公开(公告)号：DE10041165A1

公开(公告)日：2002-03-07

申请号：DE10041165

申请日：2000-08-21

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G02B21/00 ,  G02B21/06 ,  G02B21/26 ,  G02B21/02

Abstract: The object (15) to be examined is scanned by a scanning unit (7) and the reflected light beam (17) is received by a detector (19), e.g. a photomultiplier. A processor unit (23) processes the resultant output and that of a sensor (11) indicating the position of the area scanned to provide an input to a computer (34). This produces an image of the object on a monitor (27). Using an input device (33) the microscope can be adjusted to the area of interest. Independent claims are included for: (1) an arrangement for controlling analysis and adjustment operations of a microscope; (2) software for controlling analysis and adjustment operations of a microscope.

公开(公告)号：DE102004004115B4

公开(公告)日：2016-08-18

申请号：DE102004004115

申请日：2004-01-28

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK ,  NICKEL JOCHEN ,  HAY WILLIAM C

IPC: G02B21/00 ,  G02B21/06 ,  G02B21/36 ,  H04N5/235

Abstract: Ein Mikroskopsystem (1) mit mindestens einer im Mikroskopsystem (1) vorhandenen Optik (9), die ein Beleuchtungsfeld (46) definiert, mindestens einer Lichtquelle (3), die einen Beleuchtungslichtstrahl (5) emittiert, der durch die Optik (9) hindurch eine Probe (10) beleuchtet, mindestens einem Detektor (20), der einen von der Probe (10) ausgehenden Detektionslichtstrahl (12) pixelweise detektiert, einer, dem Detektor (20) nachgeschalteten, elektronischen Schaltung (14) mit einer Speichereinheit (15), in der eine wellenlängenabhängige Helligkeitsverteilung des Beleuchtungsfelds (46) der im Mikroskopsystem (1) vorhandenen Optiken (9) abgelegt ist, dadurch gekennzeichnet, dass ein ansteuerbares Element (13) vorgesehen ist, das die Intensität des Beleuchtungslichtstrahls (5) pixelweise in Abhängigkeit von der gespeicherten, wellenlängenabhängigen Helligkeitsverteilung steuert, so dass das Beleuchtungsfeld (46) homogen beleuchtet ist, und dass die elektronische Schaltung (14) pixelweise die mit dem Detektor (20) aufgenommenen Daten mit der abgelegten, wellenlängenabhängigen Helligkeitsverteilung derart verrechnet, dass ein homogen ausgeleuchtetes Bildfeld (40) entsteht.

公开(公告)号：DE10218706B4

公开(公告)日：2008-02-28

申请号：DE10218706

申请日：2002-04-26

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G01J3/443 ,  G01J3/44

Abstract: The method implements time-optimized acquisition of special spectra using a scanning microscope, for which purpose the spectrum is subjected to bisecting interval measurements. The method for time-optimized acquisition of special spectra (emission spectra) using a scanning microscope is implemented in several steps. Firstly a complete spectrum to be examined, within which at least one special spectrum (emission spectrum) is located, is split into at least two intervals. The interval in which the intensity lies above a specific threshold is selected. That interval is split into at least two further intervals, and the procedure is continued until the size of the interval corresponds to the lower limit of the scanning microscope's measurement accuracy. The location of the special spectrum in the complete spectrum is defined, and an interval around it is created and is measured linearly.

公开(公告)号：DE102004022632A1

公开(公告)日：2005-12-15

申请号：DE102004022632

申请日：2004-05-07

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G02B21/00

Abstract: The microscope (10) has a light source (1) for illuminating object (15) and detector (15) for measuring signal (31). The signal evaluation device (30) determines switch time points and signal variation from the measuring signal and for fitting against a model recovery equation for presentation to the user. INDEPENDENT CLAIM is also included for the method.

公开(公告)号：DE10355150A1

公开(公告)日：2005-06-30

申请号：DE10355150

申请日：2003-11-26

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G01N21/25 ,  G01N21/64 ,  G02B21/00 ,  H04N1/04

Abstract: A method and a system for the analysis of co-localizations of dyes present in a specimen. The fluorescence spectra of the dyes present in the specimen are determined. A tolerance region around each of the fluorescence spectra is selected. The spectra of the specimen, in which at least two dyes are present, are then acquired pixel by pixel. Those spectra that lie within the tolerance region around the fluorescence spectra are then calculated. A lambda vector is calculated for each pixel and assigned to a spectrum. Images can be displayed in accordance with the assignment to the spectra.

公开(公告)号：DE60017240D1

公开(公告)日：2005-02-10

申请号：DE60017240

申请日：2000-11-11

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G02B21/00 ,  G02B21/16 ,  G01N21/64 ,  G06F19/00

公开(公告)号：DE10326696A1

公开(公告)日：2005-01-13

申请号：DE10326696

申请日：2003-06-13

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G09F9/00

Abstract: The optical system is integrated in a housing (23). A window is enclosed in the housing and made from transparent or semitransparent material, the window exhibits a status indication.

公开(公告)号：DE10250503A1

公开(公告)日：2004-05-19

申请号：DE10250503

申请日：2002-10-29

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G02B21/00 ,  G02B21/24 ,  G02B21/26 ,  G01B11/00

Abstract: A microscope system for detecting and compensating for changes within a recorded image content of a microscopic specimen is disclosed. A means for calculating signatures of a recorded multidimensional image (50) is provided. A means for calculating statistical signature parameters is also provided. Multiple positioning motors and/or actuators on the microscope receive from the software module control signals that can be ascertained from the signature parameters.

公开(公告)号：DE10206979A1

公开(公告)日：2003-08-21

申请号：DE10206979

申请日：2002-02-20

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK

IPC: G02B21/00

公开(公告)号：DE10143441A1

公开(公告)日：2003-03-27

申请号：DE10143441

申请日：2001-09-05

Applicant: LEICA MICROSYSTEMS

Inventor： OLSCHEWSKI FRANK ,  NICKEL JOCHEN

IPC: G02B21/36 ,  G06K9/00 ,  G06T7/20 ,  G06T9/00 ,  G02B21/00

Abstract: A microscope system ( 4 ) for the observation of dynamic processes comprises a microscope ( 50 ) having at least one detector ( 19 ), and a computer ( 34 ). A buffer memory ( 54 ) precedes a comparator ( 58 ) that compares image contents of at least two successive image frames ( 56 k and 56 k+1 ). Depending on the result obtained from the comparator ( 58 ), the image frames are stored in different segments of a data structure ( 66 ) that is provided.