公开(公告)号：GB2504437B

公开(公告)日：2015-09-02

申请号：GB201320420

申请日：2012-04-03

Applicant: IBM

Inventor： ABRAHAM DAVID W ,  MOJUMDER NILADRI N

IPC: G11C11/16 ,  H01L27/22 ,  H01L43/08 ,  H01L43/12

Abstract: An apparatus is provided for bidirectional writing. A stack includes a reference layer on a tunnel barrier, the tunnel barrier on a free layer, and the free layer on a metal spacer. The apparatus includes an insulating magnet. A Peltier material is thermally coupled to the insulating magnet and the stack. When the Peltier/insulating magnet interface is cooled, the insulating magnet is configured to transfer a spin torque to rotate a magnetization of the free layer in a first direction. When the Peltier/insulating magnet interface is heated, the insulating magnet is configured to transfer the spin torque to rotate the magnetization of the free layer in a second direction.

公开(公告)号：CA2843407A1

公开(公告)日：2012-11-08

申请号：CA2843407

申请日：2012-04-03

Applicant: IBM

Inventor： ABRAHAM DAVID W ,  MOJUMDER NILADRI N

IPC: H01L29/82

Abstract: An apparatus is provided for bidirectional writing. A stack includes a reference layer on a tunnel barrier, the tunnel barrier on a free layer, and the free layer on a metal spacer. The apparatus includes an insulating magnet. A Peltier material is thermally coupled to the insulating magnet and the stack. When the Peltier/insulating magnet interface is cooled, the insulating magnet is configured to transfer a spin torque to rotate a magnetization of the free layer in a first direction. When the Peltier/insulating magnet interface is heated, the insulating magnet is configured to transfer the spin torque to rotate the magnetization of the free layer in a second direction.

公开(公告)号：DE69003047T2

公开(公告)日：1994-04-21

申请号：DE69003047

申请日：1990-06-19

Applicant: IBM

Inventor： ABRAHAM DAVID W ,  WICKRAMASINGHE HEMANTHA K

IPC: G01R33/028 ,  G01B7/34 ,  G01N27/00 ,  G01N27/82 ,  G01Q10/00 ,  G01Q20/02 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q30/18 ,  G01Q60/10 ,  G01R33/10 ,  G01R33/12 ,  G01L5/00

Abstract: Magnetic structures of a sample (46) are imaged by measuring Lorentz force-induced deflection of the tip (40) of a scanning tunneling microscope. While scanning the sample (46), an a.c. voltage signal at a first predetermined frequency equal to the resonance frequency of the tip (40) is applied to the tip (40) for generating a current between the tip (40) and the surface (44) of the sample (46) for causing the tip (40) to undergo vibratory motion relative to the sample (46). The tip (40) motion, indicative of the presence of a magnetic field, is optically detected. In an alternative embodiment for providing improved resolution the tip (40) is made to undergo motion at a second predetermined frequency in a direction parallel to the longitudinal axis of the tip (40) and normal to the surface (44) of the sample (46). The tip (40) motion is optically detected at the sum or difference frequency of the first and second predetermined frequencies for providing improved lateral resolution of the magnetic field measurements using a scanning tunneling microscope. In the alternative embodiment the sum or difference frequency, which ever is detected, is made equal to the resonance frequency of the tip (40). The magnetic field measurement and tip (40) position are provided to a computer (68) which, in turn, provides an output signal to a device (72) for providing a graphical representation of the magnetic field at different positions on the surface (44) of the sample (46).