01J3/2823 ,  G01J3/443 ,  G01J5/0255 ,  G01N21/718 ,  G01N2201/0221 ,  H01J37/32321

    Abstract: A handheld LIBS analyzer includes a laser source for generating a laser beam and a spectrometer subsystem for analyzing a plasma generated when the laser beam strikes a sample. A nose section includes an end plate with an aperture for the laser beam, a purge cavity behind the aperture fluidly connected to a source of purge gas, and a shield covering the purge cavity. A vent removes purge gas from the purge cavity when the end plate is placed on the sample.

    Abstract translation: 手持式LIBS分析仪包括用于产生激光束的激光源和用于分析当激光束撞击样品时产生的等离子体的光谱仪子系统。 鼻部包括具有用于激光束的孔的端板，在孔的后面的清洗腔，流体地连接到吹扫气体源，以及覆盖吹扫腔的屏蔽。 当端板放置在样品上时，排气口将吹扫气体从吹扫腔中移除。

    BACKGROUND CORRECTION IN EMISSION SPECTRA
    245.
    发明申请
    BACKGROUND CORRECTION IN EMISSION SPECTRA 有权
    发射光谱的背景校正

    公开(公告)号：US20150062577A1

    公开(公告)日：2015-03-05

    申请号：US14470875

    申请日：2014-08-27

    Applicant: Thermo Electron Manufacturing Limited

    Inventor： Stephen HARTWELL ,  Nigel Cooper BAILEY

    IPC: G01J3/02 ,  G01J3/443

    CPC classification number: G01J3/0297 ,  G01J3/28 ,  G01J3/443

    Abstract: A method for deriving a background-corrected portion of a measured optical emission spectrum comprising the steps of identifying two or more background correction points from the portion of the measured emission spectrum; deriving a background correction function fitted to the identified background correction points, and applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum, wherein the background correction points are identified from the measured data points by consideration of the gradients between the measured data points.

    Abstract translation: 一种用于导出测量的光发射光谱的背景校正部分的方法，包括以下步骤：从所测量的发射光谱的部分中识别两个或更多个背景校正点; 导出拟合到所识别的背景校正点的背景校正函数，以及将背景校正函数应用于所测量的发射光谱的部分，以产生背景校正部分的发射光谱，其中从背景校正点 通过考虑测量数据点之间的梯度来测量数据点。

    Detection and identification of surfaces and surface contaminants
    247.
    发明授权
    Detection and identification of surfaces and surface contaminants 有权
    检测和识别表面和表面污染物

    公开(公告)号：US08743363B1

    公开(公告)日：2014-06-03

    申请号：US13758925

    申请日：2013-02-04

    Applicant: Lockheed Martin Coherent Technologies, Inc.

    Inventor： John J. Glennon

    IPC: G01J3/46

    CPC classification number: G01J3/027 ,  G01J3/0297 ,  G01J3/10 ,  G01J3/2823 ,  G01J3/32 ,  G01J3/42 ,  G01N21/84 ,  G01N21/94

    Abstract: Aspects of the subject technology relate to methods and systems for identifying a target material. The system includes a tunable laser, an imaging device, and a signal processor. The tunable laser is configured to intermittently direct electromagnetic radiation of at least one selected wavelength at a surface of a target material. The imaging device is configured to capture at least one “on” image of the surface when the electromagnetic radiation of the at least one selected wavelength is directed at the surface and capture at least one “off” image of the surface when electromagnetic radiation of the at least one selected wavelength is not directed at the surface. The signal processor is configured to compare, for each selected wavelength, the “on” image(s) corresponding to the selected wavelength with the “off” image(s) corresponding to the selected wavelength and identify the target material based on the comparison.

