公开(公告)号：WO1997037289A1

公开(公告)日：1997-10-09

申请号：PCT/US1997004264

申请日：1997-03-19

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  CANNATA, John, W. ,  WHITEHOUSE, Rodney, K.

IPC: G05B19/00

CPC classification number: G11B5/00 ,  G11B5/012 ,  G11B20/1816 ,  G11B27/36 ,  G11B2005/001 ,  G11B2220/20

Abstract: An apparatus (200) for creating or editing a test program for testing a disk drive by entry command inputs. The apparatus (200) includes an input that allows the user to select the desired test instructions and subsequence of test instructions to create or edit a test program having a sequence of test instructions. The processor (210) executes the test program by generating a plurality of commands that are performed in a predetermined order. The commands may specify that the first circuit performs a glide test (220) or a burnish test, or that the second circuit performs a burnish test.

Abstract translation: 一种用于通过输入命令输入创建或编辑用于测试磁盘驱动器的测试程序的装置（200）。 装置（200）包括允许用户选择期望的测试指令和测试指令的子序列以创建或编辑具有测试指令序列的测试程序的输入。 处理器（210）通过产生以预定顺序执行的多个命令来执行测试程序。 命令可以指定第一电路执行滑动测试（220）或抛光测试，或者第二电路执行抛光测试。

公开(公告)号：WO1997019320A1

公开(公告)日：1997-05-29

申请号：PCT/US1996018211

申请日：1996-11-14

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  MARR, John, D. ,  LEE, Patrick, R.

IPC: G01B11/14

CPC classification number: G01B11/14

Abstract: A hard disk drive flying height tester loader (10) which moves a head gimbal assembly (HGA) (12) about the pivot axis (PA) of the HGA. The HGA is mounted to a clamp (26) that is attached to a pivot arm (4O). The pivot arm is attached to a cam follower (52) which follows a cam (12). The cam is moved by a motor (64) that is attached to a stationary sideplate (42). Movement of the cam rotates the pivot arm, clamp and HGA between a first position and a second position. The pivot arm is coupled to the stationary sideplate by a ball bearing assembly (44) which has a radius of curvature (r). The center of the ball bearing radius intersects the pivot axis of the HGA so that the clamp and HGA rotate about the pivot axis when the motor and cam move the pivot arm between the first and second positions.

Abstract translation: 一个硬盘驱动器飞行高度测试器装载器（10），其围绕HGA的枢转轴线（PA）移动头部万向节组件（HGA）（12）。 HGA安装到附接到枢转臂（40）的夹具（26）上。 枢转臂附接到跟随凸轮（12）的凸轮从动件（52）。 凸轮通过附接到固定侧板（42）的电机（64）移动。 凸轮的运动使枢转臂，夹具和HGA在第一位置和第二位置之间旋转。 枢转臂通过具有曲率半径（r）的滚珠轴承组件（44）联接到固定侧板上。 球轴承半径的中心与HGA的枢转轴线相交，使得当马达和凸轮在第一和第二位置之间移动枢转臂时，夹具和HGA围绕枢转轴线旋转。

公开(公告)号：WO1997017621A1

公开(公告)日：1997-05-15

申请号：PCT/US1996018093

申请日：1996-11-08

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  INBAR, Michael

IPC: G01R33/12

CPC classification number: G01R33/1207

Abstract: A tester for testing the smoothness of a magnetic disk comprising a magnetic head (14) which can write and read data onto a disk. The magnetic head (14) generates a read signal that corresponds to the magnetic field of the disk. The read signal is a signal which varies at a frequency. When the head (14) strikes an asperity, the contact will produce a mechanical resonance in the head (14) and modulate the frequency of the read signal. The frequency modulated read signal is detected by a phase lock loop circuit (20) which generates an error signal. The error signal is provided to a digital signal processor (36) to measure the magnitude and number of asperities in the disk.

