SAMPLE DISCRIMINATING INFORMATION READING DEVICE AND READING METHOD

    公开(公告)号:JP2000258428A

    公开(公告)日:2000-09-22

    申请号:JP5667099

    申请日:1999-03-04

    Applicant: CANON KK

    Inventor: UENO RIE

    Abstract: PROBLEM TO BE SOLVED: To obtain a sample discriminating information reading device capable of sure and easy discrimination of samples held on sample stands. SOLUTION: This device is a reading device of sample discriminating information capable of discrimination of samples held respectively on plural sample stands for holding the samples, at the time of executing instrumental analysis. In this case, each sample stand is equipped with a discriminating means for enabling discrimination of the samples held respectively, and this sample discriminating information reading device has a means for reading, mechanically, optically, electrically or magnetically, the information carried by the discriminating means.

    MANUFACTURE OF ELECTRON EMITTING ELEMENT, AND ELECTRON SOURCE AND IMAGE FORMING DEVICE USING IT

    公开(公告)号:JP2000123721A

    公开(公告)日:2000-04-28

    申请号:JP29570198

    申请日:1998-10-16

    Applicant: CANON KK

    Abstract: PROBLEM TO BE SOLVED: To provide an electron emitting element as an electron beam source capable of realizing a high-quality image forming device. SOLUTION: In this manufacturing method of an electron emitting element having an electron emitting part between electrodes opposite through a narrow gap, an electron ray is radiated on a conductive thin film 4 formed on a substrate for constructing the opposite electrodes. The portions corresponding to the narrow gap of the conductive thin film 4 is modified, thereafter it is dry-etched, thus the narrow gap is formed.

    ELECTRON EMISSION ELEMENT, ELECTRON SOURCE, AND IMAGE FORMING DEVICE

    公开(公告)号:JPH1055748A

    公开(公告)日:1998-02-24

    申请号:JP15420697

    申请日:1997-06-12

    Applicant: CANON KK

    Abstract: PROBLEM TO BE SOLVED: To enable an electron emission quantity to be changed and extend longer service life by providing plural electrodes with their different electric characteristics respectively capable of applying voltage between two electrodes independently from the outside and switching the electrodes. SOLUTION: After a lift-off resist is formed on a well washed glass substrate 1 by photolithography technique, electrodes 3, 4, 171, 172, and 173 with their specified intervals are formed by vacuum evaporation. The electrodes 171, 172, and 173 connected in parallel to between the electrodes 3 and 4 makes it possible to apply voltage independently from the outside. Next, a part forming a fine particle membrane 5 remains on an electrode substrate 1, and a Cr film is vacuum-evaporated fully. Further, organic solvent containing organic paradium is applied and sintered thereon, and plural fine particle membranes 5 composed of pd fine particles is formed between the electrodes 3 and 4. Finally, the Cr film is removed by etching, and the electron emission element is completed. Thus, the width of each fine particle membrane 5 is changed, electron characteristics are changed, and by which the electron emission quantity can be changed stepwise.

    SCANNING ELECTRON MICROSCOPE AND ELECTRON BEAM PROBE MICROANALYZER

    公开(公告)号:JP2002110076A

    公开(公告)日:2002-04-12

    申请号:JP2000296119

    申请日:2000-09-28

    Applicant: CANON KK

    Inventor: UENO RIE

    Abstract: PROBLEM TO BE SOLVED: To make a diaphragm plate replaceable without exposing the inside of a microscope body to the air and enable heating of the diaphragm plate at a position different from the position of the microscope body. SOLUTION: A preliminary exhaust chamber 25 in which the atmosphere can be decompressed to be different from that in the microscope body 11, and a diaphragm moving rod 28 for temporarily moving the diaphragm plate 17 to the preliminary exhaust chamber 25 are provided, and furthermore, the preliminary exhaust chamber 25 is provided with a heating device 30. Consequently, when replacing the diaphragm plate 17, it is possible to replace the diaphragm plate 17 via the preliminary exhaust chamber 25 with only the pressure in the preliminary exhaust chamber 25 returned to the atmospheric pressure after moving the diaphragm plate 17 from the microscope body 11 into the preliminary exhaust chamber 25 by means of the diaphragm moving rod 28. When heating the diaphragm plate 17, it is possible to burn the diaphragm plate 17 by means of the heating device 30 in the preliminary exhaust chamber 25 after moving the diaphragm plate 17 into preliminary exhaust chamber 25.

    LIQUID CRYSTAL DISPLAY ELEMENT AND DISPLAY DEVICE USING THE SAME

    公开(公告)号:JP2001221999A

    公开(公告)日:2001-08-17

    申请号:JP2000262615

    申请日:2000-08-31

    Applicant: CANON KK

    Abstract: PROBLEM TO BE SOLVED: To provide a polymer dispersed liquid crystal element which is excellent in fast response property and in memorability and easily returns to an initial state by using a two-frequency addressing liquid crystal. SOLUTION: Into a polymer precursor containing a monofunctional monomer and a polyfunctional monomer with a mixing ratio of 1/5-2/1 by weight, the two-frequency addressing liquid crystal 1-50 times by weight as much as the precursor is mixed and sealed in the cell. The liquid crystal polymer composite body layer with the two-frequency addressing liquid crystal dispersed in the polymer compound layer is formed by polymerizing and hardening the precursor.

    OBSERVATION METHOD UNDER ELECTRON MICROSCOPE OF RESIN SAMPLE

    公开(公告)号:JP2001153765A

    公开(公告)日:2001-06-08

    申请号:JP34046599

    申请日:1999-11-30

    Applicant: CANON KK

    Abstract: PROBLEM TO BE SOLVED: To provide a method in which a resin sample is observed under an ordinary scanning electron microscope without vapor-depositing a conductive film on its surface. SOLUTION: This invention refers to the method in which the surface shape of the resin sample on the conductive film on a substrate and in a film whichness of 50 μm or less is observed under the scanning electron microscope. The observation method of the sample by the scanning electron microscope is provided in such a way that, while a vacuum inside the electron gun part and the sample chamber of the scanning electron microscope is kept at 1.3×10-3 Pa or more, the identical observation region of the resin sample is observed under two conditions under which the accelerating voltage of an electron beam is at 5 kV or les and at 10 kV or more.

    ELECTRON EMISSION ELEMENT, ELECTRON SOURCE, AND IMAGE FORMING DEVICE

    公开(公告)号:JPH1055749A

    公开(公告)日:1998-02-24

    申请号:JP15420797

    申请日:1997-06-12

    Applicant: CANON KK

    Abstract: PROBLEM TO BE SOLVED: To form an electron emission part linearly, easily control its position and shape, and ensure uniform electron characteristics and luminescent brightness by providing a fine particle film having a thick step part with its partial difference between a pair of electrodes on a substrate. SOLUTION: A fine particle film 5 having a thick step part 2 with its partial difference is provided on a substrate between a pair of electrodes 3 and 4 provided in opposite thereto. This step part 5 may be one fine particle in a difference with the other fine particle film 5, and further an electron emission part 6 is configured along this step part 2. Here, electric conducting is performed for the fine particle film having this part with partial thickness, and the electron emission part 6 is formed linearly along the step part 2. This makes it possible to eliminate snaking of the electron emission part 6. Forming of this electron emission part 6 depends upon electric conducting direction, type of fine particle material, thickness of the fine particle film or the like. Thus, by providing the step part 2 linearly, the electron emission part 6 can be formed linearly, and the position and shaft thereof can be easily controlled.

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