Abstract:
The present invention relates to a negative electrode for a lithium battery which comprises a metallic layer containing lithium and a carbon material layer in a plate structure formed on the surface of the metallic layer, a manufacturing method of the negative electrode, and the lithium battery including the same. The carbon material layer of the negative electrode for the lithium battery has a crystalline structure. [Reference numerals] (AA) First cycle;(BB) Tenth cycle;(CC) Capacity (mAh)
Abstract:
PURPOSE: A content converting device and a content converting method thereof are provided to supply a user interface for improving the efficiency of work when a plurality of workers perform 2D-3D conversion work. CONSTITUTION: A content converting device displays a first work user interface for 2D-3D conversion work on a display unit(31). The content converting device enables a first worker to determine directions for the conversion work through the first user interface(32). The content converting device displays a second work user interface indicating the determined directions on the display unit(33). The content converting device enables the second worker to perform the conversion work through the second work user interface according to the directions(34). [Reference numerals] (31) Displaying a first work UI for 2D/3D contents conversion; (32) Determining directions for the conversion work by a first user using the first work UI; (33) Displaying a second work UI indicating the determined directions; (34) Performing the conversion work by a second user using the second work UI; (AA) Start; (BB) End
Abstract:
PURPOSE: A negative electrode active material is provided to improve initial charging and discharging efficiency, capacity maintenance, and high voltage properties of a high capacity lithium battery by using multi-layered nanotubes. CONSTITUTION: A negative electrode active material comprises: an inner layer which comprises an inner surface of metal nanotubes, and an outer layer which comprises an outer surface of the metal nanotubes. The inner layer comprises a first metal of which an atomic number is 13 or more. The outer layer comprises multilayered metal nanotubes which comprise a second metal different with the first metal. The second metal has a lower resistivity than the resistivity of the first metal. The diffusivity of lithium ions is high and volume expansion at charging is low. [Reference numerals] (AA) Metal oxide nanorod; (BB) Conductive substrate; (CC) First metal coating; (DD) Metal oxide template etching; (EE) First metal nanotube; (FF) Second metal coating; (GG) First metal; (HH) Second metal; (II) Inner and outer layer structures
Abstract:
PURPOSE: A 3D semiconductor memory device and a manufacturing method thereof are provided to suppress the reduction of a cell current by preventing an electric field from being weakened in the lower side of a semiconductor pattern. CONSTITUTION: An electrode structure is arranged on the substrate and includes a top electrode and a bottom electrode. A semiconductor pattern(SP) passes through the electrode structure and is connected to the substrate. A vertical insulation layer(135) is interposed between the semiconductor pattern and the electrode structure. A bottom insulation layer(101) is interposed between the bottom of the vertical insulation layer and the upper side of the substrate.
Abstract:
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to stably supply voltage on a substrate through a pickup area which is electrically connected to the substrate, thereby making the semiconductor device with excellent reliability. CONSTITUTION: A substrate(100) is doped with a first conductive type dopant. A plurality of laminate structures is extended side by side to a first direction on the substrate. Each laminate structure comprises gate electrodes(157L,157,157U) which is laminated by being separated from each other on the substrate. A plurality of laminate structures comprises a pair of the laminate structures which is perpendicular to the first direction and separated with a first interval to a second direction. A pickup region(176) is extended to the first direction within the substrate between the pair of the laminated structures and doped with the first conductive type dopant.
Abstract:
PURPOSE: A semiconductor device and a method of fabricating the same are provided to minimize an over etching due to the height difference between contact holes by forming a reserved contact hole through a barrier rip. CONSTITUTION: In a semiconductor device and a method of fabricating the same, a substrate(100) comprises a first area(10) and a second area(20). A pattern structure including each pattern(108) is arranged on the substrate within the first area. A conductive pattern(CP) is arranged on the substrate within the second area. The conductive patterns includes a connection unit connecting a plurality of gate electrodes and one end of a gate electrode. A semiconductor pillar(130) comprises a semiconductor(131), a filling insulating material(132), and a drain(133).
Abstract:
PURPOSE: A three dimensional semiconductor device and manufacturing method thereof are provided to prevent deformation of a mold structure by sidewall molds, thereby obtaining structural stability without a separate support object. CONSTITUTION: A mold structure provides gap areas. The mold structure includes interlayer molds and sidewall molds. The interlayer molds(110) define the upper surface and the lower surface of wiring patterns. The sidewall molds(130) define sidewalls of the wiring patterns under the interlayer molds. A wiring structure comprises a plurality of wiring patterns arranged in the gap areas.
Abstract:
PURPOSE: A three dimensional semiconductor memory device is provided to operate at high speed and improve reliability by decreasing resistance between sub gates. CONSTITUTION: A substrate has a pair of sub cell regions and a cell array region including a strapping region. A plurality of sub gates(135a,135au,135b,135bu) are successively laminated in each sub cell region. Each sub gate has an extension unit which is extended in the strapping region. A vertical type channel pattern successively passes through the sub gates laminated in each sub cell region. The wirings are electrically connected to the extension units of the sub gates. Each wire is arranged in the pair of sub cell regions and is electrically connected to the extension units of the pair of sub gates on the same level.
Abstract:
PURPOSE: A three dimensional semiconductor memory device and a manufacturing method thereof are provided to restrain the non-uniformity in the electrical characteristic between the memory cells by forming the lower and upper semiconductor patterns using the same material without discontinuous boundary. CONSTITUTION: A lower part thin film structure(100) is formed on a substrate(10). The lower part thin film structure comprises a plurality of bottom insulating layers(121~127) and a plurality of lower part sacrificing layers(131~136). A lower penetration hole(140) passes through the lower part thin film structure. A bottom semiconductor pattern(150) fills the lower penetration holes.