Abstract translation: 一种用于测试磁盘的平滑度的测试器，包括可以将数据写入和读取到磁盘上的磁头（14）。 磁头（14）产生对应于磁盘磁场的读取信号。 读取信号是频率变化的信号。 当头部（14）突起时，触点将在头部（14）中产生机械谐振，并且调制读取信号的频率。 调频读取信号由产生误差信号的锁相环电路（20）检测。 误差信号被提供给数字信号处理器（36）以测量盘中的粗糙度的大小和数量。

公开(公告)号：WO1996028725A1

公开(公告)日：1996-09-19

申请号：PCT/US1996002975

申请日：1996-03-04

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  SHELOR, John, Richard

IPC: G01N27/72

CPC classification number: G01R31/2834 ,  G01R31/2837 ,  G11B5/3166 ,  G11B5/455 ,  G11B5/48 ,  G11B33/10 ,  G11B2005/0016

Abstract: A preprogrammed controller (10), preferably a stored program computer, is programmed to automatically control all the steps in the testing of an MR reproduce head (16). First, the magnitude of the sense current is established by command of the controller, and a voltage proportional to the sense current flowing in the head is monitored by the controller. An electromagnet (24) whose current is programmed by the controller provides a magnetic field for exciting the MR head. The MR device is placed on an equipotential of the field of the electromagnet, and a Hall sensor (26) is placed on the same magnetic equipotential line but in a different location. The output of the Hall sensor is fed into the preamplifier electronics (20), digitized by a converter then stored. By controlling the current to the electromagnetic driver, the test field at the MR element is swept from a minimum to a maximum field value and back again, while correlation voltage from the MR head is acquired.

Abstract translation: 编程的预编程控制器（10），优选地存储程序计算机，被编程为自动控制MR再现头（16）的测试中的所有步骤。 首先，通过控制器的命令来建立感测电流的大小，并且通过控制器监测与流过头部的感测电流成比例的电压。 电流由控制器编程的电磁体（24）提供用于激励MR磁头的磁场。 MR装置放置在电磁铁场的等电位上，霍尔传感器（26）放置在相同的磁等电位线上，但位于不同的位置。 霍尔传感器的输出被馈送到前置放大器电子器件（20）中，由转换器数字化然后存储。 通过控制到电磁驱动器的电流，将MR元件的测试场从最小扫描到最大场值，然后再次返回，同时获得MR磁头的相关电压。

公开(公告)号：WO1995017646A1

公开(公告)日：1995-06-29

申请号：PCT/US1994014676

申请日：1994-12-14

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  LACEY, Christopher ,  ROSS, Edward, W.

IPC: G01C09/02

CPC classification number: G11B21/12 ,  G01B11/14 ,  G11B21/21 ,  G11B33/10

Abstract: The apparatus and method for measuring a small spacing down to contact uses interferometric fringe intensity calibration to calibrate maximum and minimum intensity of two or more monochromatic of quasi-monochromatic interference patterns caused by a spacing between two articles (10, 12), one of which is transparent (10). The intensity calibration is done by measuring maximum and minimum fringe intensity of each color (81, 82) while altering the spacing by at least 1/4 of the wavelength of the light or other electromagnetic radiation being used. The calibration by changing spacing allows the fringe order to be calculated for each wavelength of the radiation being used. This calibration procedure allows the maximum and minimum intensity of the radiation to be known, as well as the fringe order of the interference patterns to be calculated. With the maximum and minimum intensities and the fringe orders known, the spacing is readily calculated from the interferometric theory.

Abstract translation: 用于测量向下接触的小间距的装置和方法使用干涉条纹强度校准来校准由两个物品（10,12）之间的间隔引起的两个或更多个单色的准单色干涉图案的最大和最小强度，其中之一 是透明的（10）。 通过测量每种颜色（81,82）的最大和最小条纹强度，同时将间距改变为所使用的光或其他电磁辐射的至少1/4波长来进行强度校准。 通过改变间隔的校准允许针对所使用的辐射的每个波长计算条纹顺序。 该校准程序允许了解辐射的最大和最小强度以及要计算的干涉图案的边缘顺序。 利用已知的最大和最小强度和边缘级，可以从干涉测量理论中容易地计算间距。

公开(公告)号：SG44443A1

公开(公告)日：1997-12-19

申请号：SG1996000470

申请日：1992-10-19

Applicant: PHASE METRICS

Inventor： LACEY CHRISTOPHER

IPC: G01B9/02 ,  G01B11/14 ,  G11B5/54 ,  G11B21/12 ,  G11B21/21 ,  G11B33/10

Abstract: Light is focused on an interface between a transparent probe and a surface to be analyzed. The probe is lowered onto the surface using a computer-controlled actuator. Light reflected from the surface of the probe which is closest to the surface and the surface itself recombines, producing interference effects from the spacing between the probe and the surface over a 2-dimensional area. Since the shape of the probe in known beforehand, the profile of the surface can be readily calculated from the 2-dimensional measurement of the spacing between the probe and the surface. This surface profile indicates the roughness of the surface. The surface hardness and other surface properties can be measured by pressing the probe onto the surface. The contact load between the probe and the surface is detected by a load cell. The force with which the probe is being pressed onto the surface is measured using the load cell. The surface profile can continue to be measured interferometrically while it is being deformed by the probe. The measurement of surface deformation as a function of contact pressure allows the measurement of surface hardness while causing a minimum amount of damage to the surface.

