텅스텐 연마용 CMP 슬러리 조성물
    21.
    发明公开
    텅스텐 연마용 CMP 슬러리 조성물 有权
    CMP浆料组合物

    公开(公告)号:KR1020130019332A

    公开(公告)日:2013-02-26

    申请号:KR1020110117872

    申请日:2011-11-11

    CPC classification number: C23F1/30 C09G1/02 C23F3/06

    Abstract: PURPOSE: A slurry composition for chemical mechanical polishing is provided to prevent the slurry discoloration problem, to have excellent etching selection ratio between metallic layers and to be applied to a chemical mechanical polishing process. CONSTITUTION: A slurry composition for chemical mechanical polishing comprises an abrasive and an abrasive accelerator. The abrasive comprises colloid silica which is dispersed in ultrapure water. The abrasive accelerator comprises 0.5-2 weight% hydrogen peroxide liquid, 0.05-1 weight% of ammonium persulfate, 0.01-0.1 weight% of iron nitrate. The content of the colloid silica is 2-4 weight%. The etching selection ratio of the tungsten and nitride titanium is 1:1.5-2. The pH of the composition is 2-4.

    Abstract translation: 目的:提供用于化学机械抛光的浆料组合物,以防止浆料变色问题,在金属层之间具有优异的蚀刻选择比,并应用于化学机械抛光工艺。 构成:用于化学机械抛光的浆料组合物包括研磨剂和磨料加速剂。 研磨剂包括分散在超纯水中的胶体二氧化硅。 研磨剂包括0.5-2重量%的过氧化氢液体,0.05-1重量%的过硫酸铵,0.01-0.1重量%的硝酸铁。 胶体二氧化硅的含量为2-4重量%。 钨和氮化钛的蚀刻选择比为1:1.5-2。 组合物的pH为2-4。

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