23.
    发明专利
    未知

    公开(公告)号:DE69209607D1

    公开(公告)日:1996-05-09

    申请号:DE69209607

    申请日:1992-10-07

    Applicant: CANON KK

    Abstract: An electron-emitting device having an electron-emitting portion between electrodes on a substrate comprises a region A and a region B, the region A being electrically connected through the region B to at least one of the electrodes, electric conductivity s of the material mainly constituting the region A and electric conductivity of the material s mainly constituting the region B being in the relation of s > s , and the region A being the electron-emitting portion. An electron beam-generating apparatus and image-forming apparatus comprise the electron-emitting device and a modulation means for modulating the electron beams emitted from the electron-emitting elements in accordance with information signals.

    aparelho de imagem de raios x e método de imagem de raios x

    公开(公告)号:BR112012017434A2

    公开(公告)日:2016-04-19

    申请号:BR112012017434

    申请日:2011-01-27

    Applicant: CANON KK

    Abstract: aparelho de imagem de raios x e método de imagem de raios x. um aparelho de umagem de raios x, que adquire uma de imagem de contraste de fase diferencial de objeto de teste, sem utilizar uma máscara de blindagem de luz para raios x. o aparelho inclui uma fonte de raios x, um elemento de separação, configurado para dividir especialmente um raio x emitido a partir de uma fonte de raios x, e um cintilador, configurado para emitir luz quando um feixe de raios x dividido, dividido no elemento de separação, for incidente no cintilador. o aparelho também inclui uma unidade de limitação de transmissão de luz, configurada para limitar a quantidade de transmissão da luz emitida a partir do cintilador, e uma pluralidade de detectores de luz, cada um configurado para detectar a quantidade de luz que tenha transmitido através da unidade de limitação de transmissão de luz. a unidade de limitação de luz é configurada de tal modo que uma intensidade de luz, detectada em cada um dos detectores de luz, muda em resposta a uma mudança em uma posição incidente do feixe de raios x.

    26.
    发明专利
    未知

    公开(公告)号:DE69209607T2

    公开(公告)日:1996-08-29

    申请号:DE69209607

    申请日:1992-10-07

    Applicant: CANON KK

    Abstract: An electron-emitting device having an electron-emitting portion between electrodes on a substrate comprises a region A and a region B, the region A being electrically connected through the region B to at least one of the electrodes, electric conductivity s of the material mainly constituting the region A and electric conductivity of the material s mainly constituting the region B being in the relation of s > s , and the region A being the electron-emitting portion. An electron beam-generating apparatus and image-forming apparatus comprise the electron-emitting device and a modulation means for modulating the electron beams emitted from the electron-emitting elements in accordance with information signals.

    METHOD AND DEVICE FOR STRUCTURE INSPECTION ON LONG- PERIOD REGULAR STRUCTURE AND LONG-PERIOD REGULAR STRUCTURAL BODY

    公开(公告)号:JP2001153822A

    公开(公告)日:2001-06-08

    申请号:JP34046499

    申请日:1999-11-30

    Applicant: CANON KK

    Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for inspecting an orientational direction of a material having a long-period regularity ranging from several nm to several hundreds nm in a short time. SOLUTION: In this method and its device for evaluating long-period regularity of a sample, a process 1 and a process 2 are carried out, and long-period regularity of the sample is evaluated from a plurality of X-ray diffraction profiles provided by the processes 1, 2. In the process 1, a part or all of primary X-rays 2 radiated from a rectangular X-ray source 1 is incident on the surface of a measurement sample 5 arranged in parallel to the major axis of the X-ray source at an incident angle within 5 deg., and an X-ray intensity distribution of X-rays diffracted on the surface of the sample is measured with a diffraction angle 2 θ by means of a 0-demensional detector 8 or a one-dimensional detector for providing an X-ray diffraction profile. In the process 2, the measurement sample is turned by a predetermined angle within the measurement sample surface, and the process 1 is repeated once or more.

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