公开(公告)号：AU1440995A

公开(公告)日：1995-07-10

申请号：AU1440995

申请日：1994-12-14

Applicant: PHASE METRICS

Inventor： LACEY CHRISTOPHER ,  ROSS EDWARD W

IPC: G01B9/02 ,  G01B11/14 ,  G11B5/60 ,  G11B21/12 ,  G11B21/21 ,  G11B33/10 ,  G01C9/02

Abstract: The apparatus and method for measuring a small spacing down to contact uses an interferometric fringe intensity calibration to calibrate maximum and minimum intensity of two or more monochromatic or quasi-monochromatic interference patterns caused by a spacing between two articles, one of which is transparent. The intensity calibration is done by measuring maximum and minimum fringe intensity of each color while altering the spacing by at least 1/4 of the wavelength of the light or other electromagnetic radiation being used. The calibration by changing spacing allows the fringe order to be calculated for each wavelength of the radiation being used. This calibration procedure allows the maximum and minimum intensity of the radiation to be known, as well as the fringe order of the interference patterns to be calculated. With the maximum and minimum intensities and the fringe orders known, the spacing is readily calculated from interferometric theory.

公开(公告)号：SG86285A1

公开(公告)日：2002-02-19

申请号：SG1996000301

申请日：1994-12-14

Applicant: PHASE METRICS

Inventor： LACEY CHRISTOPHER ,  ROSS EDWARD W

IPC: G01B9/02 ,  G01B11/14 ,  G11B5/60 ,  G11B21/12 ,  G11B21/21 ,  G11B33/10 ,  G01C9/02

Abstract: The apparatus and method for measuring a small spacing down to contact uses an interferometric fringe intensity calibration to calibrate maximum and minimum intensity of two or more monochromatic or quasi-monochromatic interference patterns caused by a spacing between two articles, one of which is transparent. The intensity calibration is done by measuring maximum and minimum fringe intensity of each color while altering the spacing by at least 1/4 of the wavelength of the light or other electromagnetic radiation being used. The calibration by changing spacing allows the fringe order to be calculated for each wavelength of the radiation being used. This calibration procedure allows the maximum and minimum intensity of the radiation to be known, as well as the fringe order of the interference patterns to be calculated. With the maximum and minimum intensities and the fringe orders known, the spacing is readily calculated from interferometric theory.

公开(公告)号：AU2244697A

公开(公告)日：1997-08-20

申请号：AU2244697

申请日：1997-01-27

Applicant: PHASE METRICS

Inventor： JANN PETER C ,  CEINA VLASTIMIL ,  CORMIER ART

IPC: G01N21/95 ,  G01N21/00

公开(公告)号：DE19826984A1

公开(公告)日：1999-01-14

申请号：DE19826984

申请日：1998-06-18

Applicant: PHASE METRICS INC

Inventor： KARAM RAYMOND

IPC: G01B21/30 ,  G01B5/00 ,  G01B5/004 ,  G01N37/00 ,  G01Q10/04 ,  G01Q60/00 ,  G01Q80/00 ,  G11B5/455 ,  G11B5/48 ,  G11B5/55 ,  G11B21/00 ,  G11B21/02 ,  G11B27/36 ,  G11B33/10 ,  H01L41/09 ,  H01J37/28

Abstract: The positioning arrangement (10) includes a casing (12) which comprises a first interior aperture (14), and a first electro-mechanic, especially piezo-electric, transducer (22) which is arranged within the first aperture. At least two bending joint inserts (30) connect the first transducer with the casing. The transducer has a longitudinal axis (CL), and the joint inserts comprise respectively a pivot point (31) which is displaced with respect to the longitudinal axis. The casing is preferably formed of aluminum, and the joint inserts of steel.