    Abstract translation: 主题技术的方面涉及用于识别目标材料的方法和系统。 该系统包括可调谐激光器，成像装置和信号处理器。 可调谐激光器被配置为间歇地引导目标材料表面上的至少一个所选波长的电磁辐射。 当所述至少一个所选波长的电磁辐射指向所述表面时，所述成像装置被配置为捕获所述表面的至少一个“开”图像，并且当所述至少一个选定波长的电磁辐射被捕获时，捕获所述表面的至少一个“关闭”图像 至少一个选定的波长不指向表面。 信号处理器被配置为对于每个选定的波长，对应于所选波长的“开”图像与对应于所选择的波长的“关”图像进行比较，并且基于该比较来识别目标材料。

    SPECTROSCOPIC MEASUREMENT APPARATUS
    249.
    发明申请
    SPECTROSCOPIC MEASUREMENT APPARATUS 有权
    光谱测量装置

    公开(公告)号：US20130114083A1

    公开(公告)日：2013-05-09

    申请号：US13658118

    申请日：2012-10-23

    Applicant: SEIKO EPSON CORPORATION

    Inventor： Akira SANO

    IPC: G01J3/51 ,  G02B5/28

    CPC classification number: G01J3/0297 ,  G01J3/027 ,  G01J3/10 ,  G01J3/26 ,  G01J3/32 ,  G01J3/42 ,  G01J2003/2879 ,  G02B26/001

    Abstract: A spectroscopic measurement apparatus includes: a wavelength tunable interference filter including a fixed substrate having a fixed reflection film, a movable substrate having a movable reflection film, and an electrostatic actuator that changes a gap value of an inter-reflection-film gap by applying a voltage to bend the movable substrate; a detector that detects a light level; and a controller that measures a spectral characteristic of light under measurement. The controller includes a filter driver that applies a drive voltage to the electrostatic actuator to change the inter-reflection-film gap, a detected light level acquisition unit that acquires light levels detected by the detector, and a target light level acquisition unit that acquires a light level corresponding to an oscillation center of the movable substrate as a target light level based on how the detected light level transitions and a natural oscillation cycle that the movable substrate has.

    Abstract translation: 一种分光测量装置包括：波长可调干涉滤光器，包括具有固定反射膜的固定基板，具有可移动反射膜的可移动基板和通过施加相互反射膜间隙来改变间隔反射膜间隙的间隙值的静电致动器 电压使可动基板弯曲; 一个检测光线的检测器; 以及测量测量光的光谱特性的控制器。 所述控制器包括滤波器驱动器，其向所述静电致动器施加驱动电压以改变所述反射间隙;检测光级获取单元，其获取由所述检测器检测到的光电平;以及目标光级获取单元， 基于检测到的光水平的过渡以及可动基板的固有振荡周期，将与可动基板的振荡中心对应的光水平作为目标光水平。

    System and method reducing fiber stretch induced timing errors in fiber optic coupled time domain terahertz systems
    250.
    发明授权
    System and method reducing fiber stretch induced timing errors in fiber optic coupled time domain terahertz systems 有权
    系统和方法减少光纤耦合时域太赫兹系统中的光纤拉伸引起的定时误差

    公开(公告)号：US08436310B2

    公开(公告)日：2013-05-07

    申请号：US13266023

    申请日：2010-04-27

    Applicant: David Zimdars

    Inventor： David Zimdars

    IPC: G01J5/02 ,  G02B6/26

    CPC classification number: G01J3/02 ,  G01J3/0218 ,  G01J3/0297 ,  G01J3/42 ,  G01N21/3581 ,  G01N21/3586 ,  G02B6/4206

    Abstract: A system for reducing effects relating to stretching of an optical fiber includes an optical control source, the optical source outputting an optical signal, a terahertz transmitter and receiver both being optically coupled to the optical source, and a means for providing the optical signal to both the terahertz transmitter and terahertz receiver such that the terahertz receiver is synchronized to the terahertz transmitter by the optical signal. The means prevents the stretching of an fiber carrying the optical signal provided to the terahertz transmitter or terahertz receiver or allows for the stretching an optical fiber such that the terahertz receiver will still be synchronized to the terahertz transmitter by the optical signal.

    Abstract translation: 用于减少与光纤的拉伸有关的影响的系统包括光控制源，输出光信号的光源，光耦合到光源的太赫兹发射器和接收器，以及用于向光源提供光信号的装置 太赫兹发射机和太赫兹接收机，使得太赫兹接收机通过光信号与太赫兹发射机同步。 该装置防止承载提供给太赫兹发射机或太赫兹接收机的光信号的光纤的拉伸或允许拉伸光纤，使得太赫兹接收机仍将通过光信号与太赫兹发射机同步